Number of records found: 8872
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De Vis K, Jacobs P, Caen J, Janssens K (2010) The use of glass bricks in architecture in the 19th and 20th centuries : a case study. 194–201
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The consolidation of cracks in architectural glass and dalle de verre : first assessment of possible adhesives”. De Vis K, Jacobs P, Janssens K, Caen J, (2011)
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Dealing with architectural glasses : maintenance, monitoring and emergency treatment”. De Vis K, Janssens K, Jacobs P, Caen J, (2015)
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Einfluss verschiedener Silbersalze auf die Farbintensität von Silbergelb : analytische Untersuchungen”. De Vis K, Jembrih-Simbürger D, Schalm O, Schreiner M, Caen J, Zeitschrift für Kunsttechnologie und Konservierung 16, 147 (2002)
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Resource recovery from pig manure via an integrated approach : a technical and economic assessment for full-scale applications”. De Vrieze J, Colica G, Pintucci C, Sarli J, Pedizzi C, Willeghems G, Bral A, Varga S, Prat D, Peng L, Spiller M, Buysse J, Colsen J, Benito O, Carballa M, Vlaeminck SE, Bioresource technology 272, 582 (2019). http://doi.org/10.1016/J.BIORTECH.2018.10.024
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Thermophilic sludge digestion improves energy balance and nutrient recovery potential in full-scale municipal wastewater treatment plants”. De Vrieze J, Smet D, Klok J, Colsen J, Angenent LT, Vlaeminck SE, Bioresource technology 218, 1237 (2016). http://doi.org/10.1016/J.BIORTECH.2016.06.119
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Characterization of AgxAuy nano particles by TEM and STEM”. de Vyt A, Gijbels R, Davock H, van Roost C, Geuens I, Journal of analytical atomic spectrometry 14, 499 (1999). http://doi.org/10.1039/a807695b
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Quantitative analysis of individual AgxAuy nanoparticles by TEM-EDX: track 1”. de Vyt A, Gijbels R, van Roost C, Geuens I, , 524 (1998)
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De wael A (2021) Model-based quantitative scanning transmission electron microscopy for measuring dynamic structural changes at the atomic scale. xiv, 146 p
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Hybrid statistics-simulations based method for atom-counting from ADF STEM images”. De wael A, De Backer A, Jones L, Nellist PD, Van Aert S, Ultramicroscopy 177, 69 (2017). http://doi.org/10.1016/j.ultramic.2017.01.010
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Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy”. De wael A, De Backer A, Jones L, Varambhia A, Nellist PD, Van Aert S, Physical Review Letters 124, 106105 (2020). http://doi.org/10.1103/PhysRevLett.124.106105
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Modelling ADF STEM images using elliptical Gaussian peaks and its effects on the quantification of structure parameters in the presence of sample tilt”. De wael A, De Backer A, Lobato I, Van Aert S, Ultramicroscopy , 113391 (2021). http://doi.org/10.1016/j.ultramic.2021.113391
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Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations”. De wael A, De Backer A, Van Aert S, Ultramicroscopy 219, 113131 (2020). http://doi.org/10.1016/j.ultramic.2020.113131
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Three Approaches for Representing the Statistical Uncertainty on Atom-Counting Results in Quantitative ADF STEM”. De wael A, De Backer A, Yu C-P, Sentürk DG, Lobato I, Faes C, Van Aert S, Microscopy and microanalysis , 1 (2022). http://doi.org/10.1017/S1431927622012284
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Electrochemical determination of hydrogen peroxide with cytochrome c peroxidase and horse heart cytochrome c entrapped in a gelatin hydrogel”. De Wael K, Bashir Q, van Vlierberghe S, Dubruel P, Heering HA, Adriaens A, Bioelectrochemistry: an international journal devoted to electrochemical aspects of biology and biological aspects of electrochemistry 83, 15 (2012). http://doi.org/10.1016/J.BIOELECHEM.2011.07.001
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The use of potentiometric sensors to study (bio)molecular interactions”. De Wael K, Daems D, Van Camp G, Nagels LJ, Analytical chemistry 84, 4921 (2012). http://doi.org/10.1021/AC3005428
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Enzyme-gelatin electrochemical biosensors : scaling down”. De Wael K, De Belder S, Pilehar S, Van Steenberge G, Herrebout W, Heering HA, Biosensors 2, 101 (2012). http://doi.org/10.3390/BIOS2010101
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De Wael K, Nagels L, Van Camp G (2013) Potentiometric sensors and method for measuring intermolecular interactions
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The electrochemistry of a gelatin modified gold electrode”. De Wael K, Verstraete A, van Vlierberghe S, Dejonghe W, Dubruel P, Adriaens A, International journal of electrochemical science 6, 1810 (2011)
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De Weerdt L (2021) An inquiry into the market acceptance of circular plastics. xii, 154 p
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How an incineration tax changes waste management practices among firms”. De Weerdt L, De Jaeger S, Compernolle T, Van Passel S, Resources Conservation And Recycling 180, 106172 (2022). http://doi.org/10.1016/j.resconrec.2022.106172
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The effect of waste incineration taxation on industrial plastic waste generation: A panel analysis”. De Weerdt L, Sasao T, Compernolle T, Van Passel S, De Jaeger S, Resources Conservation And Recycling 157, 104717 (2020). http://doi.org/10.1016/j.resconrec.2020.104717
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XPS study of ion induced oxidation of silicon with and without oxygen flooding”. de Witte H, Conard T, Sporken R, Gouttebaron R, Magnee R, Vandervorst W, Caudano R, Gijbels R, , 73 (2000)
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Ion-bombardment artifact in TOF-SIMS analysis of ZrO2/SiO2/Si stacks”. de Witte H, Conard T, Vandervorst W, Gijbels R, Applied surface science 203, 523 (2003). http://doi.org/10.1016/S0169-4332(02)00728-6
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SIMS analysis of oxynitrides: evidence for nitrogen diffusion induced by oxygen flooding”. de Witte H, Conard T, Vandervorst W, Gijbels R, Surface and interface analysis 29, 761 (2000). http://doi.org/10.1002/1096-9918(200011)29:11<761::AID-SIA926>3.0.CO;2-F
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Study of oxynitrides with dual beam TOF-SIMS”. de Witte H, Conard T, Vandervorst W, Gijbels R, , 611 (2000)
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Capabilities of TOF-SIMS to study the influence of different oxidation conditions on metal contamination redistribution”. de Witte H, de Gendt S, Douglas M, Conard T, Kenis K, Mertens PW, Vandervorst W, Gijbels R s.n., Leuven, page 147 (1999).
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Evaluation of time-of-flight secondary ion mass spectrometry for metal contamination monitoring on wafer surfaces”. de Witte H, de Gendt S, Douglas M, Conard T, Kenis K, Mertens PW, Vandervorst W, Gijbels R, Journal of the electrochemical society 147, 13 (2000). http://doi.org/10.1149/1.1393457
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Modeling of bombardment induced oxidation of silicon”. de Witte H, Vandervorst W, Gijbels R, Journal of applied physics 89, 3001 (2001). http://doi.org/10.1063/1.1344581
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Modeling of bombardment induced oxidation of silicon with and without oxygen flooding”. de Witte H, Vandervorst W, Gijbels R, , 327 (1998)
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