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Author | Markowicz, A.M.; Van Grieken, R.E. | ||||
Title | Quantification in XRF analysis of intermediate-thickness samples | Type | H3 Book chapter | ||
Year | 1992 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 339-358 T2 - Handbook of X-ray spectroscopy / Grie | ||
Keywords | H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
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Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:2855 | Serial | 8434 | ||
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