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  Author Title Year Publication Volume Times cited Additional Links Links
Ignatova, V.A.; Möller, W.; Conard, T.; Vandervorst, W.; Gijbels, R. Interpretation of TOF-SIMS depth profiles from ultrashallow high-k dielectric stacks assisted by hybrid collisional computer simulation 2005 Applied physics A : materials science & processing 81 4 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. Capabilities and limitations of Fourier transform laser microprobe mass spectrometry for molecular analysis of solids 2002 Vacuum 69 4 UA library record; WoS full record; WoS citing articles pdf doi
Bogaerts, A.; Gijbels, R. Numerical modelling of gas discharge plasmas for various applications 2003 Vacuum: surface engineering, surface instrumentation & vacuum technology 69 16 UA library record; WoS full record; WoS citing articles pdf doi
Kalitzova, M.; Vlakhov, E.; Marinov, Y.; Gesheva, K.; Ignatova, V.A.; Lebedev, O.; Muntele, C.; Gijbels, R. Effect of high-frequency electromagnetic field on Te+-implanted (001) Si</tex> 2004 Vacuum: the international journal and abstracting service for vacuum science and technology 76 2 UA library record; WoS full record; WoS citing articles pdf doi
Gregory, C.; Gijbels, R.; Jacob, W.; Geuens, I.; van Roost, C.; de Keyzer, R. Evaluation of characterization methods for thin sections of silver halide microcrystals by analytical electron microscopy 1997 Journal of microscopy 188 6 UA library record; WoS full record; WoS citing articles
Ignatova, V.A.; van Vaeck, L.; Gijbels, R.; Adams, F. Molecular speciation of inorganic mixtures by Fourier transform laser microprobe mass sepctrometry 2003 International journal of mass spectrometry 225 9 UA library record; WoS full record; WoS citing articles doi
Oleshko, V.P.; Brichkin, S.B.; Gijbels, R.; Jacob, W.A.; Razumov, V.F. Observation of exciton states in silver halide nanoparticles by cryo-electron spectroscopic imaging and electron energy-loss spectroscopy 1997 Mendeleev communications 7 5 UA library record; WoS full record; WoS citing articles
Volkov, V.V.; van Landuyt, J.; Marushkin, K.M.; Gijbels, R.; Férauge, C.; Vasilyev, M.G.; Shelyakin, A.A.; Sokolovsky, A.A. Characterization of LPE grown InGaAsP/InP heterostructures: IR-LED at 1.66 μm used for the remote monitoring of methane gas 1997 Journal of crystal growth 173 4 UA library record; WoS full record; WoS citing articles
Cenian, A.; Chernukho, A.; Bogaerts, A.; Gijbels, R. Comment on 'Integral cross sections for electron impact excitation of electronic states of N2' 2002 Journal of physics: B : atomic and molecular physics 35 2 UA library record; WoS full record; WoS citing articles doi
van Vaeck, L.; Poels, K.; de Nollin, S.; Hachimi, A.; Gijbels, R. Laser microprobe mass spectrometry: principle and applications in biology and medicine 1997 Cell biology international 21 6 UA library record; WoS full record; WoS citing articles doi
Conard, T.; de Witte, H.; Loo, R.; Verheyen, P.; Vandervorst, W.; Caymax, M.; Gijbels, R. XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers 1999 Thin solid films : an international journal on the science and technology of thin and thick films 343/344 1 UA library record; WoS full record; WoS citing articles doi
Verlinden, G.; Gijbels, R.; Geuens, I. Chemical microcharacterization of ultrathin iodide conversion layers and adsorbed thiocyanate surface layers on silver halide microcrystals with time-of-flight SIMS 2002 Microscopy and microanalysis 8 1 UA library record; WoS full record; WoS citing articles doi
Oleshko, V.P.; Gijbels, R.H.; Jacob, W.A. Analytical electron microscopy of silver halide photographic systems 2000 Micron 31 8 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; van Vaeck, L.; Gijbels, R. Secondary ion formation of low molecular weight organic dyes in time-of-flight static secondary ion mass spectrometry 2003 Rapid communications in mass spectrometry 17 10 UA library record; WoS full record; WoS citing articles doi
Lenaerts, J.; van Vaeck, L.; Gijbels, R.; Van Luppen, J. Comparison of mono- and polyatomic primary ions for the characterization of organic dye overlayers with static secondary ion mass spectrometry 2004 Rapid communications in mass spectrometry 18 5 UA library record; WoS full record; WoS citing articles doi
Adriaensen, L.; Vangaever, F.; Lenaerts, J.; Gijbels, R. Matrix-enhanced secondary ion mass spectrometry: the influence of MALDI matrices on molecular ion yields of thin organic films 2005 Rapid communications in mass spectrometry 19 24 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R.; Vlcek, J. Collisional-radiative model for an argon glow discharge 1998 Journal of applied physics 84 138 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W. Modeling of ionization of argon in an analytical capacitively coupled radio-frequency glow discharge 1999 Journal of applied physics 86 18 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R. Role of Ar2+ and Ar+2 ions in a direct current argon glow discharge: a numerical description 1999 Journal of applied physics 86 50 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R.; Serikov, V.V. Calculation of gas heating in direct current argon glow discharges 2000 Journal of applied physics 87 63 UA library record; WoS full record; WoS citing articles doi
Yan, M.; Bogaerts, A.; Gijbels, R.; Goedheer, W.J. Spatial behavior of energy relaxation of electrons in capacitively coupled discharges: comparison between Ar and SiH4 2000 Journal of applied physics 87 14 UA library record; WoS full record; WoS citing articles doi
Herrebout, D.; Bogaerts, A.; Yan, M.; Goedheer, W.; Dekempeneer, E.; Gijbels, R. 1D fluid model for an rf methane plasma of interest in deposition of diamond-like carbon layers 2001 Journal of applied physics 90 83 UA library record; WoS full record; WoS citing articles doi
de Witte, H.; Vandervorst, W.; Gijbels, R. Modeling of bombardment induced oxidation of silicon 2001 Journal of applied physics 89 16 UA library record; WoS full record; WoS citing articles doi
Bogaerts, A.; Gijbels, R. Hybrid modeling network for a helium-argon-copper hollow cathode discharge used for laser applications 2002 Journal of applied physics 92 24 UA library record; WoS full record; WoS citing articles doi
Ignatova, V.A.; Lebedev, O.I.; Watjen, U.; van Vaeck, L.; van Landuyt, J.; Gijbels, R.; Adams, F. Metal and composite nanocluster precipitate formation in silicon dioxide implanted with Sb+ ions 2002 Journal of applied physics 92 5 UA library record; WoS full record; WoS citing articles pdf doi
Herrebout, D.; Bogaerts, A.; Yan, M.; Gijbels, R.; Goedheer, W.; Vanhulsel, A. Modeling of a capacitively coupled radio-frequency methane plasma: comparison between a one-dimensional and a two-dimensional fluid model 2002 Journal of applied physics 92 15 UA library record; WoS full record; WoS citing articles doi
Georgieva, V.; Bogaerts, A.; Gijbels, R. Numerical study of Ar/CF4/N2 discharges in single and dual frequency capacitively coupled plasma reactors 2003 Journal of applied physics 94 90 UA library record; WoS full record; WoS citing articles doi
Georgieva, V.; Bogaerts, A.; Gijbels, R. Particle-in-cell/Monte Carlo simulation of a capacitively coupled radio frequency Ar/Cf4 discharge: effect of gas composition 2003 Journal of applied physics 93 57 UA library record; WoS full record; WoS citing articles doi
Neyts, E.; Yan, M.; Bogaerts, A.; Gijbels, R. Particle-in-cell/Monte Carlo simulations of a low-pressure capacitively coupled radio-frequency discharge: effect of adding H2 to an Ar discharge 2003 Journal of applied physics 93 15 UA library record; WoS full record; WoS citing articles doi
Baguer, N.; Bogaerts, A.; Gijbels, R. Role of the fast Ar atoms, Ar+ ions and metastable Ar atoms in a hollow cathode glow discharge: study by a hybrid model 2003 Journal of applied physics 94 19 UA library record; WoS full record; WoS citing articles doi
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