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Study of changes in composition and EELS ionization edges upon Ni4Ti3 precipitation in a NiTi alloy”. Yang Z, Schryvers D, Micron 37, 503 (2006). http://doi.org/10.1016/j.micron.2005.08.002
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Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach”. Samaeeaghmiyoni V, Idrissi H, Groten J, Schwaiger R, Schryvers D, Micron 94, 66 (2017). http://doi.org/10.1016/j.micron.2016.12.005
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Crack initiation in tapered high Si stainless steel specimens : stress threshold analyses”. Penders A, Konstantinovic MJ, Bosch RW, Schryvers D, Corrosion Engineering Science And Technology , 1 (2020). http://doi.org/10.1080/1478422X.2020.1785651
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Intergrowth of components and ramps in coffin-shaped ZSM-5 zeolite crystals unraveled by focused ion beam-assisted transmission electron microscopy”. Lu J, Roeffaers MBJ, Bartholomeeusen E, Sels BF, Schryvers D, Microscopy and microanalysis 20, 42 (2014). http://doi.org/10.1017/S1431927613013731
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Optimal sample preparation to characterize corrosion in historical photographs with analytical TEM”. Grieten E, Caen J, Schryvers D, Microscopy and microanalysis 20, 1585 (2014). http://doi.org/10.1017/S1431927614012860
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Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films : an electron tomography and aberration-corrected high-resolution ADF-STEM study”. Idrissi H, Turner S, Mitsuhara M, Wang B, Hata S, Coulombier M, Raskin J-P, Pardoen T, Van Tendeloo G, Schryvers D, Microscopy and microanalysis 17, 983 (2011). http://doi.org/10.1017/S143192761101213X
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Microstructure of surface and subsurface layers of a Ni-Ti shape memory microwire”. Tian H, Schryvers D, Shabalovskaya S, van Humbeeck J, Microscopy and microanalysis 15, 62 (2009). http://doi.org/10.1017/S1431927609090059
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High-quality sample preparation by low kV FIB thinning for analytical TEM measurements”. Bals S, Tirry W, Geurts R, Yang Z, Schryvers D, Microscopy and microanalysis 13, 80 (2007). http://doi.org/10.1017/S1431927607070018
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Melamine–Formaldehyde Microcapsules: Micro- and Nanostructural Characterization with Electron Microscopy”. Heidari H, Rivero G, Idrissi H, Ramachandran D, Cakir S, Egoavil R, Kurttepeli M, Crabbé, AC, Hauffman T, Terryn H, Du Prez F, Schryvers D, Microscopy and microanalysis 22, 1222 (2016). http://doi.org/10.1017/S1431927616012484
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Effect of deposition rate on the microstructure of electron beam evaporated nanocrystalline palladium thin films”. Amin-Ahmadi B, Idrissi H, Galceran M, Colla MS, Raskin JP, Pardoen T, Godet S, Schryvers D, Thin solid films : an international journal on the science and technology of thin and thick films 539, 145 (2013). http://doi.org/10.1016/j.tsf.2013.05.083
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TEM study of B2 + L12 decomposition in a nanoscale Ni-rich Ni-Al film”. Schryvers D, Yandouzi M, Toth L, Thin solid films : an international journal on the science and technology of thin and thick films 326, 126 (1998). http://doi.org/10.1016/S0040-6090(98)00545-8
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Precipitation behaviors in Ti-2.3 Wt Pct Cu alloy during isothermal and two-step aging”. Akamine H, Mitsuhara M, Nishida M, Samaee V, Schryvers D, Tsukamoto G, Kunieda T, Fujii H, Metallurgical And Materials Transactions A-Physical Metallurgy And Materials Science 52, 2760 (2021). http://doi.org/10.1007/S11661-021-06265-X
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Reclaiming the image of daguerreotypes: Characterization of the corroded surface before and after atmospheric plasma treatment”. Grieten E, Schalm O, Tack P, Bauters S, Storme P, Gauquelin N, Caen J, Patelli A, Vincze L, Schryvers D, Journal of cultural heritage (2017). http://doi.org/10.1016/j.culher.2017.05.008
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Defects and growth mechanisms of AgCl(100) tabular crystals”. van Renterghem W, Goessens C, Schryvers D, van Landuyt J, Verrept P, Bollen D, van Roost C, de Keyzer R, Journal of crystal growth 187, 410 (1998). http://doi.org/10.1016/S0022-0248(98)00004-9
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Electron microscopical investigation of tetrahedral-shaped AgBr microcrystals”. Goessens C, Schryvers D, van Landuyt J, de Keyzer R, Journal of crystal growth 172, 426 (1997)
