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Author |
Title |
Year |
Publication |
Volume |
Times cited |
Additional Links |
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|
Batenburg, K.J.; Bals, S.; Sijbers, J.; Van Tendeloo, G. |
DART explained: how to carry out a discrete tomography reconstruction |
2008 |
|
|
|
UA library record |
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|
Van Eyndhoven, G.; Batenburg, K.J.; van Oers, C.; Kurttepeli, M.; Bals, S.; Cool, P.; Sijbers, J. |
Reliable pore-size measurements based on a procedure specifically designed for electron tomography measurements of nanoporous samples |
2014 |
|
|
|
UA library record |
|
|
Sentosun, K.; Lobato, I.; Bladt, E.; Zhang, Y.; Palenstijn, W.J.; Batenburg, K.J.; Van Dyck, D.; Bals, S. |
Artifact Reduction Based on Sinogram Interpolation for the 3D Reconstruction of Nanoparticles Using Electron Tomography |
2017 |
Particle and particle systems characterization |
34 |
2 |
UA library record; WoS full record; WoS citing articles |
