Number of records found: 3074
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Citations
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Dose limited reliability of quantitative annular dark field scanning transmission electron microscopy for nano-particle atom-counting”. de Backer A, Martinez GT, MacArthur KE, Jones L, Béché, A, Nellist PD, Van Aert S, Ultramicroscopy 151, 56 (2015). http://doi.org/10.1016/j.ultramic.2014.11.028
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Enhanced biomedical heat-triggered carriers via nanomagnetism tuning in ferrite-based nanoparticles”. Angelakeris M, Li ZA, Hilgendorff M, Simeonidis K, Sakellari D, Filippousi M, Tian H, Van Tendeloo G, Spasova M, Acet M, Farle M, Journal of magnetism and magnetic materials 381, 179 (2015). http://doi.org/10.1016/j.jmmm.2014.12.069
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Enhanced local magnetization by interface engineering in perovskite-type correlated oxide heterostructures”. Huijben M, Liu Y, Boschker H, Lauter V, Egoavil R, Verbeeck J, te Velthuis SGE, Rijnders G, Koster G, Advanced Materials Interfaces 2, 1400416 (2015). http://doi.org/10.1002/admi.201400416
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Air- and water-resistant noble metal coated ferromagnetic cobalt nanorods”. Lentijo-Mozo S, Tan RP, Garcia-Marcelot C, Altantzis T, Fazzini PF, Hungria T, Cormary B, Gallagher JR, Miller JT, Martinez H, Schrittwieser S, Schotter J, Respaud M, Bals S, Van Tendeloo G, Gatel C, Soulantica K, ACS nano 9, 2792 (2015). http://doi.org/10.1021/nn506709k
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Using electron vortex beams to determine chirality of crystals in transmission electron microscopy”. Juchtmans R, Béché, A, Abakumov A, Batuk M, Verbeeck J, Physical review : B : condensed matter and materials physics 91, 094112 (2015). http://doi.org/10.1103/PhysRevB.91.094112
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Phase problem in the B-site ordering of La2CoMnO6 : impact on structure and magnetism”. Egoavil R, Huehn S, Jungbauer M, Gauquelin N, Béché, A, Van Tendeloo G, Verbeeck, Moshnyaga V, Nanoscale 7, 9835 (2015). http://doi.org/10.1039/c5nr01642h
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Electron tomography based on highly limited data using a neural network reconstruction technique”. Bladt E, Pelt DM, Bals S, Batenburg KJ, Ultramicroscopy 158, 81 (2015). http://doi.org/10.1016/j.ultramic.2015.07.001
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Smart Align : a new tool for robust non-rigid registration of scanning microscope data”. Jones L, Yang H, Pennycook TJ, Marshall MSJ, Van Aert S, Browning ND, Castell MR, Nellist PD, Advanced Structural and Chemical Imaging 1, 8 (2015). http://doi.org/10.1186/s40679-015-0008-4
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Homogeneity and composition of AlInGaN : a multiprobe nanostructure study”. Krause FF, Ahl JP, Tytko D, Choi PP, Egoavil R, Schowalter M, Mehrtens T, Müller-Caspary K, Verbeeck J, Raabe D, Hertkorn J, Engl K, Rosenauer A, Ultramicroscopy 156, 29 (2015). http://doi.org/10.1016/j.ultramic.2015.04.012
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Determination of the atomic width of an APB in ordered CoPt using quantified HAADF-STEM”. Akamine H, Van den Bos KHW, Gauquelin N, Farjami S, Van Aert S, Schryvers D, Nishida M, Journal of alloys and compounds 644, 570 (2015). http://doi.org/10.1016/j.jallcom.2015.04.205
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Extreme mobility enhancement of two-dimensional electron gases at oxide interfaces by charge-transfer-induced modulation doping”. Chen YZ, Trier F, Wijnands T, Green RJ, Gauquelin N, Egoavil R, Christensen DV, Koster G, Huijben M, Bovet N, Macke S, He F, Sutarto R, Andersen NH, Sulpizio JA, Honig M, Prawiroatmodjo GEDK, Jespersen TS, Linderoth S, Ilani S, Verbeeck J, Van Tendeloo G, Rijnders G, Sawatzky GA, Pryds N, Nature materials 14, 801 (2015). http://doi.org/10.1038/nmat4303
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Quantitative STEM normalisation : the importance of the electron flux”. Martinez GT, Jones L, de Backer A, Béché, A, Verbeeck J, Van Aert S, Nellist PD, Ultramicroscopy 159, 46 (2015). http://doi.org/10.1016/j.ultramic.2015.07.010
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Measuring lattice strain in three dimensions through electron microscopy”. Goris B, de Beenhouwer J, de Backer A, Zanaga D, Batenburg KJ, Sánchez-Iglesias A, Liz-Marzán LM, Van Aert S, Bals S, Sijbers J, Van Tendeloo G, Nano letters 15, 6996 (2015). http://doi.org/10.1021/acs.nanolett.5b03008
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Strain accommodation through facet matching in La1.85Sr0.15CuO4/Nd1.85Ce0.15CuO4 ramp-edge junctions”. Hoek M, Coneri F, Poccia N, Renshaw Wang X, Ke X, Van Tendeloo G, Hilgenkamp H, APL materials 3, 086101 (2015). http://doi.org/10.1063/1.4927796
