| Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
| Gijbels, R.; Adriaens, A. |
Einleitung zu den massenspektrometrischen Methoden |
2000 |
|
|
|
UA library record |
| Yampolskii, S.V.; Baelus, B.J.; Peeters, F.M.; Kolacek, J. |
Electric charges in superconducting mesoscopic samples |
2002 |
Czechoslovak journal of physics
T2 – 11th Czech and Slovak Conference on Magnetism (CSMAG 01), AUG 20-23, 2001, KOSICE, SLOVAKIA |
52 |
|
UA library record; WoS full record |
| Avetisyan, A.A.; Partoens, B.; Peeters, F.M. |
Electric field tuning of the band gap in four layers of graphene with different stacking order |
2012 |
Proceedings of the Society of Photo-optical Instrumentation Engineers
T2 – Conference on Photonics and Micro and Nano-structured Materials, JUN 28-30, 2011, Yerevan, ARMENIA |
|
|
UA library record; WoS full record |
| Colomer, J.-F.; Van Tendeloo, G. |
Electron diffraction and microscopy of single-walled carbon nanotube bundles |
2003 |
|
|
|
UA library record |
| Colomer, J.-F.; Henrard, L.; Lambin, P.; Van Tendeloo, G. |
Electron diffraction of nanotubes bundles : unique helicity and tube-tube atomically coherent packing |
2002 |
AIP conference proceedings
T2 – 16th International Winterschool on Electronic Properties of Novel, Materials, MAR 02-09, 2002, KIRCHBERG, AUSTRIA |
|
|
UA library record; WoS full record |
| Schryvers, D.; Potapov, P. |
Electron diffraction refinement of the TiNi(Fe) R-phase structure |
2003 |
Journal de physique |
112 |
7 |
UA library record; WoS full record; WoS citing articles |
| Tirry, W.; Schryvers, D.; Jorissen, K.; Lamoen, D. |
Electron-diffraction structure refinement of Ni4Ti3 precipitates in Ni52Ti48 |
2006 |
Acta crystallographica: section B: structural science |
62 |
30 |
UA library record; WoS full record; WoS citing articles |
| Lu, Y. |
Electron energy-loss spectroscopy (EELS) characterization of diamond and related materials |
2013 |
|
|
|
UA library record |
| Oleshko, V.; Gijbels, R.; Amelinckx, S. |
Electron microscopy and scanning microanalysis |
2000 |
|
|
|
UA library record |
| Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
Electron microscopy investigation of ternary \gamma-brass-type precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.P.; Gijbels, R.; Amelinckx, S. |
Electron microscopy, nanoscopy, and scanning micro- and nanoanalysis |
2013 |
|
|
|
UA library record |
| Van Tendeloo, G.; Amelinckx, S. |
Electron microscopy of fullerenes and related materials |
2000 |
|
|
|
UA library record |
| Pauwels, B.; Van Tendeloo, G.; Joutsensaari, J.; Kauppinen, E.I. |
Electron microscopy on nanoparticles: structure of C60 and C70 nanopraticles |
1999 |
|
|
|
UA library record |
| Amelinckx, S.; van Dyck, D.; van Landuyt, J.; Van Tendeloo, G. |
Electron microscopy: principles and fundamentals |
1997 |
|
|
|
UA library record |
| Schryvers, D. |
Electron microscopy studies of martensite microstructures |
1997 |
Journal de physique: 4 |
C5 |
2 |
UA library record; WoS full record; WoS citing articles |
| Seo, J.W.; Schryvers, D.; Potapov, P. |
Electron microscopy study of ternary precipitates in Ni39.6Mn47.5Ti12.9 |
1998 |
|
|
|
UA library record; WoS full record; |
| Biermans, E. |
Electron tomography : from qualitative to quantitative |
2012 |
|
|
|
UA library record |
| Masir, M.R. |
Electronic properties of graphene in inhomogeneous magnetic fields |
2012 |
|
|
|
UA library record |
| Kishore, V.V.R. |
Electronic structure of core-shell nanowires |
2013 |
|
|
|
UA library record |
| Hamon, A.-L.; Verbeeck, J.; Schryvers, D.; Benedikt, J.; van den Sanden, R.M.C.M. |
ELNES study of carbon K-edge spectra of plasma deposited carbon films |
2004 |
Journal of materials chemistry |
14 |
61 |
UA library record; WoS full record; WoS citing articles |
| Shi, H.; Frenzel, J.; Schryvers, D. |
EM characterization of precipitates in as-cast and annealed Ni45.5Ti45.5Nb9 shape memory alloys |
2013 |
Materials science forum |
738/739 |
1 |
UA library record; WoS full record; WoS citing articles |
| Seo, J.W.; Schryvers, D.; Vermeulen, W.; Richard, O.; Potapov, P. |
EM investigation of precursors and precipitation in a Ni39.6Mn47.5Ti12.9 alloy |
1999 |
Philosophical magazine: A: physics of condensed matter: defects and mechanical properties |
79 |
3 |
UA library record; WoS full record; WoS citing articles |
| Caen, J.; Schalm, O.; van der Snickt, G.; van der Linden, V.; Frederickx, P.; Schryvers, D.; Janssens, K.; Cornelis, E.; van Dyck, D.; Schreiner, M. |
Enamels in stained-glass windows : preparation, chemical composition, microstructure and causes of deterioration |
2005 |
|
|
|
UA library record |
| Partoens, B.; Peeters, F.M. |
Enhanced spin and isospin blockade in two vertically coupled quantum dots |
2001 |
|
|
|
UA library record; WoS full record; |
| Lisiecki, I.; Turner, S.; Bals, S.; Pileni, M.P.; Van Tendeloo, G. |
Enhanced stability against oxidation due to 2D self-organisation of hcp cobalt nanocrystals |
2008 |
|
|
|
UA library record |
| Fomin, V.M.; Devreese, J.T.; Misko, V.R. |
Enhancement of critical magnetic field in superconducting nanostructures |
2002 |
|
1 |
|
UA library record |
| Romano-Rodriguez, A.; Perez-Rodriguez, A.; Serre, C.; van Landuyt, J.; et al. |
Epitaxial growth of \beta-SiC on ion-beam synthesized \beta-SiC : structural characterization |
2000 |
Materials science forum
T2 – International Conference on Silicon Carbide and Related Materials, OCT 10-15, 1999, RES TRIANGLE PK, NORTH CAROLINA |
338-3 |
2 |
UA library record; WoS full record; WoS citing articles |
| Leys, F.E.; March, N.H.; Lamoen, D.; van Doren, V.E. |
Equations of state of tantalum and plutonium in a spherical cell approximation and at extremely high pressures |
2002 |
|
22 |
|
UA library record; WoS full record; WoS citing articles |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and mechanism of formation of photographic sensitivity |
1998 |
|
|
|
UA library record |
| Oleshko, V.P.; Gijbels, R.H.; Bilous, V.M.; Jacob, W.A.; Alfimov, M.V. |
Evolution of impurity clusters and photographic sensitivity |
2000 |
Zhurnal nauchnoj prikladnoj fotografii i kinematografii |
45 |
|
UA library record |
