Records |
Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; de Bock, L.; van Malderen, H.; Van Grieken, R. |
Title |
Study of individual particle types and heavy metal deposition for North Sea aerosols using micro- and trace analysis techniques |
Type |
P3 Proceeding |
Year |
1996 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:14682 |
Serial |
8600 |
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Injuk, J.; Janssens, K.; van Espen, P.; Van Grieken, R. |
Title |
Novel quantitative procedures for in-situ X-ray fluorescence analysis |
Type |
P3 Proceeding |
Year |
2001 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Chemometrics (Mitac 3) |
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Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:36093 |
Serial |
5752 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; Van Grieken, R. |
Title |
Atmospheric inputs of heavy metals into the North Sea |
Type |
P3 Proceeding |
Year |
1996 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:14669 |
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7526 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; Van Grieken, R. |
Title |
Reference matarials for microanalytical nuclear techniques |
Type |
P3 Proceeding |
Year |
1995 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:55574 |
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8467 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; Van Grieken, R. |
Title |
Sample preparation for X-ray fluorescence analysis |
Type |
H3 Book chapter |
Year |
2000 |
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Volume |
15 |
Issue |
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Pages |
13338-13347
T2 - Encyclopedia of analytical chemis |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:31656 |
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8495 |
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Injuk, J.; Van Grieken, R.; Blank, A.; Eksperiandova, L.; Buhrke, V. |
Title |
Specimen preparation |
Type |
H3 Book chapter |
Year |
2006 |
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Pages |
411-432
T2 - Handbook of practical X-ray fluoresce |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:58854 |
Serial |
8573 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; Van Grieken, R.E. |
Title |
Sample preparation for XRF |
Type |
H3 Book chapter |
Year |
1992 |
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Pages |
657-692
T2 - Handbook of X-ray spectroscopy / Grie |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:2857 |
Serial |
8496 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; Van Grieken, R.E. |
Title |
X-ray fluorescence |
Type |
H3 Book chapter |
Year |
2001 |
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Volume |
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Issue |
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Pages |
151-178
T2 - Non-destructive elemental analysis / |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:34107 |
Serial |
8764 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Injuk, J.; van Malderen, H.; Van Grieken, R. |
Title |
Study of the heavy metal concentration, deposition and sources of the North Sea aerosols using X-ray emission techniques |
Type |
H3 Book chapter |
Year |
1993 |
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Pages |
793-795
T2 - Photo-oxidants: precursors and produc |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:6266 |
Serial |
8605 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Ivanov, V.A.; Betouras, J.J.; Peeters, F.M. |
Title |
MgB2 : superconductivity and pressure effects |
Type |
P1 Proceeding |
Year |
2003 |
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Pages |
35-46 |
Keywords |
P1 Proceeding; Condensed Matter Theory (CMT) |
Abstract |
We present a Ginzburg-Landau theory for a two-band superconductor with emphasis on MgB2. We propose experiments which lead to identification of the possible scenarios: whether both sigma- and pi-bands superconduct or sigma-alone. According to the second scenario a microscopic theory of superconducting MgB2 is proposed based on the strongly interacting or-electrons and non-correlated pi-electrons of boron ions. The kinematic and Coulomb interactions of sigma-electrons provide the superconducting state with an anisotropic gap of s(*)-wave symmetry. The critical temperature T-c has a non-monotonic dependence on the distance r between the centers of gravity of sigma- and pi-bands. The position of MgB2 on a bell-shaped curve T-c (r) is identified in the overdoped region. The derived superconducting density of electronic states is in agreement with available experimental and theoretical data. It is argued that the effects of pressure are crucial to identify the microscopic origin of superconductivity in MgB2. Possibilities for increase of T, are discussed. |
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Springer |
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Dordrecht |
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0000-00-00 |
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106 |
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1-4020-1372-8 |
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Additional Links |
UA library record; WoS full record; |
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Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:94869 |
Serial |
2020 |
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Jacobs, W.; Floren, E.; Luyckx, D.; Bueken, P.; van Beeck, J.; Van Grieken, R. |
Title |
Mapping of toxic vapours on board of tankers |
Type |
P3 Proceeding |
Year |
2011 |
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P3 Proceeding; Economics; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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978-1-905040-85-8 |
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no |
Call Number |
UA @ admin @ c:irua:89790 |
Serial |
8202 |
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Jafarzadeh, A. |
Title |
First-principle studies of plasma-catalyst interactions for greenhouse gas conversion |
Type |
Doctoral thesis |
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2020 |
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163 p. |
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Doctoral thesis; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:174073 |
Serial |
6765 |
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Jakubowski, N.; Bogaerts, A.; Hoffmann, V. |
Title |
Glow discharges in emission and mass spectrometry |
Type |
H3 Book chapter |
Year |
2003 |
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H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Blackwell |
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Sheffield |
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0000-00-00 |
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Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:44024 |
Serial |
1353 |
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Jambers, W.; Van Grieken, R. |
Title |
Single particle characterisation of inorganic North Sea suspensions |
Type |
P3 Proceeding |
Year |
1996 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:14670 |
Serial |
8537 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Jambers, W.; Van Grieken, R.E. |
Title |
Environmental problems |
Type |
H3 Book chapter |
Year |
1997 |
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803-819
