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Author (down) Verlinden, G.; Janssens, G.; Gijbels, R.; van Espen, P.; Geuens, I. doi  openurl
  Title Three-dimensional chemical characterization of complex silver halide microcrystals by scanning ion microprobe mass analysis Type A1 Journal article
  Year 1997 Publication Analytical chemistry Abbreviated Journal Anal Chem  
  Volume 69 Issue Pages 3773-3779  
  Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Washington, D.C. Editor  
  Language Wos A1997XV71200019 Publication Date 2002-07-26  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-2700;1520-6882; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 6.32 Times cited 6 Open Access  
  Notes Approved Most recent IF: 6.32; 1997 IF: 4.743  
  Call Number UA @ lucian @ c:irua:16959 Serial 3647  
Permanent link to this record
 

 
Author (down) Vekemans, B.; Janssens, K.; Vincze, L.; Adams, F.; van Espen, P. doi  openurl
  Title Analysis of X-ray spectra by iterative least squares (AXIL): new developments Type A1 Journal article
  Year 1994 Publication X-ray spectrometry Abbreviated Journal  
  Volume 23 Issue Pages 278-285  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1994QF68500008 Publication Date 2005-05-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:8933 Serial 5471  
Permanent link to this record
 

 
Author (down) Vanmeert, F.; De Meyer, S.; Gestels, A.; Clerici, E.A.; Deleu, N.; Legrand, S.; Van Espen, P.; Van der Snickt, G.; Alfeld, M.; Dik, J.; Monico, L.; De Nolf, W.; Cotte, M.; Gonzalez, V.; Saverwyns, S.; Depuydt-Elbaum, L.; Janssens, K. pdf  doi
isbn  openurl
  Title Non-invasive and non-destructive examination of artists’ pigments, paints and paintings by means of X-ray imaging methods Type H1 Book chapter
  Year 2022 Publication Abbreviated Journal  
  Volume Issue Pages 317-357  
  Keywords H1 Book chapter; Art; Antwerp Cultural Heritage Sciences (ARCHES); Antwerp X-ray Imaging and Spectroscopy (AXIS)  
  Abstract Recent studies in which X-ray beams of (sub)micrometre to millimetre dimensions have been used for non-destructive analysis and characterization of pigments, minute paint samples and/or entire paintings from fifteenth to twentieth century artists are discussed. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging as well as with the combined use with X-ray diffraction (XRD). Microscopic XRF (μ-XRF) is a variant of the XRF method able to visualize the elemental distribution of key elements, mostly metals, on the scale from 1 μm to 100 μm present inside multi-layered micro samples taken from paintings. In the context of the characterization of artists’ pigments subjected to natural degradation, in many cases the use of methods limited to elemental analysis or imaging does not suffice to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS (microscopic X-ray absorption spectroscopy) and μ-XRD have proven themselves to be very suitable for such studies. Since microscopic investigation of a relatively limited number of minute paint samples may not yield representative information about the complete artefact they were taken from, several methods for macroscopic, non-invasive imaging have recently been developed. Combined macroscopic XRF/XRD scanning is able to provide a fairly complete overview of the inorganic pigments employed to create a work of art, to answer questions about ongoing degradation phenomena and about its authenticity. As such these newly developed non-invasive and highly specific imaging methods are of interest for many cultural heritage stakeholders.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date 2022-09-08  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-3-030-86864-2 Additional Links UA library record  
  Impact Factor Times cited Open Access Not_Open_Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ admin @ c:irua:190777 Serial 7183  
Permanent link to this record
 

 
Author (down) Vandevijvere, M.; Van de Voorde, L.; Caen, J.; van Espen, P.; Vekemans, B.; Vincze, L.; Schalm, O. isbn  openurl
  Title Manufacturing techniques and production defects of 16th-17th century majolica tiles from Antwerp (Belgium) Type H2 Book chapter
  Year 2013 Publication Abbreviated Journal  
  Volume Issue Pages 169-176 T2 - Recent advances in glass, stained-gla  
  Keywords H2 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN 978-90-8932-113-8 Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:115032 Serial 8199  
Permanent link to this record
 

