Number of records found: 2704
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Martin JML, Franç,ois JP, Gijbels R, Almlö,f J (1991) Structure and infrared spectroscopy of the C11 molecule. University of Minnesota, Minneapolis, Minn
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Trace element composition of Zaire suspended sediments”. Martin J-M, Thomas AJ, Van Grieken RE, Netherlands journal of sea research 12, 414 (1978). http://doi.org/10.1016/0077-7579(78)90043-1
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On the nucleation mechanism of {112} <, 111 >, mechanical twins in as-quenched beta metastable Ti-12 wt.% Mo alloy”. Marteleur M, Idrissi H, Amin-Ahmadi B, Prima F, Schryvers D, Jacques PJ, Materialia 7, Unsp 100418 (2019). http://doi.org/10.1016/J.MTLA.2019.100418
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Binding of remote and spatial separated D- centers in double barrier resonant tunneling semiconductor devices”. Marmorkos IK, Schweigert VA, Peeters FM, Lok JGS, , 2769 (1996)
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Stability of the superconducting vortex structure around a magnetic dot”. Marmorkos IK, Matulis A, Peeters FM, Physics of low-dimensional structures 10/11, 77 (1995)
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AM, Van Grieken RE page 339 (1992).
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Atomic number correction in electron probe X-ray microanalysis of curved samples and particles”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2798 (1984). http://doi.org/10.1021/AC00278A036
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Composition dependence of Bremsstrahlung background in electron-probe x-ray microanalysis”. Markowicz AA, Van Grieken RE, Analytical chemistry 56, 2049 (1984). http://doi.org/10.1021/AC00276A016
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Quantification in XRF analysis of intermediate-thickness samples”. Markowicz AA, Van Grieken RE page 407 (2002).
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 62, 101r (1990). http://doi.org/10.1021/AC00211A001
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 60, 28r (1988). http://doi.org/10.1021/AC00163A002
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Analytical chemistry 58, 279r (1986). http://doi.org/10.1021/AC00296A019
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X-ray spectrometry”. Markowicz AA, Van Grieken RE, Reviews in analytical chemistry 56, 241r (1984)
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Absorption correction in electron probe x-ray microanalysis of thin samples”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 58, 1282 (1986). http://doi.org/10.1021/AC00298A003
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Bremsstrahlung background in electron-probe X-ray-microanalysis of thin films”. Markowicz AA, Storms HM, Van Grieken RE, Analytical chemistry 57, 2885 (1985). http://doi.org/10.1021/AC00291A032
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Radiometric diameter concept and exact intensities for spherical particles in x-ray fluorescence analysis”. Markowicz A, Van Dyck P, Van Grieken R, X-ray spectrometry 9, 52 (1980). http://doi.org/10.1002/XRS.1300090205
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Evaluation of an equation for bremsstrahlung background in electron-probe X-ray microanalysis of composite samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 131 (1986). http://doi.org/10.1002/XRS.1300150211
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A simple absorption correction for electron probe X-ray microanalysis of bulk samples”. Markowicz A, Storms H, Van Grieken R, X-ray spectrometry 15, 115 (1986). http://doi.org/10.1002/XRS.1300150209
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Analytical electron microscopy of single particles”. Markowicz A, Raeymaekers B, Van Grieken R, Adams F page 173 (1986).
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Sensitivity of nanocrystalline tungsten oxide to CO and ammonia gas determined by surface catalysts”. Marikutsa A, Yang L, Rumyantseva M, Batuk M, Hadermann J, Gaskov A, Sensors and actuators : B : chemical 277, 336 (2018). http://doi.org/10.1016/J.SNB.2018.09.004
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Method for the determination of Pd-catalyst residues in active pharmaceutical ingredients by means of high-energy polarized-beam energy dispersive X-ray fluorescence”. Marguí, E, van Meel K, Van Grieken R, Buendía A, Fontás C, Hidalgo M, Queralt I, Analytical chemistry 81, 1404 (2009). http://doi.org/10.1021/AC8021373
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Preconcentration methods for the analysis of liquid samples by X-ray fluorescence techniques”. Marguí, E, Van Grieken R, Fontàs C, Hidalgo M, Queralt I, Applied spectroscopy reviews 45, 179 (2010). http://doi.org/10.1080/05704920903584198
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Overview of most commonly used analytical techniques for elemental analysis”. Margui E, Van Grieken R, Petro Industry News , 8 (2014)
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State-of-the-art X-ray fluorescence instrumentation for chemical analysis”. Margui E, Van Grieken R, Petro Industry News , 16 (2013)
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Marguí, E, Van Grieken R (2013) X-ray fluorescence spectrometry and related techniques : an introduction. 148 p
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High-energy polarized-beam EDXRF for trace metal analysis of vegetation samples in environmental studies”. Marguí, E, Padilla R, Hidalgo M, Queralt I, Van Grieken R, X-ray spectrometry 35, 169 (2006). http://doi.org/10.1002/XRS.890
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Analytical capabilities of laboratory, benchtop and handheld X-ray fluorescence systems for detection of metals in aqueous samples pre-concentrated with solid-phase extraction disks”. Margui E, Hidalgo M, Queralt I, van Meel K, Fontas C, Spectrochimica acta: part B : atomic spectroscopy 67, 17 (2012). http://doi.org/10.1016/J.SAB.2011.12.004
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High-energy polarized-beam energy-dispersive X-ray fluorescence analysis combined with activated thin layers for cadmium determination at trace levels in complex environmental liquid samples”. Marguí, E, Fontàs C, van Meel K, Van Grieken R, Queralt I, Hidalgo M, Analytical chemistry 80, 2357 (2008). http://doi.org/10.1021/AC7018427
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X-ray fluorescence analysis, sample preparation for”. Margu'i' E, Queralt I, Van Grieken R page 1 (2009).
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All that glitters is not gold : unraveling the material secrets behind the preservation of historical brass”. Marchetti A, Beltran V, Storme P, Nuyts G, Van Der Meeren L, Skirtach A, Otten E, Debulpaep M, Watteeuw L, De Wael K, Journal of cultural heritage 63, 179 (2023). http://doi.org/10.1016/J.CULHER.2023.07.018
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