T2 - Handbook of microscopy: applications |
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H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:18789 |
Serial |
7929 |
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Jannis, D. |
Title |
Novel detection schemes for transmission electron microscopy |
Type |
Doctoral thesis |
Year |
2021 |
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Pages |
iv, 208 p. |
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Doctoral thesis; Electron microscopy for materials research (EMAT) |
Abstract |
Electron microscopy is an excellent tool which provides resolution down to the atomic scale with up to pm precision in locating atoms. The characterization of materials in these length scales is of utmost importance to answer questions in biology, chemistry and material science. The successful implementation of aberration-corrected microscopes made atomic resolution imaging relatively easy, this could give the impression that the development of novel electron microscopy techniques would stagnate and only the application of these instruments as giant magnifying tools would continue. This is of course not true and a multitude of problems still exist in electron microscopy. Two of such issues are discussed below. One of the biggest problems in electron microscopy is the presence of beam damage which occurs due the fact that the highly energetic incoming electrons have sufficient kinetic energy to change the structure of the material. The amount of damage induced depends on the dose, hence minimizing this dose during an experiment is beneficial. This minimizing of the total dose comes at the expense of more noise due to the counting nature of the electrons. For this reason, the implementation of four dimensional scanning transmission electron microscopy (4D STEM) experiments has reduced the total dose needed per acquisition. However, the current cameras used to measure the diffraction patterns are still two orders of magnitude slower than to the conventional STEM methods. Improving the acquisition speed would make the 4D STEM technique more feasible and is of utmost importance for the beam sensitive materials since less dose is used during the acquisition. In TEM there is not only the possibility to perform imaging experiments but also spectroscopic measurements. There are two frequently used methods: electron energy-loss spectroscopy (EELS) and energy dispersive x-ray spectroscopy (EDX). EELS measures the energy-loss spectrum of the incoming electron which gives information on the available excitations in the material providing elemental sensitivity. In EDX, the characteristic x-rays, arising from the decay of an atom which is initially excited due to the incoming electrons, are detected providing similar elemental analysis. Both methods are able to provide comparable elemental information where in certain circumstances one outperforms the other. However, both methods have a detection limit of approximately 100-1000 ppm which is not sufficient for some materials. In this thesis, two novel techniques which can make significant progress for the two problems discussed above. |
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Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:182404 |
Serial |
6872 |
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Jannis, D.; Müller-Caspary, K.; Béché, A.; Oelsner, A.; Verbeeck, J. |
Title |
Spectrocopic coincidence experiment in transmission electron microscopy |
Type |
Dataset |
Year |
2019 |
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Dataset; Electron microscopy for materials research (EMAT) |
Abstract |
This dataset contains individual EEL and EDX events where for every event (electron or X-ray), their energy and time of arrival is stored. The experiment was performed in a transmission electron microscope (Tecnai Osiris) at 200 keV. The material investigated is an Al-Mg-Si-Cu alloy. The 'full_dataset.mat' contains the full dataset and the 'subset.mat' has the first five frames of the full dataset. The attached 'EELS-EDX.ipynb' is a jupyter notebook file. This file describes the data processing in order to observe the temporal correlation between the electrons and X-rays. |
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no |
Call Number |
UA @ admin @ c:irua:169112 |
Serial |
6888 |
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Janssen, E.; Kontozova-Deutsch, V.; Krupińska, B.; Moris, H.; Peckstadt, A.; van Bos, M.; Watteeuw, L.; Van Grieken, R. |
Title |
Do gaseous pollutants and particulate matter endanger our world heritage? A study in the Museum Plantin-Moretus, Antwerp |
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P3 Proceeding |
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2010 |
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P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
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no |
Call Number |
UA @ admin @ c:irua:85520 |
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7820 |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, G.; Geuens, I.; de Keyzer, R.; van Espen, P.; Gijbels, R.; Hubin, A.; Terryn, H.; Vereecken, J. |
Title |
Quantitative surface analysis of silver halide microcrystals using scanning ion microprobe and scanning Auger microprobe |
Type |
H3 Book chapter |
Year |
1996 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
161-164 |
Keywords |
H3 Book chapter; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT); Chemometrics (Mitac 3) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
Wiley |
Place of Publication |
Chichester |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
|
Approved |
no |
Call Number |
UA @ lucian @ c:irua:27361 |
Serial |
2765 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
A brief history of 50 years of ICXOM |
Type |
P1 Proceeding |
Year |
2010 |
Publication |
|
Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
1-6 |
Keywords |
P1 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
The ICXOM series of meetings began in 1956 and for over 50 years have been conferences devoted to the topic of “X-ray microanalysis”, both for those interested in developing instrumentation and methods of analysis and for scientists mainly interested in using X-ray micro-analysers for investigations of an applied nature. This contribution surveys the ICXOM series origins, its development and trends over the years. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
978-0-7354-0764-0 |
ISBN |
|
Additional Links |
UA library record; WoS full record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
; ; |
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:83244 |
Serial |
5493 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
Comparison with other microanalytical techniques |
Type |
H3 Book chapter |
Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
211-243 |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
|
Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:27727 |
Serial |
5532 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
Editorial |
Type |
P3 Proceeding |
Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:41803 |
Serial |
5580 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
Methods 4: elemental analysis (AAS/AES/X-ray fluorescence) |
Type |
H3 Book chapter |
Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
|
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:42917 |
Serial |
5708 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
