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The benefits of statistical parameter estimation theory for quantitative interpretation of electron microscopy data”. Van Aert S, Bals S, Chang LY, den Dekker AJ, Kirkland AI, Van Dyck D, Van Tendeloo G Springer, Berlin, page 97 (2008).
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Three-dimensional atomic imaging of crystalline nanoparticles”. Van Aert S, Batenburg KJ, Rossell MD, Erni R, Van Tendeloo G, Nature 470, 374 (2011). http://doi.org/10.1038/nature09741
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Effect of amorphous layers on the interpretation of restored exit waves”. Van Aert S, Chang LY, Bals S, Kirkland AI, Van Tendeloo G, Ultramicroscopy 109, 237 (2009). http://doi.org/10.1016/j.ultramic.2008.10.024
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Advanced electron crystallography through model-based imaging”. Van Aert S, De Backer A, Martinez GT, den Dekker AJ, Van Dyck D, Bals S, Van Tendeloo G, IUCrJ 3, 71 (2016). http://doi.org/10.1107/S2052252515019727
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Procedure to count atoms with trustworthy single-atom sensitivity”. Van Aert S, de Backer A, Martinez GT, Goris B, Bals S, Van Tendeloo G, Rosenauer A, Physical review : B : condensed matter and materials physics 87, 064107 (2013). http://doi.org/10.1103/PhysRevB.87.064107
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Functional twin boundaries”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Ding X, Salje EKH, Phase transitions 86, 1052 (2013). http://doi.org/10.1080/01411594.2012.748909
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Direct observation of ferrielectricity at ferroelastic domain boundaries in CaTiO3 by electron microscopy”. Van Aert S, Turner S, Delville R, Schryvers D, Van Tendeloo G, Salje EKH, Advanced materials 24, 523 (2012). http://doi.org/10.1002/adma.201103717
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Atomic resolution mapping using quantitative high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Bals S, Erni R, van Dyck D, Van Tendeloo G, Microscopy and microanalysis 15, 464 (2009). http://doi.org/10.1017/S1431927609093957
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Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy”. Van Aert S, Verbeeck J, Erni R, Bals S, Luysberg M, van Dyck D, Van Tendeloo G, Ultramicroscopy 109, 1236 (2009). http://doi.org/10.1016/j.ultramic.2009.05.010
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Relation between microstructure and 2DEG properties of AlGaN/GaN structures”. van Daele B, Van Tendeloo G, Germain M, Leys M, Bougrioua Z, Moerman I, Physica status solidi: B: basic research 234, 830 (2002). http://doi.org/10.1002/1521-3951(200212)234:3<830::AID-PSSB830>3.0.CO;2-O
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Formation of metallic In in InGaN/GaN multiquantum wells”. van Daele B, Van Tendeloo G, Jacobs K, Moerman I, Leys M, Applied physics letters 85, 4379 (2004). http://doi.org/10.1063/1.1815054
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The role of Al on Ohmic contact formation on n-type GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys M, Germain M, Applied physics letters 87, 061905 (2005). http://doi.org/10.1063/1.2008361
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Selective bifunctional catalytic conversion of cellulose over reshaped ni particles at the tip of carbon nanofibers”. Van de Vyver S, Geboers J, Dusselier M, Schepers H, Vosch T, Zhang L, Van Tendeloo G, Jacobs PA, Sels BF, Chemsuschem 3, 698 (2010). http://doi.org/10.1002/cssc.201000087
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Ultralow blocking temperature and breakdown of the giant spin model in Er3+-doped nanoparticles”. van den Heuvel W, Tikhomirov VK, Kirilenko D, Schildermans N, Chibotaru LF, Vanacken J, Gredin P, Mortier M, Van Tendeloo G, Moshchalkov VV, Physical review : B : condensed matter and materials physics 82, 094421 (2010). http://doi.org/10.1103/PhysRevB.82.094421
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Diatom silica-titania photocatalysts for air purification by bio-accumulation of different titanium sources”. Van Eynde E, Hu Z-Y, Tytgat T, Verbruggen SW, Watte J, Van Tendeloo G, Van Driessche I, Blust R, Lenaerts S, Environmental science : nano 3, 1052 (2016). http://doi.org/10.1039/C6EN00163G
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Morphological TEM studies and magnetoresistance analysis of sputtered Al-substituted ZnO films : the role of oxygen”. Van Gompel M, Atalay AY, Gaulke A, Van Bael MK, D'Haen J, Turner S, Van Tendeloo G, Vanacken J, Moshchalkov VV, Wagner P, Physica status solidi : A : applications and materials science 212, 1191 (2015). http://doi.org/10.1002/pssa.201431888
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Solidelectrolyte interphase evolution of carbon-coated silicon nanoparticles for lithium-ion batteries monitored by transmission electron microscopy and impedance spectroscopy”. Van Havenbergh K, Turner S, Driesen K, Bridel J-S, Van Tendeloo G, Energy technology 3, 699 (2015). http://doi.org/10.1002/ente.201500034
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The mechanical behavior during (de)lithiation of coated silicon nanoparticles as anode material for lithium-ion batteries studied by InSitu transmission electron microscopy”. Van Havenbergh K, Turner S, Marx N, Van Tendeloo G, Energy technology 4, 1005 (2016). http://doi.org/10.1002/ENTE.201600057
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The modulated structure in the melilite CA2ZnGe2O7”. van Heurck C, Van Tendeloo G, Amelinckx S, Physics and chemistry of minerals 8, 441 (1992). http://doi.org/10.1007/BF00200967
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Methods of structural analysis of modulated structures and quasicrystals”. van Landuyt J, Kuypers S, van Heurck C, Van Tendeloo G, Amelinckx S s.l., page 205 (1993).
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Charcaterization by high-resolution transmission electron microscopy”. van Landuyt J, Van Tendeloo G Stt, Den Haag, page 187 (1998).
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HREM for characterisation of nanoscale microstructures”. van Landuyt J, Van Tendeloo G, , 15 (1998)
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Crystallography of fullerites and related graphene textures”. van Landuyt J, Van Tendeloo G, Amelinckx S, Zhang XF, Zhang XB, Luyten W, Materials science forum 150/151, 53 (1994)
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Formation of a combined micro- and mesoporous material using zeolite Beta nanoparticles”. van Oers CJ, Stevens WJJ, Bruijn E, Mertens M, Lebedev OI, Van Tendeloo G, Meynen V, Cool P, Microporous and mesoporous materials: zeolites, clays, carbons and related materials 120, 29 (2009). http://doi.org/10.1016/j.micromeso.2008.08.056
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Fullerenen: een nieuwe vorm van koolstof”. Van Tendeloo G, Echo 3: essays voor chemie-onderwijs , 79 (1995)
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High resolution electron microscopy in materials research”. Van Tendeloo G, Journal of materials chemistry 8, 797 (1998). http://doi.org/10.1039/a708240a
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High resolution electron microscopy of recent high Tc superconductors”. Van Tendeloo G, European Crystallographic Meeting 15, 20 (1994)
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TEM characterization of structural defects”. Van Tendeloo G Plenum Press, New York, page 473 (1996).
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TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
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