Number of records found: 2109
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Citations
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Evaluation of the ArmstrongBuseck correction for automated electron probe X-ray microanalysis of particles”. Storms HM, Janssens KH, Török SB, Van Grieken RE, X-ray spectrometry 18, 45 (1989). http://doi.org/10.1002/XRS.1300180203
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A general Monte-Carlo simulation of energy-dispersive X-ray fluorescence spectrometers : 1 : unpolarized radiation, homogenious samples”. Vincze L, Janssens K, Adams F, Spectrochimica acta: part B : atomic spectroscopy 48, 553 (1993). http://doi.org/10.1016/0584-8547(93)80060-8
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Implementation of an expert system for the qualitative interpretation of x-ray-fluorescence spectra”. Janssens K, van Espen P, Analytica chimica acta 184, 117 (1986). http://doi.org/10.1016/S0003-2670(00)86475-2
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Increased accuracy in the automated interpretation of large epma data sets by the use of an expert system”. Janssens K, Vanborm W, van Espen P, Journal of research of the National Bureau of Standards (1934) 93, 260 (1988). http://doi.org/10.6028/JRES.093.037
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A laboratory mu-XRF spectrometer employing capillary optics”. Janssens K, Vekemans B, Rindby A, Vincze L, Adams F, , 159 (1995)
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A micro XRF spectrometer based on rotating anode generator and capillary optics”. Janssens K, Vekemans B, Vincze L, Adams F, Rindby A, Spectrochimica acta: part B : atomic spectroscopy 51, 1661 (1996)
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Microscopic synchroton radiation induced X-ray fluorescence analysis”. Janssens K, Vincze L, Aerts A, Vekemans B, Adams F, Jones K, Knöchel A, Mikrochimica acta: supplementum , 87 (1996)
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Microscopic X-ray fluorescence analysis”. Janssens K, Vincze L, Rubio J, Bernasconi G, Adams F, Journal of analytical atomic spectrometry 9, 151 (1994). http://doi.org/10.1039/JA9940900151
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Monte Carlo simulation of conventional and synchrotron energy-dispersive X-ray spectrometers”. Janssens K, Vincze L, van Espen P, Adams F, X-ray spectrometry 22, 234 (1993). http://doi.org/10.1002/XRS.1300220412
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Optics for X-ray microfluorescence to be used at the European synchrotron radiation facility”. Vincze L, Janssens K, Adams F, Advances in X-ray analysis 37, 553 (1994)
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Parameters influencing focussing capabilities of capillary optics”. Vincze L, Janssens K, Adams F, Larsson S, Rindby A, Engstrom P, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 161 (1995)
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PC-MCA : a software package for the acquisition and processing of spectral data”. Janssens K, Nobels J, van Espen P, Chemometrics and intelligent laboratory systems 3, 335 (1988). http://doi.org/10.1016/0169-7439(88)80033-9
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Prediction of the optical characteristics and analytical qualities of an X-ray fluorescence microprobe at the European Synchrotron Radiation Facility (Grenoble)”. van Langevelde F, Janssens KH, Adams FC, Vis RD, Nuclear instruments and methods in physics research : A: accelerators, spectrometers, detectors and associated equipment 317, 383 (1992). http://doi.org/10.1016/0168-9002(92)90632-E
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Provenance analysis of Roman glass from the 1st-6th century A.D”. Aerts A, Janssens K, Vincze L, Vekemans B, Adams F, Haller M, Radtke M, Knöchel A, HASYLAB Jahresbericht , 918 (1996)
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Quantification of SY-XRF measurements at the X-ray microprobe”. Haller M, Radtke M, Knöchel A, Clöck W, Sutton S, Janssens K, Vincze L, HASYLAB Jahresbericht , 956 (1996)
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Quantitative mu-XRF analysis of heterogeneous samples”. Vincze L, Janssens K, Adams F, Jones K, Microbeam Analysis 1995: Proceedings Of The 29th Annual Conference Of The Microbeam Analysis Society , 175 (1995)
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Special issue on Microscopic and ultratrace x-ray fluorescence analysis: 2”. Janssens K, Journal of trace and microprobe techniques 14, 461 (1996)
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Spectrum evaluation”. van Espen P, Janssens K (1992).
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Surface microanalysis”. Adams F, Adriaens A, Berghmans P, Janssens K, Analytica chimica acta 283, 19 (1993). http://doi.org/10.1016/0003-2670(93)85207-Z
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Synchrotron radiation-induced X-ray microanalysis”. Janssens K, Vincze L, Adams F, Jones KW, Analytica chimica acta 283, 98 (1993). http://doi.org/10.1016/0003-2670(93)85213-4
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Synchrotron radiation induced X-ray microfluorescence analysis”. Janssens K, Vincze L, Vekemans B, Aerts A, Adams F, Jones KW, Knöchel A, Microchimica acta T2 –, 4th Workshop of the European-Microanalysis-Society on Modern, Developments and Applications in Microbeam Analysis, MAY, 1995, ST MALO, FRANCE , 87 (1996)
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The development process of an expert system for the automated interpretation of large epma data sets”. Janssens K, Dorrine W, van Espen P, Chemometrics and intelligent laboratory systems 4, 147 (1988). http://doi.org/10.1016/0169-7439(88)80086-8
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X-ray microanalysis: a new tool for environmental analysis”. Adams F, Janssens K page 183 (1996).
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X-ray optics for synchrotron-radiation-induced X-ray micro fluorescence at the european synchrotron-radiation facility, Grenoble”. Vincze L, Janssens K, Adams F, Institute of physics conference series , 613 (1993)
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2D X-ray and FTIR micro-analysis of the degradation of cadmium yellow pigment in paintings of Henri Matisse”. Pouyet E, Cotte M, Fayard B, Salome M, Meirer F, Mehta A, Uffelman ES, Hull A, Vanmeert F, Kieffer J, Burghammer M, Janssens K, Sette F, Mass J, Applied physics A : materials science &, processing 121, 967 (2015). http://doi.org/10.1007/S00339-015-9239-4
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FT-IR characterization of tin dioxide gas sensor materials under working conditions”. Lenaerts S, Roggen J, Maes G, Spectrochimica acta: part A: molecular and biomolecular spectroscopy 51, 883 (1995). http://doi.org/10.1016/0584-8539(94)01216-4
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In situ infrared and electrical characterization of tin dioxide gas sensors in nitrogen/oxygen mixtures at temperatures up to 720 K”. Lenaerts S, Honoré, M, Huyberechts G, Roggen J, Maes G, Sensors and actuators : B : chemical 19, 478 (1994). http://doi.org/10.1016/0925-4005(93)01048-9
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Synthesis and characterization of tin dioxide powders for the realization of thick-film gas sensors”. Honoré, M, Lenaerts S, Desmet J, Huyberechts G, Roggen J, Sensors and actuators : B : chemical 19, 621 (1994). http://doi.org/10.1016/0925-4005(93)01224-R
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Guzzinati G, Ghielens W, Mahr C, Bé,ché, A, Rosenauer A, Calders T, Verbeeck J (2019) Electron Bessel beam diffraction patterns, line scan of Si/SiGe multilayer
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On the nucleation mechanism of {112} <, 111 >, mechanical twins in as-quenched beta metastable Ti-12 wt.% Mo alloy”. Marteleur M, Idrissi H, Amin-Ahmadi B, Prima F, Schryvers D, Jacques PJ, Materialia 7, Unsp 100418 (2019). http://doi.org/10.1016/J.MTLA.2019.100418
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