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The role of steam treatment on the structure, purity and length distribution of multi-walled carbon nanotubes”. Cabana L, Ke X, Kepić, D, Oro-Solé, J, Tobías-Rossell E, Van Tendeloo G, Tobias G, Carbon 93, 1059 (2015). http://doi.org/10.1016/j.carbon.2015.06.027
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3D Magnetic Induction Maps of Nanoscale Materials Revealed by Electron Holographic Tomography”. Wolf D, Rodriguez LA, Béché, A, Javon E, Serrano L, Magen C, Gatel C, Lubk A, Lichte H, Bals S, Van Tendeloo G, Fernández-Pacheco A, De Teresa JM, Snoeck E, Chemistry of materials 27, 6771 (2015). http://doi.org/10.1021/acs.chemmater.5b02723
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Electron Microscopy of Probability Currents at Atomic Resolution”. Lubk A, Béché, A, Verbeeck J, Physical review letters 115, 176101 (2015). http://doi.org/10.1103/PhysRevLett.115.176101
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Co-Rich ZnCoO Nanoparticles Embedded in Wurtzite Zn1-xCoxO Thin Films: Possible Origin of Superconductivity”. Zeng Y-J, Gauquelin N, Li D-Y, Ruan S-C, He H-P, Egoavil R, Ye Z-Z, Verbeeck J, Hadermann J, Van Bael MJ, Van Haesendonck C, ACS applied materials and interfaces 7, 22166 (2015). http://doi.org/10.1021/acsami.5b06363
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Atomic and electronic structures of BaHfO3-doped TFA-MOD-derived YBa2Cu3O7−δthin films”. Molina-Luna L, Duerrschnabel M, Turner S, Erbe M, Martinez GT, Van Aert S, Holzapfel B, Van Tendeloo G, Superconductor science and technology 28, 115009 (2015). http://doi.org/10.1088/0953-2048/28/11/115009
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Focused electron beam induced deposition as a tool to create electron vortices”. Béché, A, Winkler R, Plank H, Hofer F, Verbeeck J, Micron 80, 34 (2015). http://doi.org/10.1016/j.micron.2015.07.011
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Orbital angular momentum in electron diffraction and its use to determine chiral crystal symmetries”. Juchtmans R, Verbeeck J, Physical review: B: condensed matter and materials physics 92, 134108 (2015). http://doi.org/10.1103/PhysRevB.92.134108
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Quantitative Tomography of Organic Photovoltaic Blends at the Nanoscale”. Pfannmöller M, Heidari H, Nanson L, Lozman OR, Chrapa M, Offermans T, Nisato G, Bals S, Nano letters 15, 6634 (2015). http://doi.org/10.1021/acs.nanolett.5b02437
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Novel 3DOM BiVO4/TiO2nanocomposites for highly enhanced photocatalytic activity”. Zalfani M, van der Schueren B, Hu Z-Y, Rooke JC, Bourguiga R, Wu M, Li Y, Van Tendeloo G, Su B-L, Journal of materials chemistry A : materials for energy and sustainability 3, 21244 (2015). http://doi.org/10.1039/C5TA00783F
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Combination of HAADF-STEM and ADF-STEM Tomography for Core-Shell Hybrid Materials”. Sentosun K, Sanz Ortiz MN, Batenburg KJ, Liz-Marzán LM, Bals S, Particle and particle systems characterization 32, 1063 (2015). http://doi.org/10.1002/ppsc.201500097
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Engineering Structural Diversity in Gold Nanocrystals by Ligand-Mediated Interface Control”. Wang Y, Sentosun K, Li A, Coronado-Puchau M, Sánchez-Iglesias A, Li S, Su X, Bals S, Liz-Marzán LM, Chemistry of materials 27, 8032 (2015). http://doi.org/10.1021/acs.chemmater.5b03600
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Controlled Living Nanowire Growth: Precise Control over the Morphology and Optical Properties of AgAuAg Bimetallic Nanowires”. Mayer M, Scarabelli L, March K, Altantzis T, Tebbe M, Kociak M, Bals S, Garcia de Abajo FJ, Fery A, Liz-Marzan LM, Nano letters 15, 5427 (2015). http://doi.org/10.1021/acs.nanolett.5b01833
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Effects of Nanostructure and Coating on the Mechanics of Carbon Nanotube Arrays”. Poelma RH, Fan X, Hu Z-Y, Van Tendeloo G, van Zeijl HW, Zhang GQ, Advanced functional materials 26, 1233 (2016). http://doi.org/10.1002/adfm.201503673
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A quantitative method to characterize the Al4C3-formed interfacial reaction: the case study of MWCNT/Al composites”. Yan L, Tan Z, Ji G, Li Z, Fan G, Schryvers D, Shan A, Zhang D, Materials characterization 112, 213 (2015). http://doi.org/10.1016/j.matchar.2015.12.031
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Quantitative annular dark field scanning transmission electron microscopy for nanoparticle atom-counting: What are the limits?”.De Backer A, De Wael A, Gonnissen J, Martinez GT, Béché, A, MacArthur KE, Jones L, Nellist PD, Van Aert S, Journal of physics : conference series 644Electron Microscopy and Analysis Group Conference (EMAG), JUN 02-JUL 02, 2015, Manchester, ENGLAND, 012034 (2015). http://doi.org/10.1088/1742-6596/644/1/012034
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