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Author | Oleshko, V.; Gijbels, R.; Jacob, W.; Alfimov, M. | ||||
Title | Characterization of complex silver halide photographic systems by means of analytical electron microscopy | Type | A1 Journal article | ||
Year | 1995 | Publication | Microbeam analysis | Abbreviated Journal | |
Volume | 4 | Issue | 1 | Pages | 1-29 |
Keywords | A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Deerfield Beach, Fla | Editor | ||
Language | Wos | A1995RR65700001 | Publication Date | 0000-00-00 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1061-3420 | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | 9 | Open Access | ||
Notes | Approved | PHYSICS, APPLIED 28/145 Q1 # | |||
Call Number | UA @ lucian @ c:irua:12275 | Serial | 318 | ||
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