Verbist, K.; Van Tendeloo, G.; Ye, M.; Schroeder, J.; Mehbod, M.; Deltour, R. |
Inclusions in magnetron sputtered YBa2Cu3-x MxO7-d thin films: a study by means of electron microscopy |
1996 |
Microscopy, microanalysis, microstructures |
7 |
6 |
UA library record; WoS full record; WoS citing articles |