toggle visibility
Search within Results:
Display Options:
Number of records found: 7465

Select All    Deselect All
 | 
Citations
 | 
   print
Preparation, structural and optical characterization of nanocrystalline ZnO doped with luminescent Ag-nanoclusters”. Kuznetsov AS, Lu Y-G, Turner S, Shestakov MV, Tikhomirov VK, Kirilenko D, Verbeeck J, Baranov AN, Moshchalkov VV, Optical materials express 2, 723 (2012). http://doi.org/10.1364/OME.2.000723
toggle visibility
Preventing the reconstruction of the polar discontinuity at oxide heterointerfaces”. Boschker H, Verbeeck J, Egoavil R, Bals S, Van Tendeloo G, Huijben M, Houwman EP, Koster G, Blank DHA, Rijnders G, Advanced functional materials 22, 2235 (2012). http://doi.org/10.1002/adfm.201102763
toggle visibility
Procedure to count atoms with trustworthy single-atom sensitivity”. Van Aert S, de Backer A, Martinez GT, Goris B, Bals S, Van Tendeloo G, Rosenauer A, Physical review : B : condensed matter and materials physics 87, 064107 (2013). http://doi.org/10.1103/PhysRevB.87.064107
toggle visibility
Prospects for versatile phase manipulation in the TEM : beyond aberration correction”. Guzzinati G, Clark L, Béché, A, Juchtmans R, Van Boxem R, Mazilu M, Verbeeck J, Ultramicroscopy 151, 85 (2015). http://doi.org/10.1016/j.ultramic.2014.10.007
toggle visibility
Damage evaluation in graphene underlying atomic layer deposition dielectrics”. Tang X, Reckinger N, Poncelet O, Louette P, Urena F, Idrissi H, Turner S, Cabosart D, Colomer J-F, Raskin J-P, Hackens B, Francis LA, Scientific reports 5, 13523 (2015). http://doi.org/10.1038/srep13523
toggle visibility
Pulsed laser deposition of SrTiO3 on a H-terminated Si substrate”. Spreitzer M, Egoavil R, Verbeeck J, Blank DHA, Rijnders G, Journal of materials chemistry C : materials for optical and electronic devices 1, 5216 (2013). http://doi.org/10.1039/c3tc30913d
toggle visibility
Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy”. Martinez GT, Rosenauer A, de Backer A, Verbeeck J, Van Aert S, Ultramicroscopy 137, 12 (2014). http://doi.org/10.1016/j.ultramic.2013.11.001
toggle visibility
Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
toggle visibility
Quantitative measurement of orbital angular momentum in electron microscopy”. Clark L, Béché, A, Guzzinati G, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 053818 (2014). http://doi.org/10.1103/PhysRevA.89.053818
toggle visibility
Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
toggle visibility
Rayleigh instability of confined vortex droplets in critical superconductors”. Lukyanchuk I, Vinokur VM, Rydh A, Xie R, Milošević, MV, Welp U, Zach M, Xiao ZL, Crabtree GW, Bending SJ, Peeters FM, Kwok WK, Nature physics 11, 21 (2015). http://doi.org/10.1038/NPHYS3146
toggle visibility
Real-space calculation of the conductivity tensor for disordered topological matter”. Garcia JH, Covaci L, Rappoport TG, Physical review letters 114, 116602 (2015). http://doi.org/10.1103/PhysRevLett.114.116602
toggle visibility
The role of steam treatment on the structure, purity and length distribution of multi-walled carbon nanotubes”. Cabana L, Ke X, Kepić, D, Oro-Solé, J, Tobías-Rossell E, Van Tendeloo G, Tobias G, Carbon 93, 1059 (2015). http://doi.org/10.1016/j.carbon.2015.06.027
toggle visibility
Fe2O3-TiO2Nano-heterostructure Photoanodes for Highly Efficient Solar Water Oxidation”. Barreca D, Carraro G, Gasparotto A, Maccato C, Warwick MEA, Kaunisto K, Sada C, Turner S, Gönüllü, Y, Ruoko T-P, Borgese L, Bontempi E, Van Tendeloo G, Lemmetyinen H, Mathur S, Advanced Materials Interfaces 2, 1500313 (2015). http://doi.org/10.1002/admi.201500313
