Author  |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Bontchev, R.; Darriet, B.; Darriet, J.; Weill, F.; Van Tendeloo, G.; Amelinckx, S. |
New cation deficient perovskite-like oxides in the system La4Ti3O12-LaTiO3 |
1993 |
European journal of solid state and inorganic chemistry |
30 |
19 |
UA library record; WoS full record; WoS citing articles |
| Bogaerts, R.; van Esch, A.; van Bockstal, L.; Herlach, F.; Peeters, F.M.; DeRosa, F.; Palmstrøm, C.J.; Allen, S.J. |
Experimental study of the energy band structure of Sc1-xErxAs layers in pulsed magnetic fields |
1993 |
Physica: B : condensed matter |
184 |
9 |
UA library record; WoS full record; WoS citing articles |
| Belmans, F.; Van Grieken, R.; Brügmann, L. |
Geochemical characterization of recent sediments in the Baltic Sea by bulk and electron microprobe analysis |
1993 |
Marine chemistry |
42 |
|
UA library record; WoS full record; WoS citing articles |
| Balzuweit, K.; Meekes, H.; Van Tendeloo, G.; de Boer, J.L. |
On the relationship between morphology, composition and structure of Al-Cu-Fe crystals and quasicrystals |
1993 |
Philosophical magazine: B: physics of condensed matter: electronic, optical and magnetic properties |
67 |
10 |
UA library record; WoS full record; WoS citing articles |
| Amelinckx, S.; Milat, O.; Van Tendeloo, G. |
Selective imaging of sublattices in complex structures |
1993 |
Ultramicroscopy |
51 |
8 |
UA library record; WoS full record; WoS citing articles |
| Adams, F.; Gijbels, R.; Van Grieken, R.; Dachang, Z. |
Inorganic mass spectrometry |
1993 |
|
|
|
UA library record |
| Adams, F.; Adriaens, A.; Berghmans, P.; Janssens, K. |
Surface microanalysis |
1993 |
Analytica chimica acta |
283 |
|
UA library record; WoS full record; WoS citing articles |
| Vanhellemont, J.; Maes, H.E.; Schaekers, M.; Armigliato, A.; Cerva, H.; Cullis, A.; de Sande, J.; Dinges, H.; Hallais, J.; Nayar, V.; Pickering, C.; Stehlé, J.L.; Van Landuyt, J.; Walker, C.; Werner, H.; Salieri, P.; |
Round-robin investigation of silicon-oxide on silicon reference materials for ellipsometry |
1993 |
Applied surface science
T2 – SYMP ON DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS ANALYSIS AND, FABRICATION PROCESS CONTROL, AT THE 1992 SPRING CONF OF THE EUROPEAN, MATERIALS RESEARCH SOC, JUN 02-05, 1992, STRASBOURG, FRANCE |
63 |
13 |
UA library record; WoS full record; WoS citing articles |
