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Records |
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Author |
Van Grieken, R. |
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Title |
Awards for best referees of X-ray Spectrometry |
Type |
Editorial |
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Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
2 |
Pages |
68-69 |
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Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Wos |
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Publication Date |
2014-02-07 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number  |
UA @ admin @ c:irua:114471 |
Serial |
7542 |
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Author |
Van Grieken, R. |
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Title |
Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry |
Type |
Editorial |
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Year |
2014 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
43 |
Issue |
2 |
Pages |
67 |
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Keywords |
Editorial; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000331386000001 |
Publication Date |
2014-02-07 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:114470 |
Serial |
8120 |
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| Permanent link to this record |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
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Title |
Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples |
Type |
A1 Journal article |
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Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
2 |
Pages |
131-133 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A new equation for predicting the generated bremsstrahlung background intensity in electron-probe x-ray microanalysis has been verified experimentally. This equation is applicable to all bulk composite specimens and reduces to Kramers' equation for pure elements only. The experimental verification has been carried out for Al2O3, Fe2O3 and ZrO2 with radiation energies from 4.2 to 14.8 keV. The predicted bremsstrahlung intensities are in good agreement with the experimental data. |
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Wos |
A1986C017300009 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:113873 |
Serial |
7937 |
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Author |
Markowicz, A.; Storms, H.; Van Grieken, R. |
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Title |
A simple absorption correction for electron probe X-ray microanalysis of bulk samples |
Type |
A1 Journal article |
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Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
2 |
Pages |
115-119 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A simple procedure is proposed for the calculation of the absorption correction factor in electron-probe x-ray microanalysis. It is based on the concept of an effective depth of x-ray production, assuming a rectangular depth distribution function for x-ray generation. This effective x-ray production depth is expressed as a fraction of the x-ray excitation depth given by Whelan's expression. Adequate values for this fraction are presented. Two versions are considered. In the first the effective x-ray production is a function of both the characteristic x-ray energy and the atomic numbers of the matrix elements, whereas in the second one, which is indicated for routine use, the energy dependence is neglected. Calculations pointed to satisfactory results, even for low x-ray energies and high overvoltages. |
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Wos |
A1986C017300007 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:113872 |
Serial |
8524 |
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Author |
Van Dyck, P.; Török, S.; Van Grieken, R. |
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Title |
Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive X-ray spectra |
Type |
A1 Journal article |
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Year |
1986 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
15 |
Issue |
4 |
Pages |
231-238 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A Monte Carlo simulation has been developed to describe the incoherent and coherent scatter processes for the complex geometry of a secondary target energy-dispersive x-ray fluorescence system. Photons are followed from the x-ray tube anode until the detection of scattered secondary target photons in the active Si layer of the detector. The program quantitatively shows the broadening of the incoherent scatter peak with increasing atomic number, and it models the incoherent peak shape adequately. The incoherent-to-coherent scatter intensity ratios obtained differ by 1030% from the theoretical values, while their dependence on the sample atomic number corresponds to that expected from theory. |
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Wos |
A1986E535600001 |
Publication Date |
2005-05-28 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:113612 |
Serial |
8280 |
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Author |
Vanmeert, F.; Mudronja, D.; Fazinic, S.; Janssens, K.; Tibljas, D. |
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Title |
Semi-quantitative analysis of the formation of a calcium oxalate protective layer for monumental limestone using combined micro-XRF and micro-XRPD |
Type |
A1 Journal article |
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Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
X-Ray Spectrom |
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Volume |
42 |
Issue |
4 |
Pages |
256-261 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
A current method for the protection of cretaceous limestone present in various monuments consists of performing a passivating treatment with ammonium oxalate (AmOx). A calcium oxalate protective layer is formed on the surface and enhances the acid resistance of the stone. The in-depth formation of the calcium oxalate layer was investigated on cross sections by using combined micro X-ray fluorescence and micro X-ray powder diffraction (mu XRF/mu XRPD). XRPD showed the presence of both whewellite and weddellite in the calcite stone matrix. A correction was made for sample misalignment, which was visible in both the fluorescence and the diffraction line measurements. A semi-quantitative analysis was performed on the basis of Klug's equation for a two-phase mixture (the presence of weddellite was neglected) without the need for a known reference sample. By assuming two extreme compositions for a reference weight fraction (1 and 99wt%), it was possible to obtain whewellite concentration profiles, which can be used for comparing the effectiveness of different methods for the application of AmOx to the stone surface and the effect of treatment time and AmOx concentration used. It is shown that for the relative amounts of whewellite formed, the differences due to the assumed weight fractions are smaller than the errors due to sample heterogeneity and preferred orientation. Copyright (c) 2013 John Wiley & Sons, Ltd. |
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Wos |
000320727900015 |
Publication Date |
2013-05-14 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record; WoS citing articles |
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Impact Factor |
1.298 |
Times cited |
5 |
Open Access |
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Notes |
; The authors would like to thank De Nolf W. for his valuable feedback on the analysis of the X-ray diffraction data. We acknowledge SOLEIL for provision of SR facilities (proposal ID 20100979), and we would like to thank Dr. C. Mocuta for his assistance at the DIFFABS beamline. This research was supported by the Interuniversity Attraction Poles Program – Belgian Science Policy (IUAP VI/16). The text also presents results of GOA 'XANES meets ELNES' (Research Fund University of Antwerp, Belgium) and from FWO (Brussels, Belgium) projects no. G.0704.08 and G.01769.09. The EU Community's FP7 Research Infrastructures program for the CHARISMA Project (grant agreement 228330) and, within framework in particular, the access possibilities to the SOLEIL and IPANEMA facilities are also acknowledged. ; |
Approved |
Most recent IF: 1.298; 2013 IF: 1.187 |
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Call Number |
UA @ admin @ c:irua:109579 |
Serial |
5827 |
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Author |
Van Grieken, R. |
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Title |
Editorial : introducing Dr Markowicz as X-Ray Spectrometry's new associate editor for Europe |
Type |
A1 Journal article |
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Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
42 |
Issue |
4 |
Pages |
175 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Wos |
000320727900001 |
Publication Date |
2013-06-20 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:108738 |
Serial |
7832 |
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Author |
Van Grieken, R. |
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Title |
Editorial : award for best X-Ray Spectrometry referee during 2011-2012 |
Type |
A1 Journal article |
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Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
42 |
Issue |
1 |
Pages |
3 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Wos |
000314971600002 |
Publication Date |
2012-12-22 |
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Series Editor |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:104628 |
Serial |
7830 |
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Author |
Van Grieken, R. |
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Title |
New members of the editorial board of X-ray Spectrometry |
Type |
A1 Journal article |
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Year |
2013 |
Publication |
X-ray spectrometry |
Abbreviated Journal |
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Volume |
42 |
Issue |
1 |
Pages |
1-2 |
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Keywords |
A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
000314971600001 |
Publication Date |
2012-12-22 |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
0049-8246 |
ISBN |
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Additional Links |
UA library record; WoS full record |
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Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
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Call Number |
UA @ admin @ c:irua:104627 |
Serial |
8301 |
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