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Author |
Geuens, I.; Nys, B.; Gijbels, R.; Jacob, W. |
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Title |
Application of neural networks in image analysis: the classification of geometrical shapes |
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A3 Journal article |
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Year |
1993 |
Publication |
CC-AI: the journal for the integrated study of artificial intelligence, cognitive science and applied epistemology |
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Volume |
10 |
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Pages |
61-68 |
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Keywords |
A3 Journal article; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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0000-00-00 |
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Approved  |
MATERIALS SCIENCE, MULTIDISCIPLINARY 135/271 Q2 # PHYSICS, APPLIED 70/145 Q2 # PHYSICS, CONDENSED MATTER 40/67 Q3 # |
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Call Number |
UA @ lucian @ c:irua:6164 |
Serial |
141 |
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Author |
Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
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Title |
Depth profiling of silver halide microcrystals |
Type |
P3 Proceeding |
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Year |
1992 |
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Abbreviated Journal |
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Volume |
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Pages |
479-482 |
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Keywords |
P3 Proceeding; Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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Wiley |
Place of Publication |
Chichester |
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0000-00-00 |
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CHEMISTRY, PHYSICAL 54/144 Q2 # PHYSICS, ATOMIC, MOLECULAR & CHEMICAL 9/35 Q2 # |
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Call Number |
UA @ lucian @ c:irua:4202 |
Serial |
649 |
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Author |
Goessens, C.; Schryvers, D.; van Landuyt, J.; Amelinckx, S.; Geuens, I.; Gijbels, R.; Jacob, W.; Verbeeck, A.; de Keyzer, R. |
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Title |
Characterization of crystal defects and analysis of iodide distribution in mixed tabular silver halide grains by conventional transmission electron microscopy, X-ray diffractometry and back-scattered electron imaging |
Type |
P3 Proceeding |
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Year |
1991 |
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Keywords |
P3 Proceeding; Electron microscopy for materials research (EMAT); Plasma Lab for Applications in Sustainability and Medicine – Antwerp (PLASMANT) |
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St. Paul, Minn. |
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0000-00-00 |
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Call Number |
UA @ lucian @ c:irua:710 |
Serial |
320 |
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