Number of records found: 3074
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Pulsed laser deposition of SrTiO3 on a H-terminated Si substrate”. Spreitzer M, Egoavil R, Verbeeck J, Blank DHA, Rijnders G, Journal of materials chemistry C : materials for optical and electronic devices 1, 5216 (2013). http://doi.org/10.1039/c3tc30913d
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Quantitative composition determination at the atomic level using model-based high-angle annular dark field scanning transmission electron microscopy”. Martinez GT, Rosenauer A, de Backer A, Verbeeck J, Van Aert S, Ultramicroscopy 137, 12 (2014). http://doi.org/10.1016/j.ultramic.2013.11.001
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Quantitative electron tomography : the effect of the three-dimensional point spread function”. Heidari H, van den Broek W, Bals S, Ultramicroscopy 135, 1 (2013). http://doi.org/10.1016/j.ultramic.2013.06.005
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Quantitative measurement of orbital angular momentum in electron microscopy”. Clark L, Béché, A, Guzzinati G, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 053818 (2014). http://doi.org/10.1103/PhysRevA.89.053818
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Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
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The role of steam treatment on the structure, purity and length distribution of multi-walled carbon nanotubes”. Cabana L, Ke X, Kepić, D, Oro-Solé, J, Tobías-Rossell E, Van Tendeloo G, Tobias G, Carbon 93, 1059 (2015). http://doi.org/10.1016/j.carbon.2015.06.027
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Fe2O3-TiO2Nano-heterostructure Photoanodes for Highly Efficient Solar Water Oxidation”. Barreca D, Carraro G, Gasparotto A, Maccato C, Warwick MEA, Kaunisto K, Sada C, Turner S, Gönüllü, Y, Ruoko T-P, Borgese L, Bontempi E, Van Tendeloo G, Lemmetyinen H, Mathur S, Advanced Materials Interfaces 2, 1500313 (2015). http://doi.org/10.1002/admi.201500313
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Rutherford scattering of electron vortices”. Van Boxem R, Partoens B, Verbeeck J, Physical review : A : atomic, molecular and optical physics 89, 032715 (2014). http://doi.org/10.1103/PhysRevA.89.032715
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Self-directed localization of ZIF-8 thin film formation by conversion of ZnO nanolayers”. Khaletskaya K, Turner S, Tu M, Wannapaiboon S, Schneemann A, Meyer R, Ludwig A, Van Tendeloo G, Fischer RA, Advanced functional materials 24, 4804 (2014). http://doi.org/10.1002/adfm.201400559
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Pyramid-Shaped Wurtzite CdSe Nanocrystals with Inverted Polarity”. Ghosh S, Gaspari R, Bertoni G, Spadaro MC, Prato M, Turner S, Cavalli A, Manna L, Brescia R, ACS nano 9, 8537 (2015). http://doi.org/10.1021/acsnano.5b03636
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Site-specific mapping of transition metal oxygen coordination in complex oxides”. Turner S, Egoavil R, Batuk M, Abakumov AA, Hadermann J, Verbeeck J, Van Tendeloo G, Applied physics letters 101, 241910 (2012). http://doi.org/10.1063/1.4770512
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Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
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Soft chemical control of the crystal and magnetic structure of a layered mixed valent manganite oxide sulfide”. Blandy JN, Abakumov AM, Christensen KE, Hadermann J, Adamson P, Cassidy SJ, Ramos S, Free DG, Cohen H, Woodruff DN, Thompson AL, Clarke SJ;, APL materials 3, 041520 (2015). http://doi.org/10.1063/1.4918973
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Spin effects in electron vortex states”. Van Boxem R, Verbeeck J, Partoens B, Europhysics letters 102, 40010 (2013). http://doi.org/10.1209/0295-5075/102/40010
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Electron Microscopy of Probability Currents at Atomic Resolution”. Lubk A, Béché, A, Verbeeck J, Physical review letters 115, 176101 (2015). http://doi.org/10.1103/PhysRevLett.115.176101
