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Author ![]() |
Markowicz, A.A.; Van Grieken, R.E. | ||||
Title | Atomic number correction in electron probe X-ray microanalysis of curved samples and particles | Type | A1 Journal article | ||
Year | 1984 | Publication | Analytical chemistry | Abbreviated Journal | |
Volume | 56 | Issue | 14 | Pages | 2798-2801 |
Keywords | A1 Journal article; AXES (Antwerp X-ray Analysis, Electrochemistry and Speciation) | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Wos | A1984TU34600040 | Publication Date | 2005-03-08 | |
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | 0003-2700; 5206-882x | ISBN | Additional Links | UA library record; WoS full record; WoS citing articles | |
Impact Factor | Times cited | Open Access | |||
Notes | Approved | no | |||
Call Number | UA @ admin @ c:irua:116519 | Serial | 7535 | ||
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