Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Adams, F.; Gijbels, R.; van Grieken, R.; Kim, Y.-sang |
Inorganic mass spectrometry |
1999 |
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|
UA library record |
Schryvers, D.; Seo, J.W.; Richard, O.; Vermeulen, W.; Potapov, P. |
Decomposition phenomena in Ni-Mn-Ti austenite |
1999 |
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|
UA library record; WoS full record; |
Schryvers, D. |
Advanced TEM studies of martensite and related phase transformations |
1999 |
|
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|
UA library record; WoS full record; |
Tafuri, F.; Granozio, F.M.; Carillo, F.; Lombardi, F.; Di Uccio, U.S.; Verbist, K.; Lebedev, O.; Van Tendeloo, G. |
Josephson phenomenology and microstructure of YBaCuO artificial grain boundaries characterized by misalignment of the c-axes |
1999 |
Physica: C : superconductivity |
327 |
7 |
UA library record; WoS full record; WoS citing articles |
Lemmens, H.; Richard, O.; Van Tendeloo, G.; Bismayer, U. |
Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3 |
1999 |
Journal of electron microscopy |
48 |
7 |
UA library record; WoS full record; WoS citing articles |
De Gryse, O.; Clauws, P.; Rossou, L.; van Landuyt, J.; Vanhellemont, J. |
Accurate infrared absorption measurement of interstitial and precipitated oxygen in p+ silicon wafers |
1999 |
Microelectronic engineering |
45 |
|
UA library record; WoS full record |
Fedina, L.; Gutakovskii, A.; Aseev, A.; van Landuyt, J.; Vanhellemont, J. |
Extended defects formation in Si crystals by clustering of intrinsic point defects studied by in-situ electron irradiation in an HREM |
1999 |
Physica status solidi: A: applied research
T2 – International Conference on Extended Defects in Semiconductors (EDS 98), Sept. 06-11, 1998, Jaszowiec, Poland |
171 |
40 |
UA library record; WoS full record; WoS citing articles |