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Critical assessments and thermodynamic modeling of BaO-SiO2 and SiO2-TiO2 systems and their extensions into liquid immiscibility in the BaO-SiO2-TiO2 system”. Boulay E, Nakano J, Turner S, Idrissi H, Schryvers D, Godet S, Calphad computer coupling of phase diagrams and thermochemistry 47, 68 (2014). http://doi.org/10.1016/j.calphad.2014.06.004
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Characterization of nickel silicides using EELS-based methods”. Verleysen E, Bender H, Richard O, Schryvers D, Vandervorst W, Journal of microscopy 240, 75 (2010). http://doi.org/10.1111/j.1365-2818.2010.03391.x
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Optimization of a FIB/SEM slice-and-view study of the 3D distribution of Ni4Ti3 precipitates in NiTi”. Cao S, Tirry W, van den Broek W, Schryvers D, Journal of microscopy 233, 61 (2009). http://doi.org/10.1111/j.1365-2818.2008.03095.x
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Demonstration of lanthanum in liver cells by energy-dispersive X-ray spectroscopy, electron energy loss spectroscopy and high-resolution transmission electron microscopy”. Yang Z, Schryvers D, Roels F, d' Haese PC, de Broe ME, Journal of microscopy 223, 133 (2006). http://doi.org/10.1111/j.1365-2818.2006.01601.x
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Study of changes in L32 EELS ionisation edges upon formation of Ni-based intermetallic compounds”. Potapov PL, Kulkova SE, Schryvers D, Journal of microscopy 210, 102 (2003). http://doi.org/10.1046/j.1365-2818.2003.01176.x
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TEM and AES investigations of the natural surface nano-oxide layer of an AISI 316L stainless steel microfibre”. Ramachandran D, Egoavil R, Crabbe A, Hauffman T, Abakumov A, Verbeeck J, Vandendael I, Terryn H, Schryvers D, Journal of microscopy 264, 207 (2016). http://doi.org/10.1111/jmi.12434
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Internal architecture of coffin-shaped ZSM-5 zeolite crystals with hourglass contrast unravelled by focused ion beam-assisted transmission electron microscopy: INTERNAL ARCHITECTURE OF COFFIN-SHAPED”. Lu J, Bartholomeeusen E, Sels BF, Schryvers D, Journal of microscopy 265, 27 (2017). http://doi.org/10.1111/jmi.12459
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ALPHABETA: a dedicated open-source tool for calculating TEM stage tilt angles”. Cautaerts N, Delville R, Schryvers D, Journal of microscopy 273, 189 (2019). http://doi.org/10.1111/jmi.12774
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Lattice deformations in quasi-dynamic strain glass visualised and quantified by aberration corrected electron microscopy”. Lu J, Martinez GT, Van Aert S, Schryvers D, Physica status solidi: B: basic research 251, 2034 (2014). http://doi.org/10.1002/pssb.201350351
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Review on TEM analysis of growth twins in nanocrystalline palladium thin films : toward better understanding of twin-related mechanisms in high stacking fault energy metals”. Idrissi H, Amin-Ahmadi B, Wang B, Schryvers D, Physica status solidi: B: basic research 251, 1111 (2014). http://doi.org/10.1002/pssb.201350161
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Structure refinement of L21 Cu-Zn-Al austenite, using dynamical electron diffraction data”. Satto S, Jansen J, Lexcellent C, Schryvers D, Solid state communications 116, 273 (2000). http://doi.org/10.1016/S0038-1098(00)00316-1
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Landscape roughness at an atomic scale”. Van Tendeloo G, De Meulenaere P, Schryvers D, Physica: D : nonlinear phenomena 107, 401 (1997). http://doi.org/10.1016/S0167-2789(97)00108-5
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TEM investigation of the formation mechanism of deformation twins in Fe-Mn-Si-Al TWIP steels”. Idrissi H, Renard K, Schryvers D, Jacques PJ, Philosophical magazine 93, 4378 (2013). http://doi.org/10.1080/14786435.2013.832837
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Transmission electron microscopy study of phase compatibility in low hysteresis shape memory alloys”. Delville R, Kasinathan S, Zhang Z, van Humbeeck J, James RD, Schryvers D, Philosophical magazine 90, 177 (2010). http://doi.org/10.1080/14786430903074755
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A TEM study of nanoparticles in lustre glazes”. Fredrickx P, Helary D, Schryvers D, Darque-Ceretti E, Applied physics A : materials science &, processing 79, 283 (2004). http://doi.org/10.1007/s00339-004-2515-3
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