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X-ray fluorescence analysis, sample preparation for”. Margu'i' E, Queralt I, Van Grieken R page 1 (2009).
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Surface enhanced Raman scattering of silver sensitized cobalt nanoparticles in metaldielectric nanocomposites”. Margueritat J, Gonzalo J, Afonso CN, Hörmann U, Van Tendeloo G, Mlayah A, Murray DB, Saviot L, Zhou Y, Hong MH, Luk'yanchuk BS, Nanotechnology 19, 375701 (2008). http://doi.org/10.1088/0957-4484/19/37/375701
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High-energy polarized-beam energy-dispersive X-ray fluorescence analysis combined with activated thin layers for cadmium determination at trace levels in complex environmental liquid samples”. Marguí, E, Fontàs C, van Meel K, Van Grieken R, Queralt I, Hidalgo M, Analytical chemistry 80, 2357 (2008). http://doi.org/10.1021/AC7018427
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Analytical capabilities of laboratory, benchtop and handheld X-ray fluorescence systems for detection of metals in aqueous samples pre-concentrated with solid-phase extraction disks”. Margui E, Hidalgo M, Queralt I, van Meel K, Fontas C, Spectrochimica acta: part B : atomic spectroscopy 67, 17 (2012). http://doi.org/10.1016/J.SAB.2011.12.004
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High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
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Overview of most commonly used analytical techniques for elemental analysis”. Margui E, Van Grieken R, Petro Industry News , 8 (2014)
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State-of-the-art X-ray fluorescence instrumentation for chemical analysis”. Margui E, Van Grieken R, Petro Industry News , 16 (2013)
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Marguí, E, Van Grieken R (2013) X-ray fluorescence spectrometry and related techniques : an introduction. 148 p
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Preconcentration methods for the analysis of liquid samples by X-ray fluorescence techniques”. Marguí, E, Van Grieken R, Fontàs C, Hidalgo M, Queralt I, Applied spectroscopy reviews 45, 179 (2010). http://doi.org/10.1080/05704920903584198
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Method for the determination of Pd-catalyst residues in active pharmaceutical ingredients by means of high-energy polarized-beam energy dispersive X-ray fluorescence”. Marguí, E, van Meel K, Van Grieken R, Buendía A, Fontás C, Hidalgo M, Queralt I, Analytical chemistry 81, 1404 (2009). http://doi.org/10.1021/AC8021373
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Catalytic impact of RuOx clusters to high ammonia sensitivity of tin dioxide”. Marikutsa A, Krivetskiy V, Yashina L, Rumyantseva M, Konstantinova E, Ponzoni A, Comini E, Abakumov A, Gaskov A, Sensors and actuators : B : chemical T2 –, 25th Eurosensors Conference, SEP 04-07, 2011, Athens, GREECE 175, 186 (2012). http://doi.org/10.1016/j.snb.2012.03.003
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Effect of zinc oxide modification by indium oxide on microstructure, adsorbed surface species, and sensitivity to CO”. Marikutsa A, Rumyantseva M, Gaskov A, Batuk M, Hadermann J, Sarmadian N, Saniz R, Partoens B, Lamoen D, Frontiers in materials 6 (2019). http://doi.org/10.3389/FMATS.2019.00043
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Sensitivity of nanocrystalline tungsten oxide to CO and ammonia gas determined by surface catalysts”. Marikutsa A, Yang L, Rumyantseva M, Batuk M, Hadermann J, Gaskov A, Sensors and actuators : B : chemical 277, 336 (2018). http://doi.org/10.1016/J.SNB.2018.09.004
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Disruption of conserved polar interactions causes a sequential release of Bim mutants from the canonical binding groove of Mcl1”. Marimuthu P, Razzokov J, Eshonqulov G, International Journal Of Biological Macromolecules 158, 364 (2020). http://doi.org/10.1016/j.ijbiomac.2020.04.243
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Predicted Hotspot Residues Involved in Allosteric Signal Transmission in Pro-Apoptotic Peptide—Mcl1 Complexes”. Marimuthu P, Razzokov J, Singaravelu K, Bogaerts A, Biomolecules 10, 1114 (2020). http://doi.org/10.3390/biom10081114
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Reactive plasma cleaning and restoration of transition metal dichalcogenide monolayers”. Marinov D, de Marneffe J-F, Smets Q, Arutchelvan G, Bal KM, Voronina E, Rakhimova T, Mankelevich Y, El Kazzi S, Nalin Mehta A, Wyndaele P-J, Heyne MH, Zhang J, With PC, Banerjee S, Neyts EC, Asselberghs I, Lin D, De Gendt S, npj 2D Materials and Applications 5, 17 (2021). http://doi.org/10.1038/s41699-020-00197-7
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Analytical electron microscopy of single particles”. Markowicz A, Raeymaekers B, Van Grieken R, Adams F page 173 (1986).
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Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 131 (1986). http://doi.org/10.1002/XRS.1300150211
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A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
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Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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