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Author
Title
Year
Publication
Volume
Times cited
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de Witte, H.
;
Conard, T.
;
Vandervorst, W.
;
Gijbels, R.
Ion-bombardment artifact in TOF-SIMS analysis of ZrO
2
/SiO
2
/Si stacks
2003
Applied surface science
203
15
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;
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;
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