|
Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
Links |
|
Eeckhaoudt, S.; van Vaeck, L.; Gijbels, R.; van Grieken, R.E. |
Laser microprobe mass spectrometry in biology and biomedicine |
1994 |
Scanning microscopy |
S8 |
|
UA library record |
|
|
Georgieva, V.; Bogaerts, A.; Gijbels, R. |
Numerical investigation of ion energy distribution functions in single and dual frequency capacitively coupled plasma reactors |
2004 |
Physical review : E : statistical physics, plasmas, fluids, and related interdisciplinary topics |
69 |
97 |
UA library record; WoS full record; WoS citing articles |
|
|
Georgieva, V.; Bogaerts, A.; Gijbels, R. |
Numerical study of Ar/CF4/N2 discharges in single and dual frequency capacitively coupled plasma reactors |
2003 |
Journal of applied physics |
94 |
90 |
UA library record; WoS full record; WoS citing articles |
|
|
Georgieva, V.; Bogaerts, A.; Gijbels, R. |
Particle-in-cell/Monte Carlo simulation of a capacitively coupled radio frequency Ar/Cf4 discharge: effect of gas composition |
2003 |
Journal of applied physics |
93 |
57 |
UA library record; WoS full record; WoS citing articles |
|
|
Geuens, I.; Gijbels, R.; Dekeyzer, R.; Verbeeck, A. |
Micro and surface analysis of individual silver halide microcrystals using a scanning ion microprobe |
1994 |
Papers |
|
|
UA library record; WoS full record; |
|
|
Geuens, I.; Gijbels, R.; Jacob, W. |
Depth profiling of silver halide microcrystals |
1991 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
The chemical characterization of silver halide microcrystals |
1993 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
Depth profiling of silver halide microcrystals |
1992 |
|
|
|
UA library record |
|
|
Geuens, I.; Gijbels, R.; Jacob, W.A.; Verbeeck, A.; de Keyzer, R. |
Analysis of silver halide microcrystals using different modes of a scanning transmission electron microscope and digital image processing |
1992 |
The journal of imaging science and technology |
36 |
10 |
UA library record; WoS full record; WoS citing articles |
|
|
Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
Application of neural networks in image analysis: the classification of geometrical shapes |
1993 |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
10 |
|
UA library record |
|
|
Geuens, I.; Nys, B.; Naudts, J.; Gijbels, R.; Jacob, W.; van Espen, P. |
The primary energy dependence of backscattered electron images up to 100 keV |
1991 |
Scanning microscopy |
5 |
3 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R. |
Chemical analysis in metal processing: overview and future needs in refined and ultrapure metals |
1991 |
Acta technica Belgica: metallurgie |
30 |
|
UA library record |
|
|
Gijbels, R. |
Development of a Fourier transform laser microprobe mass spectrometer with external ion source |
1993 |
ICR/Ion trap newsletter |
30 |
|
UA library record |
|
|
Gijbels, R. |
The many faces of TOF-SIMS for the characterization of solid (sub)surfaces |
2003 |
|
|
|
UA library record |
|
|
Gijbels, R. |
Oppervlakte en in-diepte analyse via SIMS, SNMS en GDMS |
1992 |
Physicalia magazine |
14 |
|
UA library record |
|
|
Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
|
|
Gijbels, R.; Bogaerts, A. |
Modeling of glow discharge ion sources for mass spectrometry: potentials and limitations |
1997 |
Spectroscopy |
9 |
|
UA library record |
|
|
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry: GDMS and other methods |
1997 |
Fresenius' journal of analytical chemistry |
359 |
5 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R.; Bogaerts, A. |
Recent trends in solids mass spectrometry, with special emphasis on glow discharge mass spectrometry |
1996 |
|
|
|
UA library record |
|
|
Gijbels, R.; Dams, R. |
Determination of silicon in natural and pollution aerosols by 14-MeV neutron activation analysis |
1973 |
Analytica chimica acta |
63 |
16 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R.; Oksenoid, K.G. |
Atomic mass spectrometry |
1995 |
|
|
|
UA library record |
|
|
Gijbels, R.; Oleshko, V. |
Scanning microanalysis |
1998 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R. |
Application of analytical methods for trace elements in geothermal waters : part 1 : Amélie-les-Bains (Eastern Pyrenees) |
1977 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R. |
Trace element geochemistry in thermal waters from the Eastern Pyrenees |
1985 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R.; Blommaert, W.; Van 't dack, L.; van Espen, P.; Nullens, H.; Saelens, R. |
Application of analytical methods for trace elements in geothermal waters : part 2 : Plombières, Bains-les-Bains, Bourbonne (Vosges) |
1983 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Application of trace element analysis to geothermal waters |
1977 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R.; Blommaert, W.; Vandelannoote, R.; Van 't dack, L. |
Trace element geochemistry in thermal waters from Plombières and Bains (Vosges) |
1980 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Grieken, R.; Vandelannoote, R.; Blommaert, W.; Van 't dack, L. |
Trace element geochemistry in thermal waters from Amélie-les-Bains (Eastern Pyrenees, France) |
1980 |
|
|
|
UA library record |
|
|
Gijbels, R.; van Straaten, M.; Bogaerts, A. |
Mass spectrometric analysis of inorganic solids: GDMS and other methods |
1995 |
Advances in mass spectrometry |
13 |
12 |
UA library record; WoS full record; WoS citing articles |
|
|
Gijbels, R.; Verlinden, G.; Geuens, I. |
SIMS/TOF-SIMS study of microparticles: surface analysis, imaging and quantification |
2000 |
|
|
|
UA library record; WoS full record; |
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