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Author | Geuens, P.; Lebedev, O.I.; van Dyck, D.; Van Tendeloo, G. | ||||
Title | Accurate measurements of atomic displacements in La0.9Sr0.1MnO3 thin films grown on a SrTiO3 substrate | Type | H3 Book chapter | ||
Year | 2000 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | 1133-1134 | ||
Keywords | H3 Book chapter; Electron microscopy for materials research (EMAT); Vision lab | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | s.l. | Editor | ||
Language | Wos | Publication Date | 0000-00-00 | ||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | Most recent IF: NA | |||
Call Number | UA @ lucian @ c:irua:54730 | Serial | 49 | ||
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