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Effect of charge transfer on EELS integrated cross sections in Mn and Ti oxides”. Potapov PL, Jorissen K, Schryvers D, Lamoen D, Physical review : B : condensed matter and materials physics 70, 045106 (2004). http://doi.org/10.1103/PhysRevB.70.045106
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Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Journal of microscopy 210, 102 (2003). http://doi.org/10.1046/j.1365-2818.2003.01176.x
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Structural and chemical effects on EELS L3,2 ionization edges in Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Verbeeck J, Physical review : B : condensed matter and materials physics 64, 184110 (2001). http://doi.org/10.1103/PhysRevB.64.184110
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Nanoscale inhomogeneities in melt-spun Ni-Al”. Potapov PL, Ochin P, Pons J, Schryvers D, Acta materialia 48, 3833 (2000). http://doi.org/10.1016/S1359-6454(00)00188-9
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Measuring the absolute position of EELS ionisation edges in a TEM”. Potapov PL, Schryvers D, Ultramicroscopy 99, 73 (2004). http://doi.org/10.1016/S0304-3991(03)00185-2
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Microstructural mechanism of development in photothermographic materials”. Potapov PL, Schryvers D, Strijckers H, van Roost C, The journal of imaging science and technology 47, 115 (2003)
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Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing”. Potapov PL, Tirry W, Schryvers D, Sivel VGM, Wu M-Y, Aslanidis D, Zandbergen H, Journal of materials science: materials in medicine 18, 483 (2007). http://doi.org/10.1007/s10856-007-2008-y
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Inelastic electron holography as a variant of the Feynman thought experiment”. Potapov PL, Verbeeck J, Schattschneider P, Lichte H, van Dyck D, Ultramicroscopy 107, 559 (2007). http://doi.org/10.1016/j.ultramic.2006.11.003
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Electronic and chemical properties of nickel oxide thin films and the intrinsic defects compensation mechanism”. Poulain R, Lumbeeck G, Hunka J, Proost J, Savolainen H, Idrissi H, Schryvers D, Gauquelin N, Klein A, ACS applied electronic materials 4, 2718 (2022). http://doi.org/10.1021/ACSAELM.2C00230
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Pourbabak S (2020) Influence of nano and microstructural features and defects in finegrained NiTi on the thermal and mechanical reversibility of the martensitic transformation. 166 p
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Microscopic investigation of as built and hot isostatic pressed Hastelloy X processed by Selective Laser Melting”. Pourbabak S, Montero-Sistiaga ML, Schryvers D, Van Humbeeck J, Vanmeensel K, Materials characterization 153, 366 (2019). http://doi.org/10.1016/j.matchar.2019.05.024
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In-Situ TEM Stress Induced Martensitic Transformation in Ni50.8Ti49.2 Microwires”. Pourbabak S, Orekhov A, Samaee V, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity 5, 154 (2019). http://doi.org/10.1007/s40830-019-00217-6
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Twin-jet electropolishing for damage-free transmission electron microscopy specimen preparation of metallic microwires”. Pourbabak S, Orekhov A, Schryvers D, Microscopy Research And Technique , 1 (2020). http://doi.org/10.1002/JEMT.23588
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DSC cycling effects on phase transformation temperatures of micron and submicron grain Ni50.8Ti49.2 microwires”. Pourbabak S, Verlinden B, Van Humbeeck J, Schryvers D, Shape memory and superelasticity , 1 (2020). http://doi.org/10.1007/S40830-020-00278-Y
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Ni cluster formation in low temperature annealed Ni50.6Ti49.4”. Pourbabak S, Wang X, Van Dyck D, Verlinden B, Schryvers D, Functional materials letters 10, 1740005 (2017). http://doi.org/10.1142/S1793604717400057
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Prabhakara V (2021) Strain measurement for semiconductor applications with Raman spectroscopy and Transmission electron microscopy. 149 p
