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Cross-section transmission electron microscopy characterization of the near-surface structure of medical Nitinol superelastic tubing”. Potapov PL, Tirry W, Schryvers D, Sivel VGM, Wu M-Y, Aslanidis D, Zandbergen H, Journal of materials science: materials in medicine 18, 483 (2007). http://doi.org/10.1007/s10856-007-2008-y
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Micro-analytical characterisation of radioactive heterogeneities in samples from Central Asian TENORM sites”. Lind OC, de Nolf W, Janssens K, Salbu B, Journal of environmental radioactivity 123, 63 (2013). http://doi.org/10.1016/J.JENVRAD.2012.02.012
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Solid state speciation and potential bioavailability of depleted uranium particles from Kosovo and Kuwait”. Lind OC, Salbu B, Skipperud L, Janssens K, Jaroszewicz J, de Nolf W, Journal of environmental radioactivity 100, 301 (2009). http://doi.org/10.1016/J.JENVRAD.2008.12.018
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Characterization of uranium and plutonium containing particles originating from the nuclear weapons accident in Thule, Greenland, 1968”. Lind OC, Salbu B, Janssens K, Proost K, Dahlgaard H, Journal of environmental radioactivity 81, 21 (2005). http://doi.org/10.1016/J.JENVRAD.2004.10.013
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Oxidation states of uranium in depleted uranium particles from Kuwait”. Salbu B, Janssens K, Lind OC, Proost K, Gijsels L, Danesi PR, Journal of environmental radioactivity 78, 125 (2004). http://doi.org/10.1016/J.JENVAD.2004.04.001
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Oxidation states of uranium in DU particles from Kosovo”. Salbu B, Janssens K, Lind OC, Proost K, Danesi PR, Journal of environmental radioactivity 64, 167 (2003). http://doi.org/10.1016/S0265-931X(02)00047-4
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Effect of interface evolution on thermal conductivity of vacuum hot pressed SiC/Al composites”. Chen Z, Tan Z, Ji G, Schryvers D, Ouyang Q, Li Z, Advanced engineering materials 17, 1076 (2015). http://doi.org/10.1002/adem.201400412
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Influence of the deposition method, temperature and deposition time on the corrosion inhibition of lead dodecanoate coatings deposited on lead surfaces”. De Keersmaecker M, De Wael K, Adriaens A, Journal of solid state electrochemistry 17, 1259 (2013). http://doi.org/10.1007/S10008-012-1964-4
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Electrochemical deposition of a copper carboxylate layer on copper as potential corrosion inhibitor”. Elia A, De Wael K, Dowsett M, Adriaens A, Journal of solid state electrochemistry 16, 143 (2011). http://doi.org/10.1007/S10008-010-1283-6
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RAMS and WRF sensitivity to grid spacing in large-eddy simulations of the dry convective boundary layer”. Ercolani G, Gorle C, Garcia Sánchez C, Corbari C, Mancini M, Computers and fluids 123, 54 (2015). http://doi.org/10.1016/j.compfluid.2015.09.009
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The reduction of the substitutional C content in annealed Si/SiGeC superlattices studied by dark-field electron holography”. Denneulin T, Rouvière JL, Béché, A, Py M, Barnes JP, Rochat N, Hartmann JM, Cooper D, Semiconductor science and technology 26, 1 (2011). http://doi.org/10.1088/0268-1242/26/12/125010
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Klein tunneling in single and multiple barriers in graphene”. Pereira JM, Peeters FM, Chaves A, Farias GA, Semiconductor science and technology 25, 033002 (2010). http://doi.org/10.1088/0268-1242/25/3/033002
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Driven spin transitions in fluorinated single- and bilayer-graphene quantum dots”. Zebrowski DP, Peeters FM, Szafran B, Semiconductor science and technology 32, 065016 (2017). http://doi.org/10.1088/1361-6641/AA6DF4
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Strain measurement in semiconductor FinFET devices using a novel moiré, demodulation technique”. Prabhakara V, Jannis D, Béché, A, Bender H, Verbeeck J, Semiconductor science and technology (2019). http://doi.org/10.1088/1361-6641/ab5da2
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Phase offset method of ptychographic contrast reversal correction”. Hofer C, Gao C, Chennit T, Yuan B, Pennycook TJ, Ultramicroscopy , 113922 (2024). http://doi.org/10.1016/j.ultramic.2024.113922