 
Author (down) van Vaeck, L.; van Espen, P.; Gijbels, R.; Baykut, G.; Laukien, F.H. doi  openurl
  Title A new electrostatic transfer line for improved transmission in Fourier transform laser microprobe mass spectrometry with external ion source Type A1 Journal article
  Year 2000 Publication European mass spectrometry Abbreviated Journal Eur Mass Spectrom  
  Volume 6 Issue Pages 277-287  
  Keywords A1 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher I.M. Place of Publication Chichester Editor  
  Language Wos 000165327900008 Publication Date 2007-12-04  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1356-1049; ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited 10 Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ lucian @ c:irua:34088 Serial 2312  
Permanent link to this record
 

 
Author (down) Van Grieken, R.; Janssens, K.; van Espen, P.; Injuk, J.; Padilla, R.; Vittiglio, G.; Potgieter, J.H. openurl 
  Title Novel quantitative procedures for in-situ X-ray fluorescence analysis Type H3 Book chapter
  Year 2005 Publication Abbreviated Journal  
  Volume Issue Pages 45-60  
  Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved Most recent IF: NA  
  Call Number UA @ admin @ c:irua:54563 Serial 5751  
Permanent link to this record
 

 
Author (down) van Espen, P.; Van 't dack, L.; Adams, F.; Van Grieken, R. doi  openurl
  Title Effective sample weight from scatter peaks in energy-dispersive x-ray fluorescence Type A1 Journal article
  Year 1979 Publication Analytical chemistry Abbreviated Journal  
  Volume 51 Issue 7 Pages 961-967  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1979GW66100047 Publication Date 2005-03-16  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-2700; 5206-882x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:111404 Serial 7841  
Permanent link to this record
 

 
Author (down) van Espen, P.; Janssens, K.; Nobels, J. pdf  doi
openurl 
  Title AXIL-PC, software for the analysis of complex-x-ray spectra Type A1 Journal article
  Year 1986 Publication Chemometrics and intelligent laboratory systems Abbreviated Journal  
  Volume 1 Issue 1 Pages 109-114  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1986K579000015 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0169-7439 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:149781 Serial 5487  
Permanent link to this record
 

 
Author (down) van Espen, P.; Janssens, K. openurl 
  Title Spectrum evaluation Type H3 Book chapter
  Year 1992 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume chapter 4 Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:2809 Serial 5842  
Permanent link to this record
 

 
Author (down) Van Echelpoel, R.; de Jong, M.; Daems, D.; van Espen, P.; De Wael, K. pdf  url
doi  openurl
  Title Unlocking the full potential of voltammetric data analysis : a novel peak recognition approach for (bio)analytical applications Type A1 Journal article
  Year 2021 Publication Talanta Abbreviated Journal Talanta  
  Volume 233 Issue Pages 122605  
  Keywords A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract Bridging the gap between complex signal data output and clear interpretation by non-expert end-users is a major challenge many scientists face when converting their scientific technology into a real-life application. Currently, pattern recognition algorithms are the most frequently encountered signal data interpretation algorithms to close this gap, not in the least because of their straight-forward implementation via convenient software packages. Paradoxically, just because their implementation is so straight-forward, it becomes cumbersome to integrate the expert's domain-specific knowledge. In this work, a novel signal data interpretation approach is presented that uses this domain-specific knowledge as its fundament, thereby fully exploiting the unique expertise of the scientist. The new approach applies data preprocessing in an innovative way that transcends its usual purpose and is easy to translate into a software application. Multiple case studies illustrate the straight-forward application of the novel approach. Ultimately, the approach is highly suited for integration in various (bio)analytical applications that require interpretation of signal data.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000668000500108 Publication Date 2021-06-11  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0039-9140; 1873-3573 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 4.162 Times cited Open Access OpenAccess  
  Notes Approved Most recent IF: 4.162  
  Call Number UA @ admin @ c:irua:179417 Serial 8712  
Permanent link to this record
 