A survey of the recent use of x-ray beam methods for non-destructive investigations in the cultural heritage sector |
Type |
H3 Book chapter |
Year |
2005 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
|
Pages |
265-308 |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:49876 |
Serial |
5858 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
X-ray based methods of analysis |
Type |
H3 Book chapter |
Year |
2004 |
Publication |
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Abbreviated Journal |
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Volume |
|
Issue |
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Pages |
129-226 |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:50846 |
Serial |
5910 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K. |
Title |
X-ray fluorescence analysis |
Type |
H3 Book chapter |
Year |
2003 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:42918 |
Serial |
5912 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K.; Adams, F. |
Title |
Applications in art and archaeology |
Type |
H3 Book chapter |
Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
290-313 |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Wos |
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Publication Date |
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Edition |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:27579 |
Serial |
5475 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K.; Adams, F. |
Title |
Overview |
Type |
H3 Book chapter |
Year |
2000 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
1-16 |
Keywords |
H3 Book chapter; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
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Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Editor |
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Language |
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Wos |
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Publication Date |
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Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
Most recent IF: NA |
Call Number |
UA @ admin @ c:irua:27577 |
Serial |
5764 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K.; Alfeld, M.; Van der Snickt, G.; De Nolf, W.; Vanmeert, F.; Monico, L.; Legrand, S.; Dik, J.; Cotte, M.; Falkenberg, G.; van der Loeff, L.; Leeuwestein, M.; Hendriks, E. |
Title |
Examination of Vincent van Gogh's paintings and pigments by means of state-of-the-art analytical methods |
Type |
H2 Book chapter |
Year |
2014 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
373-403
T2 - Science and art : the painted surface |
Keywords |
H2 Book chapter; Art; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) |
Abstract |
Recent studies in which X-ray beams of macroscopic to (sub) microscopic dimensions were used for non-destructive analysis and characterization of pigments, paint micro samples and/or entire paintings by Vincent van Gogh are concisely reviewed. The overview presented encompasses the use of laboratory and synchrotron radiation-based instrumentation and deals with the use of several variants of X-ray fluorescence (XRF) as a method of elemental analysis and imaging as well as with the combined use of X-ray diffraction (XRD) and X-ray absorption spectroscopy (XAS). Microscopic and macroscopic XRF are variants of the method that are well suited to visualize the elemental distribution of key elements, mostly metals, present in paint multi layers, either on the length scale from 1–100 μm inside micro samples taken from paintings or on the 1–100 cm length scale when the (subsurface) distribution of specific pigments in entire paintings is concerned. In the context of the characterization of van Gogh's pigments subject to natural degradation, the use of methods limited to elemental analysis or imaging usually is not sufficient to elucidate the chemical transformations that have taken place. However, at synchrotron facilities, combinations of μ-XRF with related methods such as μ-XAS and μ-XRD have proven themselves to be very suitable for such studies. Their use is often combined with microscopic Fourier transform infra-red (μ-FTIR) spectroscopy since this method delivers complementary information at more or less the same length scale as the X-ray microprobe techniques. Also in the context of macroscopic imaging of works of art, the complementary use of X-ray based and infra-red based imaging appears very promising; some recent developments are discussed. |
Address |
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Corporate Author |
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Thesis |
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Publisher |
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Place of Publication |
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Language |
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Wos |
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Publication Date |
2020-02-24 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
978-1-84973-818-7 |
Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
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Approved |
no |
Call Number |
UA @ admin @ c:irua:190782 |
Serial |
7943 |
Permanent link to this record |
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Author ![sorted by Author field, ascending order (up)](img/sort_asc.gif) |
Janssens, K.; Bogaerts, A.; van Grieken, R. |
Title |
Colloquium Spectroscopicum Internationale 34: a collection of papers presented at the Colloquium Spectroscopicum Internationale, Antwerp, Belgium, 4-9 September 2005 |
Type |
ME3 Book as editor |
Year |
2006 |
Publication |
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Abbreviated Journal |
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Volume |
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Issue |
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Pages |
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Keywords |
ME3 Book as editor; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
Abstract |
|
Address |
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Corporate Author |
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Thesis |
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Publisher |
Elsevier |
Place of Publication |
Amsterdam |
Editor |
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Language |
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Wos |
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Publication Date |
0000-00-00 |
Series Editor |
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Series Title |
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Abbreviated Series Title |
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Series Volume |
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Series Issue |
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Edition |
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ISSN |
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ISBN |
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Additional Links |
UA library record |
Impact Factor |
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Times cited |
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Open Access |
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Notes |
|
Approved |
Most recent IF: NA |
Call Number |
UA @ lucian @ c:irua:61092 |
Serial |
391 |
Permanent link to this record |