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EPMA and µ-SRXRF analysis and TEM-based microstructure characterization of a set of Roman glass fragments”. Fredrickx P, de Ryck I, Janssens K, Schryvers D, Petit J-P, Döcking H, X-ray spectrometry 33, 326 (2004). http://doi.org/10.1002/xrs.734
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Heavy metal analysis around Iskenderun Bay in Turkey”. Čevik U, Koz B, Makarovska Y, X-ray spectrometry 39, 202 (2010). http://doi.org/10.1002/XRS.1250
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Chemical analysis of 16th to 19th century Limoges School painted enamel objects in three museums of the Low Countries”. van der Linden V, Schalm O, Houbraken J, Thomas M, Meesdom E, Devos A, van Dooren R, Nieuwdorp H, Janssen E, Janssens K, X-ray spectrometry 39, 112 (2010). http://doi.org/10.1002/XRS.1207
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James Ensor's pigment use: artistic and material evolution studied by means of portable X-ray fluorescence spectrometry”. van der Snickt G, Janssens K, Schalm O, Aibéo C, Kloust H, Alfeld M, X-ray spectrometry 39, 103 (2010). http://doi.org/10.1002/XRS.1235
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Editorial: Award for best XRS referee during 2007-2008”. Van Grieken R, X-ray spectrometry 37, 571 (2008). http://doi.org/10.1002/XRS.1107
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Assessment of aerosol particles within the Rubens' House Museum in Antwerp, Belgium”. Godoi RHM, Potgieter-Vermaak S, Godoi AFL, Stranger M, Van Grieken R, X-ray spectrometry 37, 298 (2008). http://doi.org/10.1002/XRS.1049
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Investigation on porosity changes of Lecce stone due to conservation treatments by means of x-ray nano- and improved micro-computed tomography: preliminary results”. Bugani S, Camaiti M, Morselli L, Van de Casteele E, Janssens K, X-ray spectrometry 36, 316 (2007). http://doi.org/10.1002/XRS.976
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Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
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Energy-dispersive X-ray fluorescence analysis of geological materials in borax beads using Tertian's binary coefficient approach combined with internal standard addition”. Muia LM, Van Grieken R, X-ray spectrometry 20, 179 (1991)
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Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods”. Worobiec A, Stefaniak EA, Kiro S, Oprya M, Bekshaev A, Spolnik Z, Potgieter-Vermaak SS, Ennan A, Van Grieken R, X-ray spectrometry 36, 328 (2007). http://doi.org/10.1002/XRS.979
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EDXRS study of aerosol composition variations in air masses crossing the North Sea”. Injuk J, van Malderen H, Van Grieken R, Swietlicki E, Knox JM, Schofield R, X-ray spectrometry 22, 220 (1993). http://doi.org/10.1002/XRS.1300220410
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M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range”. Trincavelli J, Montoro S, van Espen P, Van Grieken R, X-ray spectrometry 22, 372 (1993). http://doi.org/10.1002/XRS.1300220510
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Speciation of selected metals in aerosol samples by TXRF after sequential leaching”. Samek L, Ostachowicz B, Worobiec A, Spolnik Z, Van Grieken R, X-ray spectrometry 35, 226 (2006). http://doi.org/10.1002/XRS.905
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New Chinese members of the Advisory Board of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 35, 205 (2006)
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High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
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EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials”. Belikov KN, Mikhailova LI, Spolnik ZM, Van Grieken R, X-ray spectrometry 35, 112 (2006). http://doi.org/10.1002/XRS.874
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Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses”. Padilla R, van Espen P, Abrahantes A, Janssens K, X-ray spectrometry 34, 19 (2005). http://doi.org/10.1002/XRS.781
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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Grazing-exit electron probe x-ray microanalysis of light elements in particles”. Spolnik Z, Tsuji K, Van Grieken R, X-ray spectrometry 33, 16 (2004). http://doi.org/10.1002/XRS.656
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Reconstruction of the three-dimensional distribution of elements in fly-ash particles by micro-XRF spectroscopy”. Rindby A, Janssens K, Osán J, X-ray spectrometry 32, 248 (2003). http://doi.org/10.1002/XRS.647
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Characterization of a polycapillary lens for use in micro-XANES experiments”. Proost K, Vincze L, Janssens K, Gao N, Bulska E, Schreiner M, Falkenberg G, X-ray spectrometry 32, 215 (2003). http://doi.org/10.1002/XRS.635
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Literature trends in x-ray emission spectrometry in the period 1990-2000: a review”. Injuk J, Van Grieken R, X-ray spectrometry 32, 35 (2003). http://doi.org/10.1002/XRS.606
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Comparative material characterization of historical and industrial samples by using a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Hoffmann P, Ortner HM, X-ray spectrometry 31, 87 (2002). http://doi.org/10.1002/XRS.563
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Performance of a new compact EDXRF spectrometer for aerosol analysis”. Samek L, Injuk J, van Espen P, Van Grieken R, X-ray spectrometry 31, 84 (2002). http://doi.org/10.1002/XRS.551
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Component selection for a compact micro-XRF spectrometer”. Bichlmeier S, Janssens K, Heckel J, Gibson D, Hoffmann P, Ortner HM, X-ray spectrometry 30, 8 (2001). http://doi.org/10.1002/XRS.457
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Evaluation of energy-dispersive x-ray spectra of low-Z elements from electron-probe microanalysis of individual particles”. Osán J, de Hoog J, van Espen P, Szalóki I, Ro C-U, Van Grieken R, X-ray spectrometry 30, 419 (2001). http://doi.org/10.1002/XRS.523
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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
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Optimization of experimental conditions of thin-window EPMA for ligh-element analysis of individual environmental particles”. Szalóki I, Osán J, Worobiec A, de Hoog J, Van Grieken R, X-ray spectrometry 30, 143 (2001). http://doi.org/10.1002/XRS.473.ABS
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