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Atom counting from a combination of two ADF STEM images”. Şentürk DG, Yu CP, De Backer A, Van Aert S, Ultramicroscopy 255, 113859 (2024). http://doi.org/10.1016/j.ultramic.2023.113859
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Element specific atom counting for heterogeneous nanostructures: Combining multiple ADF STEM images for simultaneous thickness and composition determination”. Şentürk DG, De Backer A, Van Aert S, Ultramicroscopy 259, 113941 (2024). http://doi.org/10.1016/j.ultramic.2024.113941
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On central focusing for contrast optimization in direct electron ptychography of thick samples”. Gao C, Hofer C, Pennycook TJ, Ultramicroscopy 256, 113879 (2024). http://doi.org/10.1016/J.ULTRAMIC.2023.113879
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Ionization and neutral gas heating efficiency in radio frequency electrothermal microthrusters : the role of driving frequency”. Leigh S, Doyle SJ, Smith GJ, Gibson AR, Boswell RW, Charles C, Dedrick JP, Physics of plasmas 31, 023509 (2024). http://doi.org/10.1063/5.0172646
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Reliable phase quantification in focused probe electron ptychography of thin materials”. Hofer C, Pennycook TJ, Ultramicroscopy 254, 113829 (2023). http://doi.org/10.1016/j.ultramic.2023.113829
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A decade of atom-counting in STEM: From the first results toward reliable 3D atomic models from a single projection”. De Backer A, Bals S, Van Aert S, Ultramicroscopy , 113702 (2023). http://doi.org/10.1016/j.ultramic.2023.113702
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Fast generation of calculated ADF-EDX scattering cross-sections under channelling conditions”. Zhang Z, Lobato I, De Backer A, Van Aert S, Nellist P, Ultramicroscopy 246, 113671 (2023). http://doi.org/10.1016/j.ultramic.2022.113671
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Real-time simulations of ADF STEM probe position-integrated scattering cross-sections for single element fcc crystals in zone axis orientation using a densely connected neural network”. Lobato I, De Backer A, Van Aert S, Ultramicroscopy 251, 113769 (2023). http://doi.org/10.1016/j.ultramic.2023.113769
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Characterization of a Timepix detector for use in SEM acceleration voltage range”. Denisov N, Jannis D, Orekhov A, Müller-Caspary K, Verbeeck J, Ultramicroscopy 253, 113777 (2023). http://doi.org/10.1016/j.ultramic.2023.113777
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Convexity constraints on linear background models for electron energy-loss spectra”. Van den Broek W, Jannis D, Verbeeck J, Ultramicroscopy 254, 113830 (2023). http://doi.org/10.1016/j.ultramic.2023.113830
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Follow-up of solid-state fungal wood pretreatment by a novel near-infrared spectroscopy-based lignin calibration model”. Wittner N, Gergely S, Slezsák J, Broos W, Vlaeminck SE, Cornet I, Journal of microbiological methods 208, 106725 (2023). http://doi.org/10.1016/J.MIMET.2023.106725
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Evaluation of different rectangular scan strategies for STEM imaging”. Velazco A, Nord M, Béché, A, Verbeeck J, Ultramicroscopy , 113021 (2020). http://doi.org/10.1016/j.ultramic.2020.113021
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Atom column detection from simultaneously acquired ABF and ADF STEM images”. Fatermans J, den Dekker Aj, Müller-Caspary K, Gauquelin N, Verbeeck J, Van Aert S, Ultramicroscopy 219, 113046 (2020). http://doi.org/10.1016/j.ultramic.2020.113046
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HAADF-STEM block-scanning strategy for local measurement of strain at the nanoscale”. Prabhakara V, Jannis D, Guzzinati G, Béché, A, Bender H, Verbeeck J, Ultramicroscopy 219, 113099 (2020). http://doi.org/10.1016/j.ultramic.2020.113099
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Hidden Markov model for atom-counting from sequential ADF STEM images: Methodology, possibilities and limitations”. De wael A, De Backer A, Van Aert S, Ultramicroscopy 219, 113131 (2020). http://doi.org/10.1016/j.ultramic.2020.113131
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