 
Author (down) van der Snickt, G.; Dubois, H.; Sanyova, J.; Legrand, S.; Coudray, A.; Glaude, C.; Postec, M.; van Espen, P.; Janssens, K. pdf  doi
openurl 
  Title Large-area elemental imaging reveals Van Eyck's original paint layers on the Ghent altarpiece (1432), rescoping its conservation treatment Type A1 Journal article
  Year 2017 Publication Angewandte Chemie: international edition in English Abbreviated Journal Angew Chem Int Edit  
  Volume 56 Issue 17 Pages 4797-4801  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract A combination of large-scale and micro-scale elemental imaging, yielding elemental distribution maps obtained by, respectively non-invasive macroscopic X-ray fluorescence (MA-XRF) and by secondary electron microscopy/energy dispersive X-ray analysis (SEM-EDX) and synchrotron radiation-based micro-XRF (SR m-XRF) imaging was employed to reorient and optimize the conservation strategy of van Eyck's renowned Ghent Altarpiece. By exploiting the penetrative properties of X-rays together with the elemental specificity offered by XRF, it was possible to visualize the original paint layers by van Eyck hidden below the overpainted surface and to simultaneously assess their condition. The distribution of the high-energy Pb-L and Hg-L emission lines revealed the exact location of hidden paint losses, while Fe-K maps demonstrated how and where these lacunae were filled-up using an iron-containing material. The chemical maps nourished the scholarly debate on the overpaint removal with objective, chemical arguments, leading to the decision to remove all skillfully applied overpaints, hitherto interpreted as work by van Eyck. MA-XRF was also employed for monitoring the removal of the overpaint during the treatment phase. To gather complementary information on the in-depth layer build-up, SEM-EDX and SR mu-XRF imaging was used on paint cross sections to record microscale elemental maps.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000398576000019 Publication Date 2017-03-23  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1433-7851; 0570-0833 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 11.994 Times cited 11 Open Access  
  Notes ; This research was supported by the Baillet Latour fund, the Belgian Science Policy Office (Projects MO/39/011) and the Gieskes-Strijbis fund. The authors are also indebted to the BOF-GOA SOLAR Paint project of the University of Antwerp Research Council. The church wardens of the cathedral of St. Bavo and their chairman L. Collin are acknowledged for this agreeable collaboration. We also wish to thank conservators L. Depuydt, B. De Volder, F. Rosier, N. Laquiere and G. Steyaert as well as the members of the international committee. We are indebted to Prof. Em. A. Van Grevenstein-Kruse. ; Approved Most recent IF: 11.994  
  Call Number UA @ admin @ c:irua:142376 Serial 5688  
Permanent link to this record
 

 
Author (down) Van de Voorde, L.; Vandevijvere, M.; Vekemans, B.; Van Pevenage, J.; Caen, J.; Vandenabeele, P.; van Espen, P.; Vincze, L. pdf  doi
openurl 
  Title Study of a unique 16th century Antwerp majolica floor in the Rameyenhof castle's chapel by means of X-ray fluorescence and portable Raman analytical instrumentation Type A1 Journal article
  Year 2014 Publication Spectrochimica acta: part B : atomic spectroscopy Abbreviated Journal  
  Volume 102 Issue Pages 28-35  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Antwerp Cultural Heritage Sciences (ARCHES)  
  Abstract The most unique and only known 16th century Antwerp majolica tile floor in Belgium is situated in a tower of the Rameyenhof castle (Gestel, Belgium). This exceptional work of art has recently been investigated in situ by using X-ray fluorescence (XRF) and Raman spectroscopy in order to study the material characteristics. This study reports on the result of the analyses based on the novel combination of non-destructive and portable instrumentation, including a handheld XRF spectrometer for obtaining elemental information and a mobile Raman spectrometer for retrieving structural and molecular information on the floor tiles in the Rameyenhof castle and on a second, similar medallion, which is stored in the Rubens House museum in Antwerp (Belgium). The investigated material, majolica, is a type of ceramic, which fascinated many people and potters throughout history by its beauty and colourful appearance. In this study the characteristic major/minor and trace element signature of 16th century Antwerp majolica is determined and the pigments used for the colourful paintings present on the floor are identified. Furthermore, based on the elemental fingerprint of the white glaze, and in particular on the presence of zinc in the tiles – an element that was not used for making 16th century majolica – valuable information about the originality of the chapel floor and the two central medallions is acquired. (C) 2014 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000347604100005 Publication Date 2014-10-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0584-8547; 1873-3565 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:123850 Serial 8592  
Permanent link to this record
 

