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Author
Title
Year
Publication
Volume
Times cited
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Vatanparast, M.
;
Egoavil, R.
;
Reenaas, T.W.
;
Verbeeck, J.
;
Holmestad, R.
;
Vullum, P.E.
Bandgap measurement of high refractive index materials by off-axis EELS
2017
Ultramicroscopy
182
3
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