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Author
Title
Year
Publication
Volume
Times cited
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Zhong, Z.
;
Aveyard, R.
;
Rieger, B.
;
Bals, S.
;
Palenstijn, W.J.
;
Batenburg, K.J.
Automatic correction of nonlinear damping effects in HAADF-STEM tomography for nanomaterials of discrete compositions
2018
Ultramicroscopy
184
8
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