 
Author (down) Trincavelli, J.; Montoro, S.; Van Grieken, R.; van Espen, P. openurl 
  Title Prediction of Mα/Lα intensity ratios and the use in the spectra evaluation Type P3 Proceeding
  Year 1992 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:2863 Serial 8405  
Permanent link to this record
 

 
Author (down) Trincavelli, J.; Montoro, S.; van Espen, P.; Van Grieken, R. doi  openurl
  Title M\alpha/L\alpha intensity ratios for Ta, W, Pt, Au, Pb and Bi for electron energies in the 11-40 keV range Type A1 Journal article
  Year 1993 Publication X-ray spectrometry Abbreviated Journal  
  Volume 22 Issue Pages 372-376  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract Both energy- and wavelength-dispersive systems were used to obtain Malpha/Lalpha intensity ratios for Ta, W, Pt, Au, Pb and Bi at various overvoltages. A table of these ratios corrected for matrix absorption and detector efficiency is presented, in addition to an interpolatory function of Malpha/Lalpha generated ratios vs. overvoltage, for each element. In addition, three different ZAF correction models were used to predict both detected and generated ratios. Finally, experimental Mbeta/Malpha ratios measured at different overvoltages are presented for the six elements considered.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1993MB01200008 Publication Date 2005-05-28  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:6221 Serial 8649  
Permanent link to this record
 

 
Author (down) Treiger, B.; van Malderen, H.; Bondarenko, I.; van Espen, P.; Van Grieken, R. doi  openurl
  Title Studying aerosol samples by non-linear mapping of electron probe microanalysis data Type A1 Journal article
  Year 1993 Publication Analytica chimica acta Abbreviated Journal  
  Volume 284 Issue Pages 119-124  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1993MR27600014 Publication Date 2002-07-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-2670; 1873-4324 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:6224 Serial 8610  
Permanent link to this record
 

 
Author (down) Treiger, B.; Injuk, J.; Bondarenko, I.; van Espen, P.; Van Grieken, R.; Breitenbach, L.; Wätjen, U. doi  openurl
  Title Non-linear mapping of microbeam proton-induced X-ray emission data for source identification of North Sea aerosols Type A1 Journal article
  Year 1994 Publication Spectrochimica acta: part B : atomic spectroscopy Abbreviated Journal  
  Volume 49 Issue 4 Pages 345-353  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1994NM41200004 Publication Date 2003-04-25  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0584-8547; 1873-3565 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:9500 Serial 8314  
Permanent link to this record
 

 
Author (down) Treiger, B.; Bondarenko, I.; van Espen, P.; Van Grieken, R.; Adams, F. doi  openurl
  Title Classification of mineral particles by nonlinear mapping of electron microprobe energy-dispersive X-ray spectra Type A1 Journal article
  Year 1994 Publication The analyst Abbreviated Journal  
  Volume 119 Issue Pages 971-974  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1994NR76500037 Publication Date 2004-03-24  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:8918 Serial 7669  
Permanent link to this record
 

 
Author (down) Smekens, A.; Vervoort, M.; Pauwels, J.; Berghmans, P.; van Espen, P.; Van Grieken, R. openurl 
  Title Morphology and fractal dimension of soot and carbon black aggregates determined by image analysis Type P3 Proceeding
  Year 1998 Publication Abbreviated Journal  
  Volume Issue Pages  
  Keywords P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Additional Links UA library record  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:22779 Serial 8283  
Permanent link to this record
 

 
Author (down) Smekens, A.; Godoi, R.H.M.; Vervoort, M.; van Espen, P.; Potgieter-Vermaak, S.S.; Van Grieken, R. doi  openurl
  Title Characterization of individual soot aggregates from different sources using image analysis Type A1 Journal article
  Year 2007 Publication Journal of atmospheric chemistry Abbreviated Journal  
  Volume 56 Issue 3 Pages 211-223  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000245105900001 Publication Date 2007-01-02  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0167-7764 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:63840 Serial 7628  
Permanent link to this record
 

