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Die risikoprofiel van Pb en Cr in stedelike padstof”. Potgieter-Vermaak S, Van Grieken R, Potgieter H, Litnet akademies : 'n joernaal vir die geesteswetenskappe 9, 1 (2012)
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Integrated analytical techniques for analysing individual environmental particles”. Potgieter-Vermaak S, Van Grieken R, Potgieter JH page 123 (2012).
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Integrated analytical techniques for the characterisation of environmental particles”. Potgieter-Vermaak S, Van Grieken R, Potgieter JH, Spectroscopy Europe 22, 12 (2010)
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Micro-Raman spectroscopy for the analysis of environmental particles”. Potgieter-Vermaak S, Worobiec A, Darchuk L, Van Grieken R page 193 (2011).
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Micro-structural characterization of black crust and laser cleaning of building stones by micro-Raman and SEM techniques”. Potgieter-Vermaak SS, Godoi RHM, Van Grieken R, Potgieter JH, Oujja M, Castillejo M, Spectrochimica acta: part A: molecular and biomolecular spectroscopy 61, 2460 (2005). http://doi.org/10.1016/J.SAA.2004.09.010
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Degradation of galvanised iron roofing material in Tanzania by atmospheric corrosion”. Potgieter-Vermaak SS, Mmari A, Van Grieken R, McCrindle RI, Potgieter JH, Corrosion engineering science and technology 46, 642 (2011). http://doi.org/10.1179/147842210X12695149033972
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The application of Raman spectrometry to the investigation of cement: part 2: a micro-Raman study of OPC, slag and fly ash”. Potgieter-Vermaak SS, Potgieter JH, Belleil M, DeWeerdt F, Van Grieken R, Cement and concrete research 36, 663 (2006). http://doi.org/10.1016/J.CEMCONRES.2005.09.010
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A characterisation of the surface properties of an ultra fine fly ash (UFFA) used in the polymer industry”. Potgieter-Vermaak SS, Potgieter JH, Kruger RA, Spolnik Z, Van Grieken R, Fuel 84, 2295 (2005). http://doi.org/10.1016/J.FUEL.2005.05.013
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Comparison of limestone, dolomite and fly ash as pre-treatment agents for acid mine drainage”. Potgieter-Vermaak SS, Potgieter JH, Monama P, Van Grieken R, Minerals engineering 19, 454 (2006). http://doi.org/10.1016/J.MINENG.2005.07.009
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The application of Raman spectrometry to investigate and characterize cement: part I: a review”. Potgieter-Vermaak SS, Potgieter JH, Van Grieken R, Cement and concrete research 36, 656 (2006). http://doi.org/10.1016/J.CEMCONRES.2005.09.008
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Fingerprinting of South African ordinary Portland cements, cement blends and mortars for identification purposes: discrimination with starplots and PCA”. Potgieter-Vermaak SS, Potgieter JH, Worobiec A, Van Grieken R, Marjanovic L, Moeketsi S, Cement and concrete research 37, 834 (2007). http://doi.org/10.1016/J.CEMCONRES.2007.02.013
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Preliminary evaluation of micro-Raman spectrometry for the characterization of individual aerosol particles”. Potgieter-Vermaak SS, Van Grieken R, Applied spectroscopy 60, 39 (2006). http://doi.org/10.1366/000370206775382848
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Pyrolysis kinetics of bamboo material”. Potters G, Schoeters G, Tytgat T, Horvath G, Ludecke C, Cool P, Lenaerts S, Appels L, Dewil R, (2010)
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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Impacts of the Hara biosphere reserve on livelihood and welfare in Persian Gulf”. Pour MD, Motiee N, Barati AA, Taheri F, Azadi H, Gebrehiwot K, Lebailly P, Van Passel S, Witlox F, Ecological Economics 141, 76 (2017). http://doi.org/10.1016/J.ECOLECON.2017.05.023
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Pourbabak S (2020) Influence of nano and microstructural features and defects in finegrained NiTi on the thermal and mechanical reversibility of the martensitic transformation. 166 p
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Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting”. Pourbabak S, Montero-Sistiaga ML, Schryvers D, Van Humbeeck J, Vanmeensel K, Materials characterization 153, 366 (2019). http://doi.org/10.1016/j.matchar.2019.05.024
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In-Situ TEM Stress Induced Martensitic Transformation in Ni50.8Ti49.2 Microwires”. Pourbabak S, Orekhov A, Samaee V, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity 5, 154 (2019). http://doi.org/10.1007/s40830-019-00217-6
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Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires”. Pourbabak S, Orekhov A, Schryvers D, Microscopy Research And Technique , 1 (2020). http://doi.org/10.1002/JEMT.23588
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DSC cycling effects on phase transformation temperatures of micron and submicron grain Ni50.8Ti49.2 microwires”. Pourbabak S, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity , 1 (2020). http://doi.org/10.1007/S40830-020-00278-Y
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Ni cluster formation in low temperature annealed Ni50.6Ti49.4”. Pourbabak S, Wang X, Van Dyck D, Verlinden B, Schryvers D, Functional materials letters 10, 1740005 (2017). http://doi.org/10.1142/S1793604717400057
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General 2D Schrödinger-Poisson solver with open boundary conditions for nano-scale CMOS transistors”. Pourghaderi MA, Magnus W, Sorée B, de Meyer K, Meuris M, Heyns M, Journal of computational electronics 7, 475 (2008). http://doi.org/10.1007/s10825-008-0257-8
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Ballistic current in metal-oxide-semiconductor field-effect transistors: the role of device topology”. Pourghaderi MA, Magnus W, Sorée B, Meuris M, de Meyer K, Heyns M, Journal of applied physics 106, 053702 (2009). http://doi.org/10.1063/1.3197635
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Tunneling-lifetime model for metal-oxide-semiconductor structures”. Pourghaderi MA, Magnus W, Sorée B, Meuris M, de Meyer K, Heyns M, Physical review : B : solid state 80, 085315 (2009). http://doi.org/10.1103/PhysRevB.80.085315
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Probing the intrinsic limitations of the contact resistance of metal/semiconductor interfaces through atomistic simulations”. Pourtois G, Dabral A, Sankaran K, Magnus W, Yu H, de de Meux AJ, Lu AKA, Clima S, Stokbro K, Schaekers M, Houssa M, Collaert N, Horiguchi N, Semiconductors, Dielectrics, And Metals For Nanoelectronics 15: In Memory Of Samares Kar , 303 (2017). http://doi.org/10.1149/08001.0303ECST
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First-principle calculations on gate/dielectric interfaces : on the origin of work function shifts”. Pourtois G, Lauwers A, Kittl J, Pantisano L, Sorée B, De Gendt S, Magnus W, Heyns A, Maex K, Microelectronic engineering 80, 272 (2005). http://doi.org/10.1016/j.mee.2005.04.080
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2D X-ray and FTIR micro-analysis of the degradation of cadmium yellow pigment in paintings of Henri Matisse”. Pouyet E, Cotte M, Fayard B, Salome M, Meirer F, Mehta A, Uffelman ES, Hull A, Vanmeert F, Kieffer J, Burghammer M, Janssens K, Sette F, Mass J, Applied physics A : materials science &, processing 121, 967 (2015). http://doi.org/10.1007/S00339-015-9239-4
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Prabhakara V (2021) Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy. 149 p
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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