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“Maximum likelihood estimation of structure parameters from high resolution electron microscopy images : part 2 : a practical example”. Van Aert S, den Dekker AJ, van den Bos A, van Dyck D, Chen JH, Ultramicroscopy 104, 107 (2005). http://doi.org/10.1016/j.ultramic.2005.03.002
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Impact Factor: 2.843
Times cited: 37
DOI: 10.1016/j.ultramic.2005.03.002
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“Model based quantification of EELS spectra”. Verbeeck J, Van Aert S, Ultramicroscopy 101, 207 (2004). http://doi.org/10.1016/j.ultramic.2004.06.004
Abstract: Recent advances in model based quantification of electron energy loss spectra (EELS) are reported. The maximum likelihood method for the estimation of physical parameters describing an EELS spectrum, the validation of the model used in this estimation procedure, and the computation of the attainable precision, that is, the theoretical lower bound on the variance of these estimates, are discussed. Experimental examples on An and GaAs samples show the power of the maximum likelihood method and show that the theoretical prediction of the attainable precision can be closely approached even for spectra with overlapping edges where conventional EELS quantification fails. To provide end-users with a low threshold alternative to conventional quantification, a user friendly program was developed which is freely available under a GNU public license. (C) 2004 Elsevier B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.843
Times cited: 147
DOI: 10.1016/j.ultramic.2004.06.004
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“Obstacles on the road towards atomic resolution tomography”. van Dyck D, Van Aert S, Croitoru MD, Microscoy and microanalysis 11, 238 (2005)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT); Condensed Matter Theory (CMT); Vision lab
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“Growth of La2Mo2O9 films on porous Al2O3 substrates by radio frequency magnetron sputtering”. Laffez P, Chen XY, Banerjee G, Pezeril T, Rossell MD, Van Tendeloo G, Lacorre P, Liu JM, Liu Z-G, Thin solid films : an international journal on the science and technology of thin and thick films 500, 27 (2006). http://doi.org/10.1016/j.tsf.2005.10.062
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.879
Times cited: 15
DOI: 10.1016/j.tsf.2005.10.062
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“Hydrothermal synthesis and characterization of nanorods of various titanates and titanium dioxide”. Kolen'ko YV, Kovnir KA, Gavrilov AI, Garshev AV, Frantti J, Lebedev OI, Churagulov BR, Van Tendeloo G, Yoshimura M, The journal of physical chemistry : B : condensed matter, materials, surfaces, interfaces and biophysical 110, 4030 (2006). http://doi.org/10.1021/jp055687u
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.177
Times cited: 234
DOI: 10.1021/jp055687u
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“Statistical estimation of atomic positions from exit wave reconstruction with a precision in the picometer range”. Bals S, Van Aert S, Van Tendeloo G, Avila-Brande D, Physical review letters 96, 096106 (2006). http://doi.org/10.1103/PhysRevLett.96.096106
Abstract: The local structure of Bi4W2/3Mn1/3O8Cl is determined using quantitative transmission electron microscopy. The electron exit wave, which is closely related to the projected crystal potential, is reconstructed and used as a starting point for statistical parameter estimation. This method allows us to refine all atomic positions on a local scale, including those of the light atoms, with a precision in the picometer range. Using this method one is no longer restricted to the information limit of the electron microscope. Our results are in good agreement with x-ray powder diffraction data demonstrating the reliability of the method. Moreover, it will be shown that local effects can be interpreted using this approach.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 8.462
Times cited: 69
DOI: 10.1103/PhysRevLett.96.096106
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“Acquisition of the EELS data cube by tomographic reconstruction”. van den Broek W, Verbeeck J, de Backer S, Scheunders P, Schryvers D, Ultramicroscopy 106, 269 (2006). http://doi.org/10.1016/j.ultramic.2005.09.001
