Number of records found: 7465
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Advanced three-dimensional electron microscopy techniques in the quest for better structural and functional materials”. Schryvers D, Cao S, Tirry W, Idrissi H, Van Aert S, Science and technology of advanced materials 14, 014206 (2013). http://doi.org/10.1088/1468-6996/14/1/014206
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Recent EM investigations on nano-and micro-defect structures in SMAs”. Schryvers D, Cao S, Pourbabak, Shi H, Lu, Journal of alloys and compounds 577, S705 (2013). http://doi.org/10.1016/j.jallcom.2011.10.112
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Microstructures and interfaces in Ni-Al martensite: comparing HRTEM observations with continuum theories”. Schryvers D, Boullay P, Potapov PL, Kohn RV, Ball JM, International journal of solids and structures 39, 3543 (2002). http://doi.org/10.1016/S0020-7683(02)00167-1
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Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
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Lattice deformations at martensite-martensite interfaces in Ni-Al”. Schryvers D, Boullay P, Kohn R, Ball J, Journal de physique: 4 11, 23 (2001). http://doi.org/10.1051/jp4:2001804
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Advanced electron microscopy characterisation of important precipitation and ordering phenomena in shape memory systems”. Schryvers D, Shape memory and superelasticity 1, 78 (2015). http://doi.org/10.1007/s40830-015-0006-3
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Electron microscopy studies of martensite microstructures”. Schryvers D, Journal de physique: 4 C5, 109 (1997). http://doi.org/10.1051/jp4:1997517
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Martensitic and bainitic transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 C2, 225 (1994)
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Martensitic and related transformations in Ni-Al alloys”. Schryvers D, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 225 (1995). http://doi.org/10.1051/jp4:1995235
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Microtwin sequences in thermoelastic NixAl100-x martensite studied by conventional and high resolution transmission electron microscopy”. Schryvers D, Philosophical magazine: A: physics of condensed matter: defects and mechanical properties 68, 1017 (1993). http://doi.org/10.1080/01418619308219383
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SAED and HREM results suggest a NiTi B19' based superstructure for CuZr martensite”. Schryvers D, Journal de physique: colloques, suppléments 5, 1047 (1995). http://doi.org/10.1051/jp4/1995581047
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Homogeneous Protein Analysis by Magnetic Core-Shell Nanorod Probes”. Schrittwieser S, Pelaz B, Parak WJ, Lentijo-Mozo S, Soulantica K, Dieckhoff J, Ludwig F, Altantzis T, Bals S, Schotter J, ACS applied materials and interfaces 8, 8893 (2016). http://doi.org/10.1021/acsami.5b11925
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Local conversion of redox inactive molecules into redox active ones : a formaldehyde based strategy for the electrochemical detection of illicit drugs containing primary and secondary amines”. Schram J, Thiruvottriyur Shanmugam S, Sleegers N, Florea A, Samyn N, van Nuijs ALN, De Wael K, Electrochimica Acta 367, 137515 (2021). http://doi.org/10.1016/J.ELECTACTA.2020.137515
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Paraformaldehyde-coated electrochemical sensor for improved on-site detection of amphetamine in street samples”. Schram J, Parrilla M, Slosse A, Van Durme F, Åberg J, Björk K, Bijvoets SM, Sap S, Heerschop MWJ, De Wael K, Microchemical journal 179, 107518 (2022). http://doi.org/10.1016/J.MICROC.2022.107518
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Electrochemical profiling and liquid chromatography–mass spectrometry characterization of synthetic cathinones : from methodology to detection in forensic samples”. Schram J, Parrilla M, Sleegers N, Van Durme F, van den Berg J, van Nuijs ALN, De Wael K, Drug Testing And Analysis 13, 1282 (2021). http://doi.org/10.1002/DTA.3018
