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Determination of spinel content in cycled Li1.2Ni0.13Mn0.54Co0.13O2 using three-dimensional electron diffraction and precession electron diffraction”. Quintelier M, Perkisas T, Poppe R, Batuk M, Hendrickx M, Hadermann J, Symmetry-Basel 13, 1989 (2021). http://doi.org/10.3390/SYM13111989
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Subtissue plasmonic heating monitored with CaF2:Nd3+,Y3+ nanothermometers in the second biological window”. Quintanilla M, Zhang Y, Liz-Marzan LM, Chemistry of materials 30, 2819 (2018). http://doi.org/10.1021/ACS.CHEMMATER.8B00806
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Selective organic functionalization of graphene bulk or graphene edges”. Quintana M, Montellano A, Esau del Rio Castillo A, Van Tendeloo G, Bittencourt C, Prato M, Chemical communications 47, 9330 (2011). http://doi.org/10.1039/c1cc13254g
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Light-induced selective deposition of Au nanoparticles on single-wall carbon nanotubes”. Quintana M, Ke X, Van Tendeloo G, Meneghetti M, Bittencourt C, Prato M, ACS nano 4, 6105 (2010). http://doi.org/10.1021/nn101183y
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Production of large graphene sheets by exfoliation of graphite under high power ultrasound in the presence of tiopronin”. Quintana M, Grzelczak M, Spyrou K, Kooi B, Bals S, Van Tendeloo G, Rudolf P, Prato M, Chemical communications 48, 12159 (2012). http://doi.org/10.1039/c2cc35298b
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A simple road for the transformation of few-layer graphene into MWNTs”. Quintana M, Grzelczak M, Spyrou K, Calvaresi M, Bals S, Kooi B, Van Tendeloo G, Rudolf P, Zerbetto F, Prato M, Journal of the American Chemical Society 134, 13310 (2012). http://doi.org/10.1021/ja303131j
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LaFeO3 nanofibers for high detection of sulfur-containing gases”. Queralto A, Graf D, Frohnhoven R, Fischer T, Vanrompay H, Bals S, Bartasyte A, Mathur S, ACS Sustainable Chemistry and Engineering 7, 6023 (2019). http://doi.org/10.1021/ACSSUSCHEMENG.8B06132
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Edge stabilization in reduced-dimensional perovskites”. Quan LN, Ma D, Zhao Y, Voznyy O, Yuan H, Bladt E, Pan J, de Arquer FPG, Sabatini R, Piontkowski Z, Emwas A-H, Todorovic P, Quintero-Bermudez R, Walters G, Fan JZ, Liu M, Tan H, Saidaminov M I, Gao L, Li Y, Anjum DH, Wei N, Tang J, McCamant DW, Roeffaers MBJ, Bals S, Hofkens J, Bakr OM, Lu Z-H, Sargent EH, Nature Communications 11, 170 (2020). http://doi.org/10.1038/S41467-019-13944-2
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One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work”. Pullini D, Sgroi M, Mahmoud A, Gauquelin N, Maschio L, Lorenzo-Ferrari AM, Groenen R, Damen C, Rijnders G, van den Bos KHW, Van Aert S, Verbeeck J, ACS applied materials and interfaces 9, 20974 (2017). http://doi.org/10.1021/acsami.7b04089
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3D porous nanostructured platinum prepared using atomic layer deposition”. Pulinthanathu Sree S, Dendooven J, Geerts L, Ramachandran RK, Javon E, Ceyssens F, Breynaert E, Kirschhock CEA, Puers R, Altantzis T, Van Tendeloo G, Bals S, Detavernier C, Martens JA, Journal of materials chemistry A : materials for energy and sustainability 5, 19007 (2017). http://doi.org/10.1039/C7TA03257A
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Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayers”. Psilodimitrakopoulos S, Orekhov A, Mouchliadis L, Jannis D, Maragkakis GM, Kourmoulakis G, Gauquelin N, Kioseoglou G, Verbeeck J, Stratakis E, npj 2D Materials and Applications 5, 77 (2021). http://doi.org/10.1038/S41699-021-00258-5
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Synthesis and characterization of new phases: Sr3.75K1.75Bi3O12 and Sr3.1Na2.9Bi3O12”. Pshirkov JS, Kazakov SM, Abakumov AM, Putilin SN, Antipov EV, Bougerol-Chaillout C, Lebedev OI, Van Tendeloo G, Journal of solid state chemistry 152, 492 (2000). http://doi.org/10.1006/jssc.2000.8718
