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Author Bittencourt, C.; Hitchock, A.P.; Ke, X.; Van Tendeloo, G.; Ewels, C.P.; Guttmann, P.
  Title X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge Type A1 Journal article
  Year 2012 Publication Beilstein journal of nanotechnology Abbreviated Journal Beilstein J Nanotech
  Volume 3 Issue Pages 345-350
  Keywords A1 Journal article; Engineering sciences. Technology; Electron microscopy for materials research (EMAT)
  Abstract We demonstrate that near-edge X-ray-absorption fine-structure spectra combined with full-field transmission X-ray microscopy can be used to study the electronic structure of graphite flakes consisting of a few graphene layers. The flake was produced by exfoliation using sodium cholate and then isolated by means of density-gradient ultracentrifugation. An image sequence around the carbon K-edge, analyzed by using reference spectra for the in-plane and out-of-plane regions of the sample, is used to map and spectrally characterize the flat and folded regions of the flake. Additional spectral features in both π and σ regions are observed, which may be related to the presence of topological defects. Doping by metal impurities that were present in the original exfoliated graphite is indicated by the presence of a pre-edge signal at 284.2 eV.
  Address
  Corporate Author Thesis
  Publisher Place of Publication Editor
  Language Wos 000303243400001 Publication Date 2012-04-25
  Series Editor Series Title Abbreviated Series Title
  Series Volume Series Issue Edition
  ISSN 2190-4286; ISBN Additional Links UA library record; WoS full record; WoS citing articles
  Impact Factor 3.127 Times cited 15 Open Access (up)
  Notes Approved Most recent IF: 3.127; 2012 IF: 2.374
  Call Number UA @ lucian @ c:irua:97703 Serial 3924
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