Number of records found: 8872
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Citations
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Quantification by aberration corrected (S)TEM of boundaries formed by symmetry breaking phase transformations”. Schryvers D, Salje EKH, Nishida M, De Backer A, Idrissi H, Van Aert S, Ultramicroscopy 176, 194 (2017). http://doi.org/10.1016/j.ultramic.2016.12.022
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Decomposition phenomena in Ni-Mn-Ti austenite”. Schryvers D, Seo JW, Richard O, Vermeulen W, Potapov P s.l., page 887 (1999).
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Nano- and microcrystal investigations of precipitates, interfaces and strain fields in Ni-Ti-Nb by various TEM techniques”. Schryvers D, Shi H, Martinez GT, Van Aert S, Frenzel J, Van Humbeeck J, Materials science forum T2 –, 9th European Symposium on Martensitic Transformations (ESOMAT 2012), SEP 09-16, 2012, St Petersburg, RUSSIA 738/739, 65 (2013). http://doi.org/10.4028/www.scientific.net/MSF.738-739.65
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Electron microscopy of stress-induced martensite and pretransition microstructures in Ni62.5Al37.5”. Schryvers D, Tanner LE, Shape memory materials and phenomena: fundamental aspects and applications 246, 33 (1992)
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On the phase-like nature of the 7m structure in ni-al”. Schryvers D, Tanner LE, , 849 (1994)
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On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, MRS Japan: shape memory materials 18, 849 (1993)
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On the phase-like nature of the 7M structure in Ni-Al”. Schryvers D, Tanner LE, Ecomaterials , 849 (1994). http://doi.org/10.1016/B978-1-4832-8381-4.50198-0
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Advanced TEM and SEM methods applied to 3D nano- and microstructural investigations of Ni4Ti3 precipitates in Ni-Ti (SMA)”. Schryvers D, Tirry W, Cao S, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 229 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.229
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Advanced TEM investigations on Ni-Ti shape memory material: strain and concentration gradients surrounding Ni4Ti3 precipitates”. Schryvers D, Tirry W, Yang Z, , 329 (2005)
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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Nucleation and growth of the Ni5Al3 phase in Ni-Al austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner L, Journal de physique: 4 T2 –, IIIrd European Symposium on Martensitic Transformations (ESOMAT 94), SEP 14-16, 1994, BARCELONA, SPAIN 5, 299 (1995). http://doi.org/10.1051/jp4:1995246
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Nucleation and growth of the Ni5Al3 in NiAl austenite and martensite”. Schryvers D, Toth L, Ma Y, Tanner LE, Journal de physique: 4 C2, 299 (1994)
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Ni2Al versus Ni5Al3 ordering in Ni65Al35 austenite and martensite”. Schryvers D, Toth L, van Humbeeck J, Beyer J, Journal de physique: colloques, suppléments 5, 1029 (1995). http://doi.org/10.1051/jp4/1995581029
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High-resolution visualization techniques : structural aspects”. Schryvers D, Van Aert S Springer, Berlin, page 135 (2012).
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Dedicated TEM on domain boundaries from phase transformations and crystal growth”. Schryvers D, Van Aert S, Delville R, Idrissi H, Turner S, Salje EKH, Phase transitions 86, 15 (2013). http://doi.org/10.1080/01411594.2012.694435
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Electron microscopy study of twin sequences and branching in NissAl34 3R martensite”. Schryvers D, Van Landuyt J, ICOMAT (1992)
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Electron microscopy study of twin sequences and branching in Ni66Al34 3r martensite”. Schryvers D, van Landuyt JT, Proceedings Of The International Conference On Martensitic Transformations (icomat-92) , 263 (1993)
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Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
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Some examples of electron microscopy studies of microstructures and phase transitions in solids”. Schryvers D, Van Tendeloo G, van Landuyt J, Amelinckx S, Meccanica 30, 433 (1995). http://doi.org/10.1007/BF01557075
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HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys (Invited)”. Schryvers D, Van Tendeloo G, van Landuyt J, Le Tanner, , 659 (1994)
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HREM imaging analysis in the study of pretransition and nucleation phenomena in alloys”. Schryvers D, Van Tendeloo G, van Landuyt J, Tanner LE, Icem 13, 659 (1994)
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HRTEM study of austenite and martensite in splat-cooled and nanoscale thin film Ni-Al”. Schryvers D, Yandouzi M, Holland-Moritz D, Toth L, Journal de physique: 4 C5, 203 (1997). http://doi.org/10.1051/jp4:1997532
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TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film”. Schryvers D, Yandouzi M, Toth L, Thin solid films : an international journal on the science and technology of thin and thick films 326, 126 (1998). http://doi.org/10.1016/S0040-6090(98)00545-8
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Relation between structure, charge ordering and magnetotransport properties in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of magnetism and magnetic materials T2 –, Symposium G Material Physics Issues and Applications of Magnetic Oxides, at the E-MRS Spring Meeting, JUN 01-04, 1999, Strasbourg, France 211, 105 (2000). http://doi.org/10.1016/S0304-8853(99)00720-9
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Structural determination of the charge ordering process in Nd0.5Ca0.5Mn1-xCrxO3 manganites”. Schuddinck W, Van Tendeloo G, Barnabé, A, Hervieu M, Raveau B, Journal of solid state chemistry 148, 333 (1999). http://doi.org/10.1006/jssc.1999.8457
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Structure of the hexagonal 16l perovskites Ba4Ca0.9Mn3.1O11.3 and Ba4Ca0.5Mn3Cu0.5O12-\delta by high-resolution electron microscopy”. Schuddinck W, Van Tendeloo G, Hervieu M, Floros N, Raveau B, Materials research bulletin 36, 2689 (2001). http://doi.org/10.1016/S0025-5408(01)00744-9
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B, Journal of alloys and compounds 333, 13 (2002). http://doi.org/10.1016/S0925-8388(01)01691-7
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Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
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Thermoelectrics of interacting nanosystems-exploiting superselection instead of time-reversal symmetry”. Schulenborg J, Di Marco A, Vanherck J, Wegewijs MR, Splettstoesser J, Entropy: an international and interdisciplinary journal of entropy and information studies 19, 668 (2017). http://doi.org/10.3390/E19120668
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Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects”. Schulze A, Hantschel T, Dathe A, Eyben P, Ke X, Vandervorst W, Nanotechnology 23, 305707 (2012). http://doi.org/10.1088/0957-4484/23/30/305707
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