toggle visibility
Rutherford scattering of electron vortices”. Van Boxem R, Partoens B, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 032715 (2014). http://doi.org/10.1103/PhysRevA.89.032715
toggle visibility
Self-directed localization of ZIF-8 thin film formation by conversion of ZnO nanolayers”. Khaletskaya K, Turner S, Tu M, Wannapaiboon S, Schneemann A, Meyer R, Ludwig A, Van Tendeloo G, Fischer RA, Advanced functional materials 24, 4804 (2014). http://doi.org/10.1002/adfm.201400559
toggle visibility
Pyramid-Shaped Wurtzite CdSe Nanocrystals with Inverted Polarity”. Ghosh S, Gaspari R, Bertoni G, Spadaro MC, Prato M, Turner S, Cavalli A, Manna L, Brescia R, ACS nano 9, 8537 (2015). http://doi.org/10.1021/acsnano.5b03636
toggle visibility
Site-specific mapping of transition metal oxygen coordination in complex oxides”. Turner S, Egoavil R, Batuk M, Abakumov AA, Hadermann J, Verbeeck J, Van Tendeloo G, Applied physics letters 101, 241910 (2012). http://doi.org/10.1063/1.4770512
toggle visibility
Skyrmion rows, vortex rows, and phase slip lines in sheared multi-component condensates”. Tempère J, Vermeyen E, Van Duppen B, Physica: C : superconductivity 479, 61 (2012). http://doi.org/10.1016/j.physc.2012.01.016
toggle visibility
Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
toggle visibility
Soft chemical control of the crystal and magnetic structure of a layered mixed valent manganite oxide sulfide”. Blandy JN, Abakumov AM, Christensen KE, Hadermann J, Adamson P, Cassidy SJ, Ramos S, Free DG, Cohen H, Woodruff DN, Thompson AL, Clarke SJ;, APL materials 3, 041520 (2015). http://doi.org/10.1063/1.4918973
toggle visibility
Atomic-scale insight into the interactions between hydroxyl radicals and DNA in solution using the ReaxFF reactive force field”. Verlackt CCW, Neyts EC, Jacob T, Fantauzzi D, Golkaram M, Shin Y-K, van Duin ACT, Bogaerts A, New journal of physics 17, 103005 (2015). http://doi.org/10.1088/1367-2630/17/10/103005
toggle visibility
Spin effects in electron vortex states”. Van Boxem R, Verbeeck J, Partoens B, Europhysics letters 102, 40010 (2013). http://doi.org/10.1209/0295-5075/102/40010
toggle visibility
Electron Microscopy of Probability Currents at Atomic Resolution”. Lubk A, Béché, A, Verbeeck J, Physical review letters 115, 176101 (2015). http://doi.org/10.1103/PhysRevLett.115.176101
toggle visibility
Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
toggle visibility
Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions”. Hoek M, Coneri F, Poccia N, Renshaw Wang X, Ke X, Van Tendeloo G, Hilgenkamp H, APL materials 3, 086101 (2015). http://doi.org/10.1063/1.4927796
toggle visibility
Streaming-to-accumulation transition in a two-dimensional electron system in a polar semiconductor”. Wen X, Peeters FM, Devreese JT, Physical review : B : condensed matter and materials physics 46, 7571 (1992). http://doi.org/10.1103/PhysRevB.46.7571
toggle visibility
Strong-coupling analysis of large bipolarons in two and three dimensions”. Verbist G, Smondyrev MA, Peeters FM, Devreese JT, Physical review : B : condensed matter and materials physics 45, 5262 (1992). http://doi.org/10.1103/PhysRevB.45.5262
toggle visibility
Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Verbeeck J, Physical review : B : condensed matter and materials physics 64, 184110 (2001). http://doi.org/10.1103/PhysRevB.64.184110
toggle visibility
Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
toggle visibility
Select All    Deselect All
 | 
Citations
 | 
   print

Save Citations:
Export Records: