Schulze, A.; Hantschel, T.; Dathe, A.; Eyben, P.; Ke, X.; Vandervorst, W. |
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects |
2012 |
Nanotechnology |
23 |
29 |
UA library record; WoS full record; WoS citing articles |