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Statistical consequences of applying a PCA noise filter on EELS spectrum images”. Lichtert S, Verbeeck J, Ultramicroscopy 125, 35 (2013). http://doi.org/10.1016/j.ultramic.2012.10.001
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Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
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Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions”. Hoek M, Coneri F, Poccia N, Renshaw Wang X, Ke X, Van Tendeloo G, Hilgenkamp H, APL materials 3, 086101 (2015). http://doi.org/10.1063/1.4927796
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Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Verbeeck J, Physical review : B : condensed matter and materials physics 64, 184110 (2001). http://doi.org/10.1103/PhysRevB.64.184110
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Structural, chemical and electronic characterization of ceramic materials using quantitative (scanning) transmission electron microscopy”. Bals S, Van Aert S, Verbeeck J, Van Tendeloo G, Microscopy and microanalysis 13, 332 (2007). http://doi.org/10.1017/S1431927607081664
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Chemical stability of YBiO3 buffer layers for implementation in YBa2Cu3O7-&delta, coated conductors”. Pollefeyt G, Meledin A, Pop C, Ricart S, Hühne R, Van Tendeloo G, Van Driessche I, Acta materialia 100, 224 (2015). http://doi.org/10.1016/j.actamat.2015.08.023
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Structure and microstructure of La1-xSrxMnO3 (x=0.16) films grown on a SrTiO3(110) substrate”. Lebedev OI, Verbeeck J, Van Tendeloo G, Amelinckx S, Ravazi FS, Habermeier H-U, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 81, 2865 (2001). http://doi.org/10.1080/01418610108217170
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Sub-nanometer free electrons with topological charge”. Schattschneider P, Stöger-Pollach M, Löffler S, Steiger-Thirsfeld A, Hell J, Verbeeck J, Ultramicroscopy 115, 21 (2012). http://doi.org/10.1016/j.ultramic.2012.01.010
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Substitutional phosphorus incorporation in nanocrystalline CVD diamond thin films”. Janssen W, Turner S, Sakr G, Jomard F, Barjon J, Degutis G, Lu YG, D'Haen J, Hardy A, Bael MV, Verbeeck J, Van Tendeloo G, Haenen K, Physica status solidi: rapid research letters 8, 705 (2014). http://doi.org/10.1002/pssr.201409235
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Novel 3DOM BiVO4/TiO2nanocomposites for highly enhanced photocatalytic activity”. Zalfani M, van der Schueren B, Hu Z-Y, Rooke JC, Bourguiga R, Wu M, Li Y, Van Tendeloo G, Su B-L, Journal of materials chemistry A : materials for energy and sustainability 3, 21244 (2015). http://doi.org/10.1039/C5TA00783F
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Co-Rich ZnCoO Nanoparticles Embedded in Wurtzite Zn1-xCoxO Thin Films: Possible Origin of Superconductivity”. Zeng Y-J, Gauquelin N, Li D-Y, Ruan S-C, He H-P, Egoavil R, Ye Z-Z, Verbeeck J, Hadermann J, Van Bael MJ, Van Haesendonck C, ACS applied materials and interfaces 7, 22166 (2015). http://doi.org/10.1021/acsami.5b06363
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SrTiO3(100)/(LaMnO3)m(SrMnO3)n layered heterostructures: a combined EELS and TEM study”. Verbeeck J, Lebedev OI, Van Tendeloo G, Mercey B, Physical review : B : condensed matter and materials physics 66, 184426 (2002). http://doi.org/10.1103/PhysRevB.66.184426
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The effect of Y2O3 and YFeO3 additions on the critical current density of YBCO coated conductors”. Lao M, Eisterer M, Stadel O, Meledin A, Van Tendeloo G, 1-4 (2014). http://doi.org/10.1088/1742-6596/507/2/022012
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Thin films of the spin ice compound Ho2Ti2O7”. Leusink DP, Coneri F, Hoek M, Turner S, Idrissi H, Van Tendeloo G, Hilgenkamp H, APL materials 2, 032101 (2014). http://doi.org/10.1063/1.4867222
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Three-dimensional elemental mapping at the atomic scale in bimetallic nanocrystals”. Goris B, de Backer A, Van Aert S, Gómez-Graña S, Liz-Marzán LM, Van Tendeloo G, Bals S, Nano letters 13, 4236 (2013). http://doi.org/10.1021/nl401945b
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