Abstract: Energy filtered TEM, EFTEM, provides three-dimensional data, two spatial and one spectral dimension. We propose to acquire these data by measuring a series of images with a defocused energy filter. It will be shown that each image is a projection of the data on the detector and that reconstruction of the data out of a sufficient number of such projections using a tomographic reconstruction algorithm is possible. This technique uses only a fraction of the electron dose an energy filtered series (EFS) needs for the same spectral and spatial resolution and the same mean signal-to-noise ratio. (c) 2005 Elsevier B.V. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT); Vision lab
Impact Factor: 2.843
Times cited: 6
DOI: 10.1016/j.ultramic.2005.09.001
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“Controllable synthesis of novel one-dimensional carbon nanomaterials on an alkali-element-modified Cu catalyst”. Tao XY, Zhang XB, Cheng J-P, Liu F, Li Y, Van Tendeloo G, Nanotechnology 17, 224 (2006). http://doi.org/10.1088/0957-4484/17/1/037
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.44
Times cited: 4
DOI: 10.1088/0957-4484/17/1/037
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“Shape resonances in the superconducting order parameter of ultrathin nanowires”. Shanenko AA, Croitoru MD, Physical review : B : condensed matter and materials physics 73, 012510 (2006). http://doi.org/10.1103/PhysRevB.73.012510
Keywords: A1 Journal article; Condensed Matter Theory (CMT); Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 41
DOI: 10.1103/PhysRevB.73.012510
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“Phase transitions in K3AlF6”. Abakumov AM, Rossell MD, Alekseeva AM, Vassiliev SY, Mudrezova SN, Van Tendeloo G, Antipov EV, Journal of solid state chemistry 179, 421 (2006). http://doi.org/10.1016/j.jssc.2005.10.044
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 18
DOI: 10.1016/j.jssc.2005.10.044
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“Biaxially aligned titanium nitride thin films deposited by reactive unbalanced magnetron sputtering”. Mahieu S, Ghekiere P, de Winter G, de Gryse R, Depla D, Van Tendeloo G, Lebedev OI, Surface and coatings technology 200, 2764 (2006). http://doi.org/10.1016/j.surfcoat.2004.09.012
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.589
Times cited: 36
DOI: 10.1016/j.surfcoat.2004.09.012
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“First direct imaging of giant pores of the metal-organic framework MIL-101”. Lebedev OI, Millange F, Serre C, Van Tendeloo G, Férey G, Chemistry of materials 17, 6525 (2005). http://doi.org/10.1021/cm051870o
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 9.466
Times cited: 191
DOI: 10.1021/cm051870o
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“Determination of the mean inner potential in III-V semiconductors, Si and Ge by density functional theory and electron holography”. Kruse P, Schowalter M, Lamoen D, Rosenauer A, Gerthsen D, Ultramicroscopy 106, 105 (2006). http://doi.org/10.1016/j.ultramic.2005.06.057
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 2.843
Times cited: 50
DOI: 10.1016/j.ultramic.2005.06.057
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“Synthesis and crystal structure of novel CaRMnSnO6(R = La, Pr, Nd, Sm-Dy) double perovskites”. Abakumov AM, Rossell MD, Seryakov SA, Rozova MG, Markina MM, Van Tendeloo G, Antipov EV, Journal of materials chemistry 15, 4899 (2005). http://doi.org/10.1039/b510242a
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Times cited: 8
DOI: 10.1039/b510242a
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“Sn19.3Cu4.7As22I8: a new clathrate-I compound with transition-metal atoms in the cationic framework”. Kovnir KA, Sobolev AV, Presniakov IA, Lebedev OI, Van Tendeloo G, Schnelle W, Grin Y, Shevelkov AV, Inorganic chemistry 44, 8786 (2005). http://doi.org/10.1021/ic051160k
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 4.857
Times cited: 38
DOI: 10.1021/ic051160k
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“Energy-loss near-edge structure changes with bond length in carbon systems”. Titantah JT, Lamoen D, Physical review : B : condensed matter and materials physics 72, 193104 (2005). http://doi.org/10.1103/PhysRevB.72.193104