 
Author (down) Serneels, S.; Faber, K.; Verdonck, T.; van Espen, P.J. pdf  doi
openurl 
  Title Case specific prediction intervals for tri-PLS1 : the full local linearisation Type A1 Journal article
  Year 2011 Publication Chemometrics and intelligent laboratory systems Abbreviated Journal  
  Volume 108 Issue 2 Pages 93-99  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract A new method to estimate case specific prediction uncertainty for univariate trilinear partial least squares (tri-PLS1) regression is introduced. This method is, from a theoretical point of view, the most exact finite sample approximation to true prediction uncertainty that has been reported up till now. Using the new method, different error sources can be propagated, which is an advantage that cannot be offered by data driven approaches such as the bootstrap. In a concise example, it is illustrated how the method can be applied. In the Appendix, efficient algorithms are presented to compute the estimates required.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000295310000002 Publication Date 2011-05-12  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0169-7439; 1873-3239 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:92788 Serial 7580  
Permanent link to this record
 

 
Author (down) Schalm, O.; Cabal, A.; van Espen, P.; Laquière, N.; Storme, P. pdf  doi
openurl 
  Title Improved radiographic methods for the investigation of paintings using laboratory and synchrotron X-ray sources Type A1 Journal article
  Year 2011 Publication Journal of analytical atomic spectrometry Abbreviated Journal  
  Volume 26 Issue 5 Pages 1068-1077  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract It is generally known that radiographic inspection of 1517th century paintings can easily be done with a polychromatic X-ray source using a voltage between 20 kV and 40 kV in combination with classic X-ray films. Unfortunately, the spatial structure of numerous 19th and early 20th century paintings cannot be visualized with conventional radiography due to several reasons such as the use of lead white grounds or low absorbing pigments. Radiographic images are blurred or worse, they do not contain the picture of the painting. During the last decades, many technological innovations have been introduced in the field of radiography but their possibilities in cultural heritage have not been explored in full detail. In our investigation we used phosphor imaging plates, energy dispersive detectors and CCD-cameras in combination with synchrotron radiation and conventional X-ray tubes in order to improve the quality of radiographic images. Several promising techniques that could improve the quality of radiographs of paintings were identified.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000289731900023 Publication Date 2011-04-11  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0267-9477 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:89928 Serial 8070  
Permanent link to this record
 

 
Author (down) Samek, L.; Injuk, J.; van Espen, P.; Van Grieken, R. doi  openurl
  Title Performance of a new compact EDXRF spectrometer for aerosol analysis Type A1 Journal article
  Year 2002 Publication X-ray spectrometry Abbreviated Journal  
  Volume 31 Issue Pages 84-86  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000173653400015 Publication Date 2002-10-06  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:36383 Serial 8371  
Permanent link to this record
 

 
Author (down) Rojas, C.M.; Figueroa, L.; Janssens, K.H.; Van Espen, P.E.; Adams, F.C.; Van Grieken, R.E. pdf  doi
openurl 
  Title The elemental composition of airborne particulate matter in the Atacama desert, Chile Type A1 Journal article
  Year 1990 Publication The science of the total environment Abbreviated Journal  
  Volume 91 Issue Pages 251-267  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract Air particulate samples were collected at Chapiquiña near Arica (Chile) with a six-stage cascade impactor for about 17-day periods during a 31 month interval. Sixteen elements were determined by energy dispersive X-ray fluorescence analysis, and the elemental concentrations were subjected to principal factor analysis. The variability with time of the coarse particles was described by two factors both related to soil dispersion, whereas the fine particle variations could be explained by a third factor related to marine influence. Enrichment factors were compared with those obtained in other remote continental areas, in particular those of air particulate matter sampled at Chacaltaya, Bolivia. Results point to a negligible anthropogenic influence.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos A1990CM36100019 Publication Date 2003-09-12  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0048-9697 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:116652 Serial 5602  
Permanent link to this record
 

