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Author | Jacobs, K.; van Daele, B.; Leys, M.; Moerman, I.; Van Tendeloo, G. | ||||
Title | Effect of growth interrupt and growth rate on MOVPE-grown InGaN/GaN MQW structures | Type | A1 Journal article | ||
Year | 2003 | Publication | Journal of crystal growth | Abbreviated Journal | J Cryst Growth |
Volume | 248 | Issue | Pages | 498-502 | |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Amsterdam | Editor | ||
Language | Wos | 000180446900091 | Publication Date | 2002-12-28 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0022-0248; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 1.751 | Times cited | 14 | Open Access | |
Notes | was dubbel; dubbel eruit gehaald | Approved | Most recent IF: 1.751; 2003 IF: 1.414 | ||
Call Number | UA @ lucian @ c:irua:54785 | Serial | 810 | ||
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