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.836
Times cited: 24
DOI: 10.1103/PhysRevB.72.193104
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“Oxidation processes at the metal/oxide interface in CoFe2/CoFe2O4 bilayers deposited by pulsed laser deposition”. Viart N, Sayed Hassan R, Ulhaq-Bouillet C, Meny C, Panissod P, Loison JL, Versini G, Huber F, Pourroy G, Verbeeck J, Van Tendeloo G, Acta materialia 54, 191 (2006). http://doi.org/10.1016/j.actamat.2005.08.041
Abstract: CoFe2/CoFe2O4 bilayers were made by pulsed laser ablation of a CoFe2 target on Si(I 0 0) substrates. The metallic layer was deposited first, in vacuum. The oxide was then deposited in an oxidizing O-2:N-2 (20:80) atmosphere. Two different procedures were used for the introduction of the oxidizing atmosphere in the deposition chamber: the laser ablation of the target was either stopped (discontinuous deposition process) or maintained (continuous deposition process) during the 20 min necessary for the establishment of the desired O-2:N-2 pressure. In both cases, the different electronegativities of Fe and Co cause an important modification of the Fe/Co ratio at the metal/oxide interface, with a depletion of Fe in the metal region and of Co in the oxide region. In the continuous procedure, the combination of the kinetic energy given by the ablation process to the Fe and Co adatoms with the one they get from their different affinity towards oxidation allows the formation of a low roughness metal/oxide interface with a high (111) preferred orientation of the CoFe2O4 layer, an induced re-crystallisation of the metal layer underneath and an unusual antiferromagnetic metal/oxide magnetic coupling. (c) 2005 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.301
Times cited: 5
DOI: 10.1016/j.actamat.2005.08.041
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“Nanoparticles in lustre reconstructions”. Frederickx P, Verbeeck J, Schryvers D, Helary D, Darque-Ceretti E, , 169 (2005)
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang Z, , 329 (2005)
Abstract: Lattice deformations and concentration gradients surrounding Ni4Ti3 precipitates grown by appropriate annealing in a Ni51Ti49 B2 austenite matrix are determined by a combination of TEM techniques. Quantitative Fourier analysis of HRTEM images reveals a deformed nanoscale region with lattice deformations up to 2% while EELS and EDX indicate a Ni depleted zone up to 150 nm away from the matrix-precipitate interface.
Keywords: P1 Proceeding; Electron microscopy for materials research (EMAT)
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“Analytical TEM investigations on concentration gradients surrounding Ni4Ti3 precipitates in Ni-Ti shape memory material”. Yang Z, Tirry W, Schryvers D, Scripta materialia 52, 1129 (2005). http://doi.org/10.1016/j.scriptamat.2005.02.013
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.747
Times cited: 49
DOI: 10.1016/j.scriptamat.2005.02.013
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“Quantitative determination of strain fields around Ni4Ti3 precipitates in NiTi”. Tirry W, Schryvers D, Acta materialia 53, 1041 (2005). http://doi.org/10.1016/j.actamat.2004.10.049
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 5.301
Times cited: 97
DOI: 10.1016/j.actamat.2004.10.049
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“New lead vanadium phosphate with langbeinite-type structure: Pb1.5V2(PO4)3”. Shpanchenko RV, Lapshina OA, Antipov EV, Hadermann J, Kaul EE, Geibel C, Materials research bulletin 40, 1569 (2005). http://doi.org/10.1016/j.materresbull.2005.04.037
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.446
Times cited: 14
DOI: 10.1016/j.materresbull.2005.04.037
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“Ca6.3Mn3Ga4.4Al1.3O18: a novel complex oxide with 3D tetrahedral framework”. Abakumov AM, Hadermann J, Kalyuzhnaya AS, Rozova MG, Mikheev MG, Van Tendeloo G, Antipov EV, Journal of solid state chemistry 178, 3137 (2005). http://doi.org/10.1016/j.jssc.2005.07.028
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 5
DOI: 10.1016/j.jssc.2005.07.028