 
Author (down) Roet, D.; van Espen, P. doi  openurl
  Title Monte Carlo simulation of X-ray spectra from low energy electrons using optical data Type A1 Journal article
  Year 2010 Publication Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms Abbreviated Journal  
  Volume 268 Issue 17/18 Pages 2794-2800  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract An approach using optical data to simulate both the bremsstrahlung continuum and characteristic K and L X-ray lines generated by low energy electrons (cfr. electron microscopy) in solids is discussed in this paper. The necessary analytical expressions together with the data to calculate the relevant cross sections for elastic and inelastic interactions at these energies along with variance reduction techniques are given. The results of the Monte Carlo simulation are compared to experimental data measured with a JEOL 6300 electron microscope.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000281498900039 Publication Date 2010-07-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:84261 Serial 8281  
Permanent link to this record
 

 
Author (down) Piñera, I.; Cruz, C.M.; van Espen, P.; Abreu, Y.; Leyva, A. pdf  doi
openurl 
  Title Study of dpa distributions in electron irradiated YBCO slabs through MCCM algorithm Type A1 Journal article
  Year 2012 Publication Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms Abbreviated Journal  
  Volume 274 Issue Pages 191-194  
  Keywords A1 Journal article; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract The Monte Carlo assisted Classical Method (MCCM) consists on a calculation procedure for determining the displacements per atom (dpa) distribution in solid materials. This algorithm allows studying the gamma and electron irradiation damage in different materials. It is based on the electrons elastic scattering classic theories and the use of Monte Carlo simulation for the physical processes involved. The present study deals with the Monte Carlo simulation of electron irradiation effects on YBa2Cu3O7-x (YBCO) slabs using the MCNPX code system. Displacements per atom distributions are obtained through the MCCM for electron irradiation up to 10 MeV. In-depth dpa profiles for electrons and positrons are obtained and analysed. Also, dpa contributions from each atomic specie in the material are calculated. It was found that the dpa distribution is more homogeneous in the material volume when increasing energy of incident electrons. Also, the dpa produced by positrons has no relevance when irradiating with electrons, in contrast with previous similar gamma irradiation studies. All the results are presented and discussed in this contribution. (C) 2011 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000301611900031 Publication Date 2011-12-05  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:97819 Serial 8595  
Permanent link to this record
 

 
Author (down) Pinera, I.; Cruz, C.M.; Leyva, A.; Abreu, Y.; Cabal, A.E.; van Espen, P.; Van Remortel, N. doi  openurl
  Title Improved calculation of displacements per atom cross section in solids by gamma and electron irradiation Type A1 Journal article
  Year 2014 Publication Interactions With Materials And Atoms Abbreviated Journal  
  Volume 339 Issue Pages 1-7  
  Keywords A1 Journal article; Engineering sciences. Technology; Particle Physics Group; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract Several authors had estimated the displacements per atom cross sections under different approximations and models, including most of the main gamma- and electron-material interaction processes. These previous works used numerical approximation formulas which are applicable for limited energy ranges. We proposed the Monte Carlo assisted Classical Method (MCCM), which relates the established theories about atom displacements to the electron and positron secondary fluence distributions calculated from the Monte Carlo simulation. In this study the MCCM procedure is adapted in order to estimate the displacements per atom cross sections for gamma and electron irradiation. The results obtained through this procedure are compared with previous theoretical calculations. An improvement in about 10-90% for the gamma irradiation induced dpa cross section is observed in our results on regard to the previous evaluations for the studied incident energies. On the other hand, the dpa cross section values produced by irradiation with electrons are improved by our calculations in about 5-50% when compared with the theoretical approximations. When thin samples are irradiated with electrons, more precise results are obtained through the MCCM (in about 20-70%) with respect to the previous studies. (C) 2014 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000343785500001 Publication Date 2014-09-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:121161 Serial 8069  
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Author (down) Pinera, I.; Cruz, C.M.; Abreu, Y.; Leyva, A.; van Espen, P.; Diaz, A.; Cabal, A.E.; Van Remortel, N. pdf  doi
openurl 
  Title Gamma induced atom displacements in LYSO and LuYAP crystals as used in medical imaging applications Type A1 Journal article
  Year 2015 Publication Interactions With Materials And Atoms Abbreviated Journal  
  Volume 356 Issue Pages 46-52  
  Keywords A1 Journal article; Engineering sciences. Technology; Particle Physics Group; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract The radiation damage, in terms of atom displacements, induced by gamma irradiation in LYSO and LuYAP crystals is presented. Sc-44, Na-22 and V-48 are used as gamma sources for this study. The energy of gammas from the electron positron annihilation processes (511 keV) is also included in the study. The atom displacements distributions inside each material are calculated following the Monte Carlo assisted Classical Method introduced by the authors. This procedure also allows to study the atom displacements in-depth distributions inside each crystal. The atom displacements damage in LYSO crystals is found to be higher than in LuYAP crystals, mainly provoked by the displacements of silicon and oxygen atoms. But the difference between atom displacements produced in LYSO and LuYAP decreases when more energetic sources are used. On the other hand, the correlation between the atom displacements and energy deposition in-depth distributions is excellent. The atom displacements to energy deposition ratio is found to increases with more energetic photon sources. LYSO crystals are then more liable to the atom displacements damage than LuYAP crystals. (C) 2015 Elsevier B.V. All rights reserved.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000356990400008 Publication Date 2015-05-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0168-583x ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:127012 Serial 7987  
Permanent link to this record
 

