Number of records found: 3074
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Superconducting ceramics”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
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Superconducting mesoscopic square loops: phase boundaries and magnetization”. Devreese JT, Fomin VM, Misko VR, Moshchalkov VV, 1/2, 33 (1998)
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Superconductivity in the quantum-size regime”. Shanenko AA, Croitoru MD, Peeters FM, , 79 (2008)
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Synthesis and characterization of nanocrystal zeolite/mesoporous matrix composite material”. Gagea BC, Liang D, Van Tendeloo G, Martens JA, Jacobs PA, Studies in surface science and catalysis 162, 259 (2006). http://doi.org/10.1016/S0167-2991(06)80915-8
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Synthesis and charactreization of the new Ln(2)FeMoO(7) (Ln = Y, Dy, Ho) compounds”. Veith GM, Lobanov MV, Emge TJ, Greenblatt M, Croft M, Stowasser F, Hadermann J, Van Tendeloo G, Journal of materials chemistry 14, 1623 (2004). http://doi.org/10.1039/b315028c
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Synthesis and crystal structure of novel CaRMnSnO6(R = La, Pr, Nd, Sm-Dy) double perovskites”. Abakumov AM, Rossell MD, Seryakov SA, Rozova MG, Markina MM, Van Tendeloo G, Antipov EV, Journal of materials chemistry 15, 4899 (2005). http://doi.org/10.1039/b510242a
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Synthesis and crystal structure of the Sr2Al1.07Mn0.93O5 brownmillerite”. Hadermann J, Abakumov AM, d' Hondt H, Kalyuzhnaya AS, Rozova MG, Markina MM, Mikheev MG, Tristan N, Klingeler R, Büchner B, Antipov EV, Journal of materials chemistry 17, 692 (2007). http://doi.org/10.1039/b614168d
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Synthesis and structure determination of ferromagnetic semiconductors LaAMnSnO6(A = Sr, Ba)”. Yang T, Perkisas T, Hadermann J, Croft M, Ignatov A, Van Tendeloo G, Greenblatt M, Journal of materials chemistry 21, 199 (2011). http://doi.org/10.1039/c0jm02614j
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A technique for the sp2/sp3 characterization of carbon materials”. Titantah JT, Lamoen D, Physica status solidi: A: applied research 201, 2492 (2004). http://doi.org/10.1002/pssa.200405176
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TEM of nanostructured materials”. Van Tendeloo G, Pauwels B, Geuens P, Lebedev O, , 3 (2000)
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TEM of phase transitions in tridymite and cristobalite based materials”. Van Tendeloo G, Microscoy and microanalysis 6 (2000)
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TEM studies of processed Si device materials”. Vanhellemont J, Bender H, van Landuyt J, Conference series of the Institute of Physics 157, 393 (1997)
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Wang B (2011) TEM study of plasticity mechanisms in metals : nanocrystalline Al Pd thin films and bulk bcc Nb. Antwerpen
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TEM study of the mechanism of Ni ion release from Nitinol wires with original oxides”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, , 05027 (2009). http://doi.org/10.1051/esomat/200905027
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TEM study on precipitation behavior in Cu-Co alloys”. Takeda M, Suzuki N, Shinohara G, Endo T, van Landuyt J, Physica status solidi: A: applied research 168, 27 (1998). http://doi.org/10.1002/(SICI)1521-396X(199807)168:1<27::AID-PSSA27>3.0.CO;2-S
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Een tempel voor elektronenmicroscopie “kijken naar atomen””. van Landuyt J, Fonds informatief 38, 13 (1998)
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KSm(MoO4)2, an incommensurately modulated and partially disordered scheelite-like structure”. Arakcheeva A, Pattison P, Chapuis G, Rossell M, Filaretov A, Morozov V, Van Tendeloo G, Acta crystallographica: section B: structural science 64, 160 (2008). http://doi.org/10.1107/S0108768108001870
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La2MnVO6 double perovskite: a structural, magnetic and X-ray absorption investigation”. Mandal TK, Croft M, Hadermann J, Van Tendeloo G, Stephens PW, Greenblatt M, Journal of materials chemistry 19, 4382 (2009). http://doi.org/10.1039/b823513a
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Ni4Ti3 precipitates and their influence on the surrounding NiTi matrix”. Schryvers D, Tirry W, Yang Z, , 205 (2005)
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The analysis of macrotwins in NiAl martensite”. Ball JM, Schryvers D, Journal de physique: 4 T2 –, 10th International Conference on Martensitic Transformations, JUN 10-14, 2002, ESPOO, FINLAND 112, 159 (2003). http://doi.org/10.1051/jp4:2003855
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The effect of Y2O3 and YFeO3 additions on the critical current density of YBCO coated conductors”. Lao M, Eisterer M, Stadel O, Meledin A, Van Tendeloo G, 1-4 (2014). http://doi.org/10.1088/1742-6596/507/2/022012
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The influence of the precipitation method on defect formation in multishell AgBrI (111) tabular crystals”. Van Renterghem W, Karthauser S, Schryvers D, van Landuyt J, De Keyzer R, Van Roost C, , 167 (2000)
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Thermally induced atomic reconstruction of PbSe/CdSe core/shell quantum dots into PbSe/CdSe bi-hemisphere hetero-nanocrystals”. Grodzinska D, Pietra F, van Huis MA, Vanmaekelbergh D, de Mello Donegá, C, Journal of materials chemistry 21, 11556 (2011). http://doi.org/10.1039/c0jm04458j
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Three-dimensional reconstruction of a nanoparticle at atomic resolution”. Batenburg J, Van Aert S, ERCIM news 86, 52 (2011)
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Multiscale investigation of quasi-brittle fracture characteristics in a 9Cr–1Mo ferritic–martensitic steel embrittled by liquid lead–bismuth under low cycle fatigue”. Gong X, Marmy P, Volodin A, Amin-Ahmadi B, Qin L, Schryvers D, Gavrilov S, Stergar E, Verlinden B, Wevers M, Seefeldt M, Corrosion science 102, 137 (2016). http://doi.org/10.1016/j.corsci.2015.10.003
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Tomography using annular dark field imaging in TEM”. Bals S, Kisielowski C, Croitoru M, Van Tendeloo G, Microscopy and microanalysis 11, 2118 (2005)
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Transmission electron microscopy characterisation of Ti and Al/Ti contacts on GaN and AlGaN/GaN”. van Daele B, Van Tendeloo G, Ruythooren W, Derluyn J, Leys MR, Germain M, Springer proceedings in physics 107, 389 (2005)
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Transmission electron microscopy on interface engineered superconducting thin films”. Bals S, Van Tendeloo G, Rijnders G, Huijben M, Leca V, Blank DHA, IEEE transactions on applied superconductivity 13, 2834 (2003). http://doi.org/10.1109/TASC.2003.812023
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Transmission electron microscopy study of low-hysteresis shape memory alloys”. Delville R, James RD, Salman U, Finel A, Schryvers D, , 02005 (2009). http://doi.org/10.1051/esomat/200902005
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Transmission electron microscopy study of microstructural evolution in nanograined Ni-Ti microwires heat treated by electric pulse”. Delville R, Malard B, Pilch J, Sittner P, Schryvers D, Diffusion and defect data : solid state data : part B : solid state phenomena 172/174, 682 (2011). http://doi.org/10.4028/www.scientific.net/SSP.172-174.682
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