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Author (down) Title Year Publication Volume Times cited Additional Links
van den Broek, W.; Van Aert, S.; van Dyck, D. A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy 2010 Ultramicroscopy 110 16 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Van Aert, S.; Goos, P.; van Dyck, D. Throughput maximization of particle radius measurements by balancing size and current of the electron probe 2011 Ultramicroscopy 111 7 UA library record; WoS full record; WoS citing articles
Van den Broek, W.; Rosenauer, A.; Van Aert, S.; Sijbers, J.; van Dyck, D. A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM 2014 Ultramicroscopy 141 6 UA library record; WoS full record; WoS citing articles
van den Broek, W.; Rosenauer, A.; Goris, B.; Martinez, G.T.; Bals, S.; Van Aert, S.; van Dyck, D. Correction of non-linear thickness effects in HAADF STEM electron tomography 2012 Ultramicroscopy 116 67 UA library record; WoS full record; WoS citing articles
Van den Broek, W.; Reed, B.W.; Béché, A.; Velazco, A.; Verbeeck, J.; Koch, C.T. Various compressed sensing setups evaluated against Shannon sampling under constraint of constant illumination 2019 IEEE transactions on computational imaging 5 7 UA library record; WoS full record; WoS citing articles
Van den Broek, W.; Jannis, D.; Verbeeck, J. Convexity constraints on linear background models for electron energy-loss spectra 2023 Ultramicroscopy 254 UA library record
van den Bos, K.H. W.; De Backer, A.; Martinez, G.T.; Winckelmans, N.; Bals, S.; Nellist, P.D.; Van Aert, S. Unscrambling Mixed Elements using High Angle Annular Dark Field Scanning Transmission Electron Microscopy 2016 Physical review letters 116 46 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Krause, F.F.; Béché, A.; Verbeeck, J.; Rosenauer, A.; Van Aert, S. Locating light and heavy atomic column positions with picometer precision using ISTEM 2016 Ultramicroscopy 172 8 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Janssens, L.; De Backer, A.; Nellist, P.D.; Van Aert, S. The atomic lensing model: new opportunities for atom-by-atom metrology of heterogeneous nanomaterials 2019 Ultramicroscopy 203 4 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W.; Altantzis, T.; De Backer, A.; Van Aert, S.; Bals, S. Recent breakthroughs in scanning transmission electron microscopy of small species 2018 Advances in Physics: X 3 8 UA library record; WoS full record; WoS citing articles
van den Bos, K.H.W. Quantitative atomic resolution transmission electron microscopy for heterogeneous nanomaterials 2017 UA library record
Van de Vyver, S.; Geboers, J.; Dusselier, M.; Schepers, H.; Vosch, T.; Zhang, L.; Van Tendeloo, G.; Jacobs, P.A.; Sels, B.F. Selective bifunctional catalytic conversion of cellulose over reshaped ni particles at the tip of carbon nanofibers 2010 Chemsuschem 3 136 UA library record; WoS full record; WoS citing articles
Van Daele, S.; Hintjens, L.; Hoekx, S.; Bohlen, B.; Neukermans, S.; Daems, N.; Hereijgers, J.; Breugelmans, T. How flue gas impurities affect the electrochemical reduction of CO₂ to CO and formate 2024 Applied catalysis : B : environmental 341 UA library record; WoS full record; WoS citing articles
van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.R.; Germain, M. Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN 2005 Springer proceedings in physics 107 UA library record; WoS full record;
van Daele, B.; Van Tendeloo, G.; Ruythooren, W.; Derluyn, J.; Leys, M.; Germain, M. The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN 2005 Applied physics letters 87 57 UA library record; WoS full record; WoS citing articles
van Daele, B.; Van Tendeloo, G.; Jacobs, K.; Moerman, I.; Leys, M. Formation of metallic In in InGaN/GaN multiquantum wells 2004 Applied physics letters 85 32 UA library record; WoS full record; WoS citing articles
van Daele, B.; Van Tendeloo, G.; Germain, M.; Leys, M.; Bougrioua, Z.; Moerman, I. Relation between microstructure and 2DEG properties of AlGaN/GaN structures 2002 Physica status solidi: B: basic research 234 1 UA library record; WoS full record; WoS citing articles
Van Cauwenbergh, P.; Samaee, V.; Thijs, L.; Nejezchlebova, J.; Sedlak, P.; Ivekovic, A.; Schryvers, D.; Van Hooreweder, B.; Vanmeensel, K. Unravelling the multi-scale structure-property relationship of laser powder bed fusion processed and heat-treated AlSi10Mg 2021 Scientific Reports 11 UA library record; WoS full record; WoS citing articles
Van Boxem, R.; Verbeeck, J.; Partoens, B. Spin effects in electron vortex states 2013 Europhysics letters 102 11 UA library record; WoS full record; WoS citing articles
Van Boxem, R.; Partoens, B.; Verbeeck, J. Inelastic electron-vortex-beam scattering 2015 Physical review : A : atomic, molecular and optical physics 91 31 UA library record; WoS full record; WoS citing articles
Van Boxem, R.; Partoens, B.; Verbeeck, J. Rutherford scattering of electron vortices 2014 Physical review : A : atomic, molecular and optical physics 89 34 UA library record; WoS full record; WoS citing articles
Van Boxem, R. Electron vortex beams : an in-depth theoretical study 2015 UA library record
Van Aert, S.; Verbeeck, J.; Erni, R.; Bals, S.; Luysberg, M.; van Dyck, D.; Van Tendeloo, G. Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy 2009 Ultramicroscopy 109 166 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Verbeeck, J.; Bals, S.; Erni, R.; van Dyck, D.; Van Tendeloo, G. Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy 2009 Microscopy and microanalysis 15 1 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van Dyck, D.; den Dekker, A.J. Resolution of coherent and incoherent imaging systems reconsidered: classical criteria and a statistical alternative 2006 Optics express 14 45 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van Dyck, D. Do smaller probes in a scanning transmission electron microscope result in more precise measurement of the distances between atom columns? 2001 Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties 81 11 UA library record; WoS full record; WoS citing articles
Van Aert, S.; van den Broek, W.; Goos, P.; van Dyck, D. Model-based electron microscopy : from images toward precise numbers for unknown structure parameters 2012 Micron 43 7 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Salje, E.K.H. Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy 2012 Advanced materials 24 150 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Turner, S.; Delville, R.; Schryvers, D.; Van Tendeloo, G.; Ding, X.; Salje, E.K.H. Functional twin boundaries 2013 Phase transitions 86 5 UA library record; WoS full record; WoS citing articles
Van Aert, S.; Geuens, P.; van Dyck, D.; Kisielowski, C.; Jinschek, J.R. Electron channelling based crystallography 2007 Ultramicroscopy 107 32 UA library record; WoS full record; WoS citing articles