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Identifying Electrochemical Fingerprints of Ketamine with Voltammetry and Liquid Chromatography–Mass Spectrometry for Its Detection in Seized Samples”. Schram J, Parrilla M, Sleegers N, Samyn N, Bijvoets SM, Heerschop MWJ, van Nuijs ALN, De Wael K, Analytical Chemistry 92, 13485 (2020). http://doi.org/10.1021/acs.analchem.0c02810
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Ab initio computation of the mean inner Coulomb potential of amorphous carbon structures”. Schowalter M, Titantah JT, Lamoen D, Kruse P, Applied physics letters 86, 112102 (2005). http://doi.org/10.1063/1.1885171
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Calculation of Debye-Waller temperature factors for GaAs”. Schowalter M, Rosenauer A, Titantah JT, Lamoen D, Springer proceedings in physics 120, 195 (2008)
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Computation and parametrization of the temperature dependence of Debye-Waller factors for group IV, III-V and II-VI semiconductors”. Schowalter M, Rosenauer A, Titantah JT, Lamoen D, Acta crystallographica: section A: foundations of crystallography 65, 5 (2009). http://doi.org/10.1107/S0108767308031437
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Temperature-dependent Debye-Waller factors for semiconductors with the wurtzite-type structure”. Schowalter M, Rosenauer A, Titantah JT, Lamoen D, Acta crystallographica: section A: foundations of crystallography 65, 227 (2009). http://doi.org/10.1107/S0108767309004966
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Ab initio computation of the mean inner Coulomb potential of technological important semiconductors”. Schowalter M, Rosenauer A, Lamoen D, Kruse P, Gerthsen D, 1007, 233 (2005)
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Ab initio computation of the mean inner Coulomb potential of wurtzite-type semiconductors and gold”. Schowalter M, Rosenauer A, Lamoen D, Kruse P, Gerthsen D, Applied Physics Letters 88, Artn 232108 (2006). http://doi.org/10.1063/1.2210453
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First-principles calculations of the mean inner Coulomb potential for sphalerite type II.VI semiconductors”. Schowalter M, Lamoen D, Kruse P, Gerthsen D, Rosenauer A, Applied Physics Letters 85, 4938 (2004). http://doi.org/10.1063/1.1823598
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Band structure quantization in nanometer sized ZnO clusters”. Schouteden K, Zeng Y-J, Lauwaet K, Romero CP, Goris B, Bals S, Van Tendeloo G, Lievens P, Van Haesendonck C, Nanoscale 5, 3757 (2013). http://doi.org/10.1039/c3nr33989k
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Moire superlattices at the topological insulator Bi2Te3”. Schouteden K, Li Z, Chen T, Song F, Partoens B, Van Haesendonck C, Park K, Scientific reports 6, 20278 (2016). http://doi.org/10.1038/srep20278
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Annealing-Induced Bi Bilayer on Bi2Te3 Investigated via Quasi-Particle-Interference Mapping”. Schouteden K, Govaerts K, Debehets J, Thupakula U, Chen T, Li Z, Netsou A, Song F, Lamoen D, Van Haesendonck C, Partoens B, Park K, ACS nano 10, 8778 (2016). http://doi.org/10.1021/acsnano.6b04508
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Electronically decoupled stacking fault tetrahedra embedded in Au(111) films”. Schouteden K, Amin-Ahmadi B, Li Z, Muzychenko D, Schryvers D, Van Haesendonck C, Nature communications 7, 14001 (2016). http://doi.org/10.1038/ncomms14001
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Stability of Si epoxide defects in Si nanowires : a mixed reactive force field/DFT study”. Schoeters B, Neyts EC, Khalilov U, Pourtois G, Partoens B, Physical chemistry, chemical physics 15, 15091 (2013). http://doi.org/10.1039/c3cp51621k
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Ab-initio study of the segregation and electronic properties of neutral and charged B and P dopants in Si and Si/SiO2 nanowires”. Schoeters B, Leenaerts O, Pourtois G, Partoens B, Journal of applied physics 118, 104306 (2015). http://doi.org/10.1063/1.4930048
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Graphene ripples as a realization of a two-dimensional Ising model : a scanning tunneling microscope study”. Schoelz JK, Xu P, Meunier V, Kumar P, Neek-Amal M, Thibado PM, Peeters FM, Physical review: B: condensed matter and materials physics 91, 045413 (2015). http://doi.org/10.1103/PhysRevB.91.045413
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