Hendrich, C.; Favre, L.; Ievlev, D.N.; Dobrynin, A.N.; Bras, W.; Hörmann, U.; Piscopiello, E.; Van Tendeloo, G.; Lievens, P.; Temst, K. |
Measurement of the size of embedded metal clusters by mass spectrometry, transmission electron microscopy, and small-angle X-ray scattering |
2007 |
Applied physics A : materials science & processing |
86 |
11 |
UA library record; WoS full record; WoS citing articles |