Home | << 1 >> |
Record | |||||
---|---|---|---|---|---|
Author | Ro, C.-U.; Oh, K.-Y.; Kim, H.K.; Chun, Y.; Van Grieken, R. | ||||
Title | Characterization of Asian dust using ultrathin window EPMA | Type | P3 Proceeding | ||
Year | 1999 | Publication | Abbreviated Journal | ||
Volume | Issue | Pages | |||
Keywords | P3 Proceeding; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | Publication Date | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Additional Links | UA library record | ||
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:55576 | Serial | 7617 | ||
Permanent link to this record |