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Author | Kirilenko, D.A. | ||||
Title | Electron diffraction measurement of the binding rigidity of free-standing graphene | Type | A1 Journal article | ||
Year | 2013 | Publication | Technical physics letters | Abbreviated Journal | Tech Phys Lett+ |
Volume | 39 | Issue | 4 | Pages | 325-328 |
Keywords | A1 Journal article; Electron microscopy for materials research (EMAT) | ||||
Abstract | A method for measuring the binding rigidity of free-standing graphene from the dependence of the short-wavelength spectral range of transverse structural fluctuations of a crystal is proposed. The fluctuation spectrum is measured according to the variation in electron-diffraction patterns derived in a transmission electron microscope while tilting the sample. | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | 000319162600003 | Publication Date | 2013-05-16 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 1063-7850;1090-6533; | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | 0.771 | Times cited | 3 | Open Access | |
Notes | Approved | Most recent IF: 0.771; 2013 IF: 0.583 | |||
Call Number | UA @ lucian @ c:irua:109031 | Serial | 920 | ||
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