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Introducing John Campbell, the new regional editor for North America of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 43, 67 (2014). http://doi.org/10.1002/XRS.2534
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New Chinese members of the Advisory Board of X-Ray Spectrometry”. Van Grieken R, X-ray spectrometry 35, 205 (2006)
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New members of the editorial board of X-ray Spectrometry”. Van Grieken R, X-ray spectrometry 42, 1 (2013). http://doi.org/10.1002/XRS.2431
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Current trends in the literature on X-ray emission spectrometry”. Van Grieken R, Markowicz A, Veny P, X-ray spectrometry 20, 271 (1991). http://doi.org/10.1002/XRS.1300200605
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Folding of aerosol loaded filters during X-ray fluorescence analysis”. Van Grieken RE, Adams FC, X-ray spectrometry 5, 61 (1976). http://doi.org/10.1002/XRS.1300050204
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Individual particle characterization of Siberian aerosols by micro-PIXE and backscattering spectrometry”. van Malderen H, Hoornaert S, Injuk J, Przybylowicz WJ, Pineda CA, Prozesky VM, Van Grieken R, X-ray spectrometry 30, 320 (2001). http://doi.org/10.1002/XRS.505
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Semi-quantitative analysis of the formation of a calcium oxalate protective layer for monumental limestone using combined micro-XRF and micro-XRPD”. Vanmeert F, Mudronja D, Fazinic S, Janssens K, Tibljas D, X-ray spectrometry 42, 256 (2013). http://doi.org/10.1002/XRS.2486
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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Automated segmentation of μ-XRF image sets”. Vekemans B, Janssens K, Vincze L, Aerts A, Adams F, Hertogen J, X-ray spectrometry 26, 333 (1997)
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Ruthenium staining as an alternative preparation method for automated EPMA of individual biogenic and organic particles”. Worobiec A, Kaplinski A, Van Grieken R, X-ray spectrometry 34, 245 (2005). http://doi.org/10.1002/XRS.807
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Comprehensive microanalytical study of welding aerosols with x-ray and Raman based methods”. Worobiec A, Stefaniak EA, Kiro S, Oprya M, Bekshaev A, Spolnik Z, Potgieter-Vermaak SS, Ennan A, Van Grieken R, X-ray spectrometry 36, 328 (2007). http://doi.org/10.1002/XRS.979
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