Number of records found: 3074
 | 
Citations
 | 
   web
HRTEM studies of dislocations in cubic BN”. Nistor LC, Van Tendeloo G, Dincã, G, Physica status solidi: A: applied research 201, 2578 (2004). http://doi.org/10.1002/pssa.200405192
toggle visibility
HRTEM study of austenite and martensite in splat-cooled and nanoscale thin film Ni-Al”. Schryvers D, Yandouzi M, Holland-Moritz D, Toth L, Journal de physique: 4 C5, 203 (1997). http://doi.org/10.1051/jp4:1997532
toggle visibility
Identification of new superconducting compounds by electron microscopy”. Van Tendeloo G, Krekels T Cambridge University Press, Cambridge, page 161 (2000).
toggle visibility
Sarmadian N (2015) Identification of thin-film photovoltaic cell materials based on high-throughput first-principles calculations. Antwerpen
toggle visibility
Improvement of the oxidation stability and the mechanical properties of flexible graphite foil by boron oxide impregnation”. Savchenko DV, Serdan AA, Morozov VA, Van Tendeloo G, Ionov SG, New carbon materials 27, 12 (2012). http://doi.org/10.1016/S1872-5805(12)60001-8
toggle visibility
In-situ HREM irradiation study of point defect clustering in strained GexSi1-x/(001)Si heterostructure”. Fedina L, Lebedev OI, Van Tendeloo G, van Landuyt J, Conference series of the Institute of Physics 157, 55 (1997)
toggle visibility
The influence of crystal thickness on the image tone”. van Renterghem W, Schryvers D, van Landuyt J, van Roost C, de Keyzer R, Journal of imaging science 47, 133 (2003)
toggle visibility
Influence of oxygen content on the charge-ordering process in La0.5Ca0.5MnO3”. Schuddinck W, Van Tendeloo G, Martin C, Hervieu M, Raveau B s.l., page 199 (2000).
toggle visibility
Intrinsic point defect clustering in Si: a study by HVEM and HREM in situ electron irradiation”. Fedina L, Gutakovskii A, Aseev A, van Landuyt J, Vanhellemont J Kluwer Academic, s.l., page 63 (1997).
toggle visibility
Investigation of stacking disorder in Li2SnO3”. Tarakina NV, Denisova TA, Maksimova LG, Baklanova YV, Tyutyunnik AP, Berger IF, Zubkov VG, Van Tendeloo G, Zeitschrift für Kristallographie , 375 (2009). http://doi.org/10.1524/zksu.2009.0055
toggle visibility
Investigation of the elementary mechanisms controlling dislocation/twin boundary interactions in fcc metals and alloys : from conventional to advanced TEM characterization”. Idrissi H, Schryvers D Formatex Research Center, S.l., page 1213 (2012).
toggle visibility
Klassieke toetsing in de praktijk”. Bals S, Stes A, Celis V LannooCampus, Leuven, page 211 (2009).
toggle visibility
Large scale synthesis of carbon nanotubes and their composite materials”. Nagy JB, Fonseca A, Pierard N, Willems I, Bister G, Pirlot C, Demortier A, Delhalle J, Mekhalif Z, Niesz K, Bossuot C, Pirard J-P, Biró, LP, Konya Z, Colomer J-F, Van Tendeloo G, Kiricsi I, (2001)
toggle visibility
Laser thermotreatment of the SnO2layers”. Rembeza SI, Loginov VA, Svistova TV, Podkopaeva OI, Rembeza ES, van Landuyt J, Eurosensors XII, vols 1 and 2 , 481 (1998)
toggle visibility
Lattice deformations at martensite-martensite interfaces in Ni-Al”. Schryvers D, Boullay P, Kohn R, Ball J, Journal de physique: 4 11, 23 (2001). http://doi.org/10.1051/jp4:2001804
toggle visibility
Layered structures accomodating stoichiometry in M2X2O7 systems, as seen by diffraction and HREM”. Nihoul G, Leroux C, Cesari C, Van Tendeloo G, Electron microscopy: vol. 2 , 295 (1998)
toggle visibility
The local structure of YBCO based materials by TEM”. Van Tendeloo G, Lebedev OI, Verbist K, Abakumov AM, Shpanchenko RV, Antipov EV, Blank DHA Kluwer Academic, Dordrecht, page 11 (1999).
toggle visibility
Roose D (2015) Magnetic resonance imaging and electron microscopy of iron oxide particles in the brain. Universiteit Antwerpen, Faculteit Farmaceutische, Biomedische en Diergeneeskundige Wetenschappen, Departement Biomedische Wetenschappen, Antwerpen
toggle visibility
Martensitic transformations studied on nano- and microscopic length scales”. Schryvers D, Boullay P, Potapov P, Satto C, Festkörperprobleme 40, 375 (2000)
toggle visibility
Measurement of the mean inner potential of ZnO nanorods by transmission electron holography”. Müller E, Kruse P, Gerthsen D, Schowalter M, Rosenauer A, Lamoen D, Kling R, Microscopy of Semiconducting Materials 107SPRINGER PROCEEDINGS IN PHYSICS, 303 (2005)
toggle visibility
Meer zien met onzichtbaar licht”. Van Aert S, Karakter : tijdschrift van wetenschap 18, 19 (2007)
toggle visibility
Mesoseopic ordering in the 0.9 Pb(Mg1/3Nb2/3)O3-0.1 PbTiO3 relaxor ferroelectric : a HRTEM study”. Nistor LC, Ghica C, Van Tendeloo G, Physica status solidi: C: conferences and critical reviews 4, 736 (2007). http://doi.org/10.1002/pssc.200673753
toggle visibility
Metals and alloys”. de Hosson JTM, Van Tendeloo G Vch, Weinheim, page 1 (1997).
toggle visibility
Metals and alloys: 2: phase transformations”. Schryvers D, Van Tendeloo G Vch, Weinheim, page 80 (1997).
toggle visibility
La microscopie électronique à, transmission (MET) et son utilisation dans l'étude d'inclusions nano-cristallines dans le verre”. Fredrickx P, Schryvers D, L'archéométrie au service des monuments et des oeuvres d'art 10, 131 (2002)
toggle visibility
Microscopy of gemmological materials”. van Landuyt J, van Bockstael MHG, van Royen J Vch, Weinheim, page 293 (1997).
toggle visibility
Microstructural investigation of a La1.9Sr0.1CuO4 thin film grown by MBE under a large compressive strain”. Seo JW, Perret J, Fompeyrine J, Loquet J-P, Van Tendeloo G, Electron microscopy: vol. 2 , 287 (1998)
toggle visibility
Microstructural investigation of La1.9Sr0.1CuO4 thin film grown by MBE”. Seo JW, Perret J, Fompeyrine J, Van Tendeloo G, Loquet J-P s.l., page 300 (1998).
toggle visibility
A microstructural study of the thermal stability of atomic layer deposited Al2O3 thin films”. Nistor LC, Richard O, Zhao O, Bender H, Stesmans A, Van Tendeloo G, Institute of physics conference series T2 –, Microscopy of semiconducting materials , 397 (2003)
toggle visibility
Microstructure and phase transitions in Pb(Sc0.5Ta0.5)O3”. Lemmens H, Richard O, Van Tendeloo G, Bismayer U, Journal of electron microscopy 48, 843 (1999). http://doi.org/10.1093/oxfordjournals.jmicro.a023756
toggle visibility