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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
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Gauquelin, N.; Zhang, H.; Zhu, G.; Wei, J.Y.T.; Botton, G.A. |
Atomic-scale identification of novel planar defect phases in heteroepitaxial YBa2Cu3O7-\delta thin films |
2018 |
AIP advances |
8 |
1 |
UA library record; WoS full record; WoS citing articles |
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Bhat, S.G.; Gauquelin, N.; Sebastian, N.K.; Sil, A.; Béché, A.; Verbeeck, J.; Samal, D.; Kumar, P.S.A. |
Orthorhombic vs. hexagonal epitaxial SrIrO3 thin films : structural stability and related electrical transport properties |
2018 |
Europhysics letters |
122 |
4 |
UA library record; WoS full record; WoS citing articles |
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Müller-Caspary, K.; Grieb, T.; Müßener, J.; Gauquelin, N.; Hille, P.; Schörmann, J.; Verbeeck, J.; Van Aert, S.; Eickhoff, M.; Rosenauer, A. |
Electrical Polarization in AlN/GaN Nanodisks Measured by Momentum-Resolved 4D Scanning Transmission Electron Microscopy |
2019 |
Physical review letters |
122 |
26 |
UA library record; WoS full record; WoS citing articles |
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