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Microstructure of α-axis oriented YBCO films on SrTiO3 substrates using a new template layer La4BaCu5O13”. Prouteau C, Verbist K, Hamet JF, Mercey B, Hervieu M, Raveau B, Van Tendeloo G, Physica: C : superconductivity 288, 231 (1997)
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On the Origin of Damped Electrochemical Oscillations at Silicon Anodes (Revisited)”. Proost J, Blaffart F, Turner S, Idrissi H, ChemPhysChem : a European journal of chemical physics and physical chemistry 15, 3116 (2014). http://doi.org/10.1002/cphc.201402207
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New anion-conducting solid solutions Bi1-xTex(O,F)2+\delta (x >, 0.5) and glassceramic material on their base”. Prituzhalov VA, Ardashnikova EI, Vinogradov AA, Dolgikh VA, Videau J-J, Fargin E, Abakumov AM, Tarakina NV, Van Tendeloo G, Journal of fluorine chemistry 132, 1110 (2011). http://doi.org/10.1016/j.jfluchem.2011.06.042
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:Ba2.1Bi0.9(O, F)6.8-\delta: a new ordered anion-excess fluorite”. Prituzhalov VA, Abakumov AM, Ardashnikova EI, Dolgikh VA, Van Tendeloo G, Materials research bulletin 42, 861 (2007). http://doi.org/10.1016/j.materresbull.2006.08.023
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Inverse heavy-atom effect in near infrared photoluminescent gold nanoclusters”. Pramanik G, Kvakova K, Thottappali MA, Rais D, Pfleger J, Greben M, El-Zoka A, Bals S, Dracinsky M, Valenta J, Cigler P, Nanoscale 12, 10462 (2021). http://doi.org/10.1039/D1NR90138A
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Inverse heavy-atom effect in near infrared photoluminescent gold nanoclusters”. Pramanik G, Kvakova K, Thottappali MA, Rais D, Pfleger J, Greben M, El-Zoka A, Bals S, Dracinsky M, Valenta J, Cigler P, Nanoscale 13, 10462 (2021). http://doi.org/10.1039/D1NR02440J
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Gold nanoclusters with bright near-infrared photoluminescence”. Pramanik G, Humpolickova J, Valenta J, Kundu P, Bals S, Bour P, Dracinsky M, Cigler P, Nanoscale 10, 3792 (2018). http://doi.org/10.1039/C7NR06050E
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Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy”. Prabhakara V, Nuytten T, Bender H, Vandervorst W, Bals S, Verbeeck J, Optics Express 29, 34531 (2021). http://doi.org/10.1364/OE.434726
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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Prabhakara V (2021) Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy. 149 p
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Ni cluster formation in low temperature annealed Ni50.6Ti49.4”. Pourbabak S, Wang X, Van Dyck D, Verlinden B, Schryvers D, Functional materials letters 10, 1740005 (2017). http://doi.org/10.1142/S1793604717400057
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DSC cycling effects on phase transformation temperatures of micron and submicron grain Ni50.8Ti49.2 microwires”. Pourbabak S, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity , 1 (2020). http://doi.org/10.1007/S40830-020-00278-Y
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Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires”. Pourbabak S, Orekhov A, Schryvers D, Microscopy Research And Technique , 1 (2020). http://doi.org/10.1002/JEMT.23588
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In-Situ TEM Stress Induced Martensitic Transformation in Ni50.8Ti49.2 Microwires”. Pourbabak S, Orekhov A, Samaee V, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity 5, 154 (2019). http://doi.org/10.1007/s40830-019-00217-6
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Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting”. Pourbabak S, Montero-Sistiaga ML, Schryvers D, Van Humbeeck J, Vanmeensel K, Materials characterization 153, 366 (2019). http://doi.org/10.1016/j.matchar.2019.05.024
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Pourbabak S (2020) Influence of nano and microstructural features and defects in finegrained NiTi on the thermal and mechanical reversibility of the martensitic transformation. 166 p
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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