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Author |
Idrissi, H.; Samaee, V.; Lumbeeck, G.; van der Werf, T.; Pardoen, T.; Schryvers, D.; Cordier, P. |
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Title |
Supporting data for “In situ Quantitative Tensile Tests on Antigorite in a Transmission Electron Microscope” |
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Year |
2019 |
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Dataset; Electron microscopy for materials research (EMAT) |
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Abstract |
The determination of the mechanical properties of serpentinites is essential towards the understanding of the mechanics of faulting and subduction. Here, we present the first in situ tensile tests on antigorite in a transmission electron microscope. A push-to-pull deformation device is used to perform quantitative tensile tests, during which force and displacement are measured, while the microstructure is imaged with the microscope. The experiments have been performed at room temperature on beams prepared by focused ion beam. The specimens are not single crystals despite their small sizes. Orientation mapping indicated that some grains were well-oriented for plastic slip. However, no dislocation activity has been observed even though engineering tensile stress went up to 700 MPa. We show also that antigorite does not exhibit an pure elastic-brittle behaviour since, despite the presence of defects, the specimens underwent plastic deformation and did not fail within the elastic regime. Instead, we observe that strain localizes at grain boundaries. All observations concur to show that under our experimental conditions, grain boundary sliding is the dominant deformation mechanism. This study sheds a new light on the mechanical properties of antigorite and calls for further studies on the structure and properties of grain boundaries in antigorite and more generally in phyllosilicates. |
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Call Number |
UA @ admin @ c:irua:169107 |
Serial |
6891 |
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Author |
Grieten, E.; Storme, P.; Caen, J.; Schalm, O.; Schryvers, D. |
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Title |
Application of atmospheric plasma-jets for the conservation of cultural heritage |
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P3 Proceeding |
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Year |
2015 |
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P3 Proceeding; Engineering sciences. Technology; Electron microscopy for materials research (EMAT); Antwerp Cultural Heritage Sciences (ARCHES) |
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no |
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Call Number |
UA @ admin @ c:irua:149629 |
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7466 |
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Author |
Schryvers, D.; Ma, Y.; Toth, L.; Tanner, L.E. |
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Title |
EM study of twinning in the Ni5Al3 bainitic phase |
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A3 Journal article |
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Year |
1993 |
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Twinning in advanced materials |
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395-402 |
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A3 Journal article; Electron microscopy for materials research (EMAT) |
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A1994BB13P00037 |
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0000-00-00 |
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PHYSICS, APPLIED 28/145 Q1 # |
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UA @ lucian @ c:irua:48358 |
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1031 |
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Author |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
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Title |
A temperature study of mixed AgBr-AgBrI tabular crystals |
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H1 Book chapter |
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1995 |
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70-76 |
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H1 Book chapter; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Hawaii |
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A1995RY19900011 |
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0000-00-00 |
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39 |
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1 |
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UA library record; WoS full record; WoS citing articles |
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Times cited |
3 |
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Approved |
PHYSICS, APPLIED 47/145 Q2 # |
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Call Number |
UA @ lucian @ c:irua:8459 |
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3501 |
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Author |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Geuens, I.; Gijbels, R.; Jacob, W.; de Keyzer, R. |
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Title |
A temperature study of mixed AgBr-AgBrI tabular crystals |
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P3 Proceeding |
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1992 |
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36-39 |
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P3 Proceeding; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Hawaii |
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0000-00-00 |
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PHYSICS, APPLIED 47/145 Q2 # |
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Call Number |
UA @ lucian @ c:irua:4201 |
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3502 |
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Author |
Schryvers, D.; Toth, L.; van Humbeeck, J.; Beyer, J. |
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Title |
Ni2Al versus Ni5Al3 ordering in Ni65Al35 austenite and martensite |
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A1 Journal article |
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Year |
1995 |
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Journal de physique: colloques, suppléments |
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5 |
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8 |
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1029-1034 |
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Keywords |
A1 Journal article; Electron microscopy for materials research (EMAT) |
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Les Ulis |
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A1995TX21300082 |
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2014-07-16 |
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1155-4339; |
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UA library record; WoS full record; WoS citing articles |
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Times cited |
12 |
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PHYSICS, APPLIED 47/145 Q2 # |
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Call Number |
UA @ lucian @ c:irua:13167 |
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3548 |
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