Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Amin-Ahmadi, B.; Idrissi, H.; Galceran, M.; Colla, M.S.; Raskin, J.P.; Pardoen, T.; Godet, S.; Schryvers, D. |
Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films |
2013 |
Thin solid films : an international journal on the science and technology of thin and thick films |
539 |
13 |
UA library record; WoS full record; WoS citing articles |
| Amin-Ahmadi, B.; Idrissi, H.; Delmelle, R.; Pardoen, T.; Proost, J.; Schryvers, D. |
High resolution transmission electron microscopy characterization of fcc -> 9R transformation in nanocrystalline palladium films due to hydriding |
2013 |
Applied physics letters |
102 |
14 |
UA library record; WoS full record; WoS citing articles |
| Amin-Ahmadi, B.; Connétable, D.; Fivel, M.; Tanguy, D.; Delmelle, R.; Turner, S.; Malet, L.; Godet, S.; Pardoen, T.; Proost, J.; Schryvers, D.; Idrissi, H. |
Dislocation/hydrogen interaction mechanisms in hydrided nanocrystalline palladium films |
2016 |
Acta materialia |
111 |
14 |
UA library record; WoS full record; WoS citing articles |