 
Author (down) Piñera, I.; Abreu, Y.; van Espen, P.; Diaz, A.; Leyva, A.; Cruz, C.M. openurl 
  Title Radiation damage evaluation on LYSO and LuYAP materials through Dpa calculation assisted by Monte Carlo method Type P1 Proceeding
  Year 2011 Publication IEEE conference record T2 – IEEE Nuclear Science Symposium/Medical Imaging Conference (NSS/MIC)/18th, International Workshop on Room-Temperature Semiconductor X-Ray and, Gamma-Ray Detectors, OCT 23-29, 2011, Valencia, SPAIN Abbreviated Journal  
  Volume Issue Pages 1609-1611  
  Keywords P1 Proceeding; Engineering sciences. Technology; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation)  
  Abstract The aim of the present work is to study the radiation damage induced in LYSO and LuYAP crystals by the gamma radiation and the secondary electrons/positrons generated. The displacements per atom (dpa) distributions inside each material were calculated following the Monte Carlo assisted Classical Method (MCCM) introduced by the authors. As gamma sources were used Sc-44, Na-22 and V-48. Also the energy of gammas from the annihilation processes (511 keV) was included in the study. This procedure allowed studying the in-depth dpa distributions inside each crystal for all four sources. It was also possible to obtain the separate contribution from each atom to the total dpa. The LYSO crystals were found to receive more damage, mainly provoked by the displacements of silicon and oxygen atoms.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000304755601169 Publication Date  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 978-1-4673-0120-6 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor Times cited Open Access  
  Notes Approved no  
  Call Number UA @ admin @ c:irua:113072 Serial 8447  
Permanent link to this record
 

 
Author (down) Padilla, R.; van Espen, P.; Abrahantes, A.; Janssens, K. doi  openurl
  Title Semiempirical approach for standardless calibration in µ-XRF spectrometry using capillary lenses Type A1 Journal article
  Year 2005 Publication X-ray spectrometry Abbreviated Journal X-Ray Spectrom  
  Volume 34 Issue 1 Pages 19-27  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000226260800004 Publication Date 2004-09-14  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0049-8246 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 1.298 Times cited 23 Open Access  
  Notes Approved Most recent IF: 1.298; 2005 IF: 1.372  
  Call Number UA @ admin @ c:irua:52230 Serial 5828  
Permanent link to this record
 

 
Author (down) Padilla, R.; Schalm, O.; Janssens, K.; Arrazcaeta, R.; van Espen, P. doi  openurl
  Title Microanalytical characterization of surface decoration in Majolica pottery Type A1 Journal article
  Year 2005 Publication Analytica chimica acta Abbreviated Journal Anal Chim Acta  
  Volume 535 Issue 1-2 Pages 201-211  
  Keywords A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3)  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Wos 000228194200025 Publication Date 2005-01-15  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0003-2670 ISBN Additional Links UA library record; WoS full record; WoS citing articles  
  Impact Factor 4.95 Times cited 20 Open Access  
  Notes Approved Most recent IF: 4.95; 2005 IF: 2.760  
  Call Number UA @ admin @ c:irua:52143 Serial 5722  
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