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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Linearized radially polarized light for improved precision in strain measurements using micro-Raman spectroscopy”. Prabhakara V, Nuytten T, Bender H, Vandervorst W, Bals S, Verbeeck J, Optics Express 29, 34531 (2021). http://doi.org/10.1364/OE.434726
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Gold nanoclusters with bright near-infrared photoluminescence”. Pramanik G, Humpolickova J, Valenta J, Kundu P, Bals S, Bour P, Dracinsky M, Cigler P, Nanoscale 10, 3792 (2018). http://doi.org/10.1039/C7NR06050E
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Inverse heavy-atom effect in near infrared photoluminescent gold nanoclusters”. Pramanik G, Kvakova K, Thottappali MA, Rais D, Pfleger J, Greben M, El-Zoka A, Bals S, Dracinsky M, Valenta J, Cigler P, Nanoscale 12, 10462 (2021). http://doi.org/10.1039/D1NR90138A
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Inverse heavy-atom effect in near infrared photoluminescent gold nanoclusters”. Pramanik G, Kvakova K, Thottappali MA, Rais D, Pfleger J, Greben M, El-Zoka A, Bals S, Dracinsky M, Valenta J, Cigler P, Nanoscale 13, 10462 (2021). http://doi.org/10.1039/D1NR02440J
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:Ba2.1Bi0.9(O, F)6.8-\delta: a new ordered anion-excess fluorite”. Prituzhalov VA, Abakumov AM, Ardashnikova EI, Dolgikh VA, Van Tendeloo G, Materials research bulletin 42, 861 (2007). http://doi.org/10.1016/j.materresbull.2006.08.023
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New anion-conducting solid solutions Bi1-xTex(O,F)2+\delta (x >, 0.5) and glassceramic material on their base”. Prituzhalov VA, Ardashnikova EI, Vinogradov AA, Dolgikh VA, Videau J-J, Fargin E, Abakumov AM, Tarakina NV, Van Tendeloo G, Journal of fluorine chemistry 132, 1110 (2011). http://doi.org/10.1016/j.jfluchem.2011.06.042
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On the Origin of Damped Electrochemical Oscillations at Silicon Anodes (Revisited)”. Proost J, Blaffart F, Turner S, Idrissi H, ChemPhysChem : a European journal of chemical physics and physical chemistry 15, 3116 (2014). http://doi.org/10.1002/cphc.201402207
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Microstructure of α-axis oriented YBCO films on SrTiO3 substrates using a new template layer La4BaCu5O13”. Prouteau C, Verbist K, Hamet JF, Mercey B, Hervieu M, Raveau B, Van Tendeloo G, Physica: C : superconductivity 288, 231 (1997)
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Synthesis and characterization of new phases: Sr3.75K1.75Bi3O12 and Sr3.1Na2.9Bi3O12”. Pshirkov JS, Kazakov SM, Abakumov AM, Putilin SN, Antipov EV, Bougerol-Chaillout C, Lebedev OI, Van Tendeloo G, Journal of solid state chemistry 152, 492 (2000). http://doi.org/10.1006/jssc.2000.8718
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Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayers”. Psilodimitrakopoulos S, Orekhov A, Mouchliadis L, Jannis D, Maragkakis GM, Kourmoulakis G, Gauquelin N, Kioseoglou G, Verbeeck J, Stratakis E, npj 2D Materials and Applications 5, 77 (2021). http://doi.org/10.1038/S41699-021-00258-5
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3D porous nanostructured platinum prepared using atomic layer deposition”. Pulinthanathu Sree S, Dendooven J, Geerts L, Ramachandran RK, Javon E, Ceyssens F, Breynaert E, Kirschhock CEA, Puers R, Altantzis T, Van Tendeloo G, Bals S, Detavernier C, Martens JA, Journal of materials chemistry A : materials for energy and sustainability 5, 19007 (2017). http://doi.org/10.1039/C7TA03257A
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One step toward a new generation of C-MOS compatible oxide p-n junctions: Structure of the LSMO/ZnO interface elucidated by an experimental and theoretical synergic work”. Pullini D, Sgroi M, Mahmoud A, Gauquelin N, Maschio L, Lorenzo-Ferrari AM, Groenen R, Damen C, Rijnders G, van den Bos KHW, Van Aert S, Verbeeck J, ACS applied materials and interfaces 9, 20974 (2017). http://doi.org/10.1021/acsami.7b04089
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