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Author |
Kempenaers, L.; Janssens, K.; Jochum, K.P.; Vincze, L.; Vekemans, B.; Somogyi, A.; Drakopoulos, M.; Adams, F. |
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Title |
Micro-heterogeneity study of trace elements in USGS, MPI-DING and glass reference materials by means of synchrotron micro-XRF |
Type |
A1 Journal article |
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Year |
2003 |
Publication |
Journal of analytical atomic spectrometry |
Abbreviated Journal |
J Anal Atom Spectrom |
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Volume |
18 |
Issue |
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Pages |
350-357 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author ![sorted by Corporate Author field, ascending order (up)](img/sort_asc.gif) |
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Place of Publication |
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Wos |
000181827800010 |
Publication Date |
2003-03-27 |
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Series Title |
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Series Volume |
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Edition |
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ISSN |
0267-9477 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
3.379 |
Times cited |
38 |
Open Access |
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Notes |
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Approved |
Most recent IF: 3.379; 2003 IF: 3.200 |
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Call Number |
UA @ admin @ c:irua:41009 |
Serial |
5715 |
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Permanent link to this record |