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“Synthesis and structure investigation of the Pb3V(PO4)3 eulytite”. Shpanchenko RV, Panin RV, Hadermann J, Bougerol C, Takayama-Muromachi E, Antipov EV, Journal of solid state chemistry 178, 3715 (2005). http://doi.org/10.1016/j.jssc.2005.09.045
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 2.299
Times cited: 17
DOI: 10.1016/j.jssc.2005.09.045
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“Ab initio calculation of the interaction energy in the P2 binding pocket of HIV-1 protease”. Nivesanond K, Peeters A, Lamoen D, van Alsenoy C, International Journal Of Quantum Chemistry 105, 292 (2005). http://doi.org/10.1002/qua.20724
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 2.92
Times cited: 8
DOI: 10.1002/qua.20724
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“First-principles calculations of 002 structure factors for electron scattering in strained InxGa1-xAs”. Rosenauer A, Schowalter M, Glas F, Lamoen D, Physical Review B 72, 1 (2005). http://doi.org/10.1103/PhysRevB.72.085326
Abstract: This work provides values of electron scattering 002 structure factors for InxGa1-xAs as a function of the In concentration x=0 to 1. These results allow accurate compositional analysis of pseudomorphically grown InxGa1-xAs/GaAs layers by transmission electron microscopy methods relying on the chemical sensitivity of the (002) beam. The calculations go beyond the limits of the isolated atom approximation, because they take into account charge redistribution effects between atomic sites in the crystal, strain, and static atomic displacements. The computations were performed by the full potential linearized augmented plane-wave method using a generalized gradient approximation for the exchange and correlation part of the potential. The calculations of strained InxGa1-xAs correspond to the strain state in specimens with large, small, and intermediate thickness in the electron beam direction. Additionally, the effect of static atomic displacements is taken into account. All results are listed in a parameterized form. The calculated 002 structure factor vanishes at an In concentration of 16.4%. This value is in a good agreement with previously reported experimental measurements. Hence, our results are a significant improvement with respect to the isolated atom approximation which is conventionally applied in transmission electron microscopy simulations, and which predicts a value of 22.5%.
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 3.836
Times cited: 42
DOI: 10.1103/PhysRevB.72.085326
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“Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Waag A, Applied Physics Letters 86 (2005). http://doi.org/10.1063/1.1901820
Keywords: A1 Journal article; Electron Microscopy for Materials Science (EMAT);
Impact Factor: 3.411
Times cited: 5
DOI: 10.1063/1.1901820
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“Structural, textural, and electronic properties of a nanosized mesoporous ZnxTi1-xO2-x solid solution prepared by a supercritical drying route”. Kolen'ko YV, Kovnir KA, Gavrilov AI, Garshev AV, Meskin PE, Churagulov BR, Bouchard M, Colbeau-Justin C, Lebedev OI, Van Tendeloo G, Yoshimura M, Journal of physical chemistry B 109, 20303 (2005). http://doi.org/10.1021/jp0535341
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 3.177
Times cited: 34
DOI: 10.1021/jp0535341
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“Thermal stability of atomic layer deposited Zr:Al mixed oxide thin films: an in situ transmission electron microscopy study”. Nistor LC, Richard O, Zhao C, Bender H, Van Tendeloo G, Journal of materials research 20, 1741 (2005). http://doi.org/10.1557/JMR.2005.0217
Keywords: A1 Journal article; Electron microscopy for materials research (EMAT)
Impact Factor: 1.673
DOI: 10.1557/JMR.2005.0217
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“Statistical estimation of oxygen atomic positions eith sub Ångstrom precision from exit wave reconstruction”. Bals S, Van Aert S, Van Tendeloo G, van Dyck D, Avila-Brande D, Microscopy and microanalysis 11, 556 (2005)
Keywords: A3 Journal article; Electron microscopy for materials research (EMAT); Vision lab
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