Number of records found: 7465
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Two-dimensional model of a direct current glow discharge : description of the argon metastable atoms, sputtered atoms and ions”. Bogaerts A, Gijbels R, Analytical chemistry 68, 2676 (1996). http://doi.org/10.1021/ac951206z
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Two-dimensional model of a direct current glow discharge: description of the electrons, argon ions and fast argon atoms”. Bogaerts A, Gijbels R, Goedheer WJ, Analytical chemistry 68, 2296 (1996). http://doi.org/10.1021/ac9510651
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Two-dimensional tunneling through magnetic barriers”. Matulis A, Peeters FM, Vasilopoulos P, Surface science : a journal devoted to the physics and chemistry of interfaces 305, 434 (1994). http://doi.org/10.1016/0039-6028(94)90931-8
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Two electron quantum disks”. Peeters FM, Schweigert VA, Physical review : B : condensed matter and materials physics 53, 1468 (1996). http://doi.org/10.1103/PhysRevB.53.1468
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Two phase intergrowth in Bi2Sr2Ca0.6Y0.4Cu2Oy single crystals”. Zhang XF, Van Tendeloo G, Ge SL, Emmen JHPM, Brabers VAM, Physica: C : superconductivity 215, 39 (1993). http://doi.org/10.1016/0921-4534(93)90362-T
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Up close: Center for Electron Microscopy of Materials Science at the University of Antwerp”. Van Tendeloo G, Schryvers D, van Dyck D, van Landuyt J, Amelinckx S, MRS bulletin , 57 (1994)
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Warm-electron transport in a two-dimensional semiconductor”. Xu W, Peeters FM, Devreese JT, Semiconductor science and technology 7, 1251 (1992)
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Wavevector-dependent tunneling through magnetic barriers”. Matulis A, Peeters FM, Vasilopoulos P, Physical review letters 72, 1518 (1994). http://doi.org/10.1103/PhysRevLett.72.1518
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A facile synthesis of Ag@PdAg core-shell architecture for efficient purification of ethene feedstock”. Ma R, He Y, Feng J, Hu Z-Y, Van Tendeloo G, Li D, Journal of catalysis 369, 440 (2019). http://doi.org/10.1016/J.JCAT.2018.11.037
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A spatial approach to identify priority areas for pesticide pollution mitigation”. Quaglia G, Joris I, Broekx S, Desmet N, Koopmans K, Vandaele K, Seuntjens P, Journal of environmental management 246, 583 (2019). http://doi.org/10.1016/J.JENVMAN.2019.04.120
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A general-purpose interface between fortran and the low-level functions of the ibm-pc”. Janssens K, van Espen P, Trends in analytical chemistry 7, 128 (1988). http://doi.org/10.1016/0165-9936(88)87009-2
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Accurate evaluation of \mu-PIXE and \mu-XRF spectral data through iterative least squares fitting”. Janssens K, Vekemans B, Adams F, van Espen P, Mutsaers P, Nuclear instruments and methods in physics research: B: beam interactions with materials and atoms T2 –, 7th International Conference on Particle Induced X-ray Emission and Its Analytical Applications, MAY 26-30, 1995, Abano Terme, Italy 109, 179 (1996). http://doi.org/10.1016/0168-583X(95)01211-7
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Analysis of X-ray spectra by iterative least squares (AXIL): new developments”. Vekemans B, Janssens K, Vincze L, Adams F, van Espen P, X-ray spectrometry 23, 278 (1994). http://doi.org/10.1002/XRS.1300230609
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AXIL-PC, software for the analysis of complex-x-ray spectra”. van Espen P, Janssens K, Nobels J, Chemometrics and intelligent laboratory systems 1, 109 (1986). http://doi.org/10.1016/0169-7439(86)80031-4
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The elemental composition of airborne particulate matter in the Atacama desert, Chile”. Rojas CM, Figueroa L, Janssens KH, Van Espen PE, Adams FC, Van Grieken RE, The science of the total environment 91, 251 (1990). http://doi.org/10.1016/0048-9697(90)90302-B
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Evaluation of energy-dispersive x-ray-spectra with the aid of expert systems”. Janssens K, van Espen P, Analytica chimica acta 191, 169 (1986). http://doi.org/10.1016/S0003-2670(00)86306-0
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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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A general Monte-Carlo simulation of energy-dispersive X-ray fluorescence spectrometers : 1 : unpolarized radiation, homogenious samples”. Vincze L, Janssens K, Adams F, Spectrochimica acta: part B : atomic spectroscopy 48, 553 (1993). http://doi.org/10.1016/0584-8547(93)80060-8
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Implementation of an expert system for the qualitative interpretation of x-ray-fluorescence spectra”. Janssens K, van Espen P, Analytica chimica acta 184, 117 (1986). http://doi.org/10.1016/S0003-2670(00)86475-2
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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A micro XRF spectrometer based on rotating anode generator and capillary optics”. Janssens K, Vekemans B, Vincze L, Adams F, Rindby A, Spectrochimica acta: part B : atomic spectroscopy 51, 1661 (1996)
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Optics for X-ray microfluorescence to be used at the European synchrotron radiation facility”. Vincze L, Janssens K, Adams F, Advances in X-ray analysis 37, 553 (1994)
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PC-MCA : a software package for the acquisition and processing of spectral data”. Janssens K, Nobels J, van Espen P, Chemometrics and intelligent laboratory systems 3, 335 (1988). http://doi.org/10.1016/0169-7439(88)80033-9
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Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble)”. van Langevelde F, Janssens KH, Adams FC, Vis RD, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 317, 383 (1992). http://doi.org/10.1016/0168-9002(92)90632-E
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Special issue on Microscopic and ultratrace x-ray fluorescence analysis: 2”. Janssens K, Journal of trace and microprobe techniques 14, 461 (1996)
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Surface microanalysis”. Adams F, Adriaens A, Berghmans P, Janssens K, Analytica chimica acta 283, 19 (1993). http://doi.org/10.1016/0003